Inventor · disambiguated record
Junko Konishi
Also filed as: KONISHI JUNKO
12 granted patents·2 pending applications·147 citations·filing 1999–2011
90Inventor score
Top patents by PatentIndex Score
14 records- 0183US6611728B1Inspection system and method for manufacturing electronic devices using the inspection systemHITACHI LTD·Filed 1999·Granted Aug 26, 2003·71 cites·17 claims
- 0281US7424336B2Test data analyzing system and test data analyzing programHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 9, 2008·6 cites·6 claims
- 0378US9020237B2Method for optimizing observed image classification criterion and image classification apparatusHIRAI TAKEHIRO·Filed 2011·Granted Apr 28, 2015·6 cites·6 claims
- 0474US8209135B2Wafer inspection data handling and defect review toolFUNAKOSHI TOMOHIRO·Filed 2011·Granted Jun 26, 2012·4 cites·10 claims
- 0574US8043772B2Manufacturing method and manufacturing system of semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2009·Granted Oct 25, 2011·4 cites·5 claims
- 0672US8428336B2Inspecting method, inspecting system, and method for manufacturing electronic devicesIKEDA YOKO·Filed 2006·Granted Apr 23, 2013·7 cites·13 claims
- 0767US8892494B2Device for classifying defects and method for adjusting classificationONO MAKOTO·Filed 2010·Granted Nov 18, 2014·3 cites·9 claims
- 0866US8625906B2Image classification standard update method, program, and image classification deviceISOMAE YUYA·Filed 2009·Granted Jan 7, 2014·4 cites·18 claims
- 0964US8779360B2Charged particle beam device, defect observation device, and management serverMIYAKE KOZO·Filed 2011·Granted Jul 15, 2014·2 cites·12 claims
- 1063US8472696B2Observation condition determination support device and observation condition determination support methodKONISHI JUNKO·Filed 2009·Granted Jun 25, 2013·3 cites·16 claims
- 1162US7068834B1Inspecting method, inspecting system, and method for manufacturing electronic devicesHITACHI LTD·Filed 1999·Granted Jun 27, 2006·35 cites·34 claims
- 1253US8290241B2Analyzing apparatus, program, defect inspection apparatus, defect review apparatus, analysis system, and analysis methodONO MAKOTO·Filed 2008·Granted Oct 16, 2012·2 cites·13 claims
- 1350US2007105245A1Wafer inspection data handling and defect review toolHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 1441US2005114058A1Method for analyzing inspected data, apparatus and its programFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →