Inventor · disambiguated record
James A. Slinkman
Also filed as: SLINKMAN JAMES · SLINKMAN JAMES A · SLINKMAN JAMES ALBERT
84 granted patents·7 pending applications·889 citations·filing 1990–2019
99Inventor score
Top patents by PatentIndex Score
91 records- 0195US9601606B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2016·Granted Mar 21, 2017·7 cites·17 claims
- 0294US10068827B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2017·Granted Sep 4, 2018·5 cites·16 claims
- 0394US9324628B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2014·Granted Apr 26, 2016·8 cites·12 claims
- 0493US10109553B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2017·Granted Oct 23, 2018·4 cites·17 claims
- 0593US7883990B2High resistivity SOI base wafer using thermally annealed substrateIBM·Filed 2007·Granted Feb 8, 2011·29 cites·7 claims
- 0693US6251755B1High resolution dopant/impurity incorporation in semiconductors via a scanned atomic force probeIBM·Filed 1999·Granted Jun 26, 2001·121 cites·27 claims
- 0792US9646993B2Single-chip field effect transistor (FET) switch with silicon germanium (SiGe) power amplifier and methods of formingIBM·Filed 2015·Granted May 9, 2017·7 cites·8 claims
- 0892US