Inventor · disambiguated record
Eric D. Hunt-Schroeder
Also filed as: HUNT-SCHROEDER ERIC · HUNT-SCHROEDER ERIC D
45 granted patents·1 pending application·129 citations·filing 2014–2025
97Inventor score
Top patents by PatentIndex Score
46 records- 0197US11215661B2Cascaded sensing circuits for detecting and monitoring cracks in an integrated circuitGLOBALFOUNDRIES US INC·Filed 2020·Granted Jan 4, 2022·5 cites·18 claims
- 0296US11105846B1Crack detecting and monitoring system for an integrated circuitGLOBALFOUNDRIES US INC·Filed 2020·Granted Aug 31, 2021·12 cites·20 claims
- 0396US9953727B1Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testingGLOBALFOUNDRIES INC·Filed 2017·Granted Apr 24, 2018·19 cites·12 claims
- 0496US9508420B1Voltage-aware adaptive static random access memory (SRAM) write assist circuitGLOBALFOUNDRIES INC·Filed 2016·Granted Nov 29, 2016·22 cites·15 claims
- 0595US11693048B2Cascaded sensing circuits for detecting and monitoring cracks in an integrated circuitGLOBALFOUNDRIES US INC·Filed 2021·Granted Jul 4, 2023·2 cites·20 claims
- 0695US10429434B2On-chip reliability monitor and methodGLOBALFOUNDRIES INC·Filed 2018·Granted Oct 1, 2019·6 cites·20 claims
- 0792US9654086B1Operational amplifier with current-controlled up or down hysteresisGLOBALFOUNDRIES INC·Filed 2016·Granted May 16, 2017·9 cites·20 claims
- 0890US10446239B1Memory array including distributed reference cells for current sensingGLOBALFOUNDRIES INC·Filed 2018·Granted Oct 15, 2019·10 cites·20 claims
- 0988US10971996B2Charge pump circuit with internal pre-charge configurationMARVELL ASIA PTE LTD·Filed 2020·Granted Apr 6, 2021·2 cites·20 claims
- 1088US9274171B1Customer-transparent logic redundancy for improved yieldIBM·Filed 2014·Granted Mar 1, 2016·5 cites·19 claims
- 1186US9837168B1Word line voltage generator for programmable memory arrayGLOBALFOUNDRIES INC·Filed 2016·Granted Dec 5, 2017·6 cites·14 claims
- 1285US9791507B2Customer-transparent logic redundancy for improved yieldIBM·Filed 2016·Granted Oct 17, 2017·2 cites·12 claims
- 1383US10382049B1On-chip calibration circuit and method with half-step resolutionGLOBALFOUNDRIES INC·Filed 2018·Granted Aug 13, 2019·2 cites·20 claims
- 1483US10192590B1Differential voltage generatorGLOBALFOUNDRIES INC·Filed 2017·Granted Jan 29, 2019·6 cites·20 claims
- 1581US11962709B1Structures and methods for deriving stable physical unclonable functions from semiconductor devicesMARVELL ASIA PTE LTD·Filed 2021·Granted Apr 16, 2024·1 cites·16 claims
- 1681US11418195B1Voltage power switchMARVELL ASIA PTE LTD·Filed 2021·Granted Aug 16, 2022·1 cites·20 claims
- 1781US10770407B2IC structure with interdigitated conductive elements between metal guard structuresGLOBALFOUNDRIES INC·Filed 2019·Granted Sep 8, 2020·3 cites·19 claims
- 1876US10026494B2Word line voltage generator for calculating optimum word line voltage level for programmable memory arrayGLOBALFOUNDRIES INC·Filed 2017·Granted Jul 17, 2018·3 cites·14 claims
- 1975US11112811B2On-chip parameter generation system with an integrated calibration circuitMARVELL ASIA PTE LTD·Filed 2020·Granted Sep 7, 2021·2 cites·17 claims
- 2075US9779783B2Latching current sensing amplifier for memory arrayIBM·Filed 2015·Granted Oct 3, 2017·3 cites·15 claims
- 2175US2025336426A1Method and apparatus for faster bitcell operationMARVELL ASIA PTE LTD·Filed 2025·Application pending·0 cites
- 2273USRE50596EOn-chip reliability monitor and methodMARVELL ASIA PTE LTD·Filed 2021·Granted Sep 23, 2025·0 cites·38 claims
- 2373US11293980B2Customer-transparent logic redundancy for improved yieldIBM·Filed 2020·Granted Apr 5, 2022·0 cites·20 claims
- 2471US11742858B1Voltage power switchMARVELL ASIA PTE LTD·Filed 2022·Granted Aug 29, 2023·0 cites·20 claims
- 2569US10955474B2Customer-transparent logic redundancy for improved yieldIBM·Filed 2019·Granted Mar 23, 2021·0 cites·20 claims
- 2669US9870163B2Double bandwidth algorithmic memory arrayGLOBALFOUNDRIES INC·Filed 2016·Granted Jan 16, 2018·1 cites·20 claims
- 2767US10062445B2Parallel programming of one time programmable memory array for reduced test timeGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 28, 2018·2 cites·20 claims
- 2867US10020047B2Static random access memory (SRAM) write assist circuit with improved boostGLOBALFOUNDRIES INC·Filed 2016·Granted Jul 10, 2018·2 cites·9 claims
- 2964US11928248B1Semiconductor device with mechanism to prevent reverse engineeringMARVELL ASIA PTE LTD·Filed 2022·Granted Mar 12, 2024·0 cites·22 claims
- 3063US10839931B2Zero test time memory using background built-in self-testMARVELL INT LTD·Filed 2019·Granted Nov 17, 2020·0 cites·14 claims
- 3162US12361992B1Method and apparatus for faster bitcell operationMARVELL ASIA PTE LTD·Filed 2023·Granted Jul 15, 2025·0 cites·21 claims
- 3262US10551436B2Customer-transparent logic redundancy for improved yieldIBM·Filed 2017·Granted Feb 4, 2020·0 cites·16 claims
- 3362US9967825B2Environmentally aware mobile computing devicesGLOBALFOUNDRIES INC·Filed 2016·Granted May 8, 2018·1 cites·14 claims
- 3460US11101010B2Sensing circuits for charge trap transistorsGLOBALFOUNDRIES INC·Filed 2019·Granted Aug 24, 2021·1 cites·15 claims
- 3558US12210631B1Method and apparatus for self-destruction of device protected by a physical unclonable function generatorMARVELL ASIA PTE LTD·Filed 2022·Granted Jan 28, 2025·0 cites·26 claims
- 3657US12442855B1Built-in circuit for testing process and layout effects of an integrated circuit dieMARVELL ASIA PTE LTD·Filed 2023·Granted Oct 14, 2025·0 cites·20 claims
- 3757US10796750B2Sequential read mode static random access memory (SRAM)GLOBALFOUNDRIES INC·Filed 2018·Granted Oct 6, 2020·1 cites·20 claims
- 3853US10707845B2Ultra-low voltage level shifterMARVELL INT LTD·Filed 2018·Granted Jul 7, 2020·0 cites·21 claims
- 3953US10673321B2Charge pump circuit with built-in-retryMARVELL INT LTD·Filed 2017·Granted Jun 2, 2020·0 cites·20 claims
- 4050US11430505B2In-memory computing using a static random-access memory (SRAM)MARVELL ASIA PTE LTD·Filed 2020·Granted Aug 30, 2022·0 cites·19 claims
- 4149US10163526B2Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testingGLOBALFOUNDRIES INC·Filed 2018·Granted Dec 25, 2018·0 cites·12 claims
- 4248US10535379B2Latching current sensing amplifier for memory arrayGLOBALFOUNDRIES INC·Filed 2017·Granted Jan 14, 2020·0 cites·19 claims
- 4348US10438678B2Zero test time memory using background built-in self-testGLOBALFOUNDRIES INC·Filed 2017·Granted Oct 8, 2019·0 cites·20 claims
- 4447US9760673B2Application specific integrated circuit (ASIC) test screens and selection of such screensGLOBALFOUNDRIES INC·Filed 2016·Granted Sep 12, 2017·0 cites·20 claims
- 4541US11114155B2High-density high-bandwidth static random access memory (SRAM) with phase shifted sequential readMARVELL INT LTD·Filed 2019·Granted Sep 7, 2021·0 cites·20 claims
- 4641US10395752B2Margin test for multiple-time programmable memory (MTPM) with split wordlinesGLOBALFOUNDRIES INC·Filed 2017·Granted Aug 27, 2019·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →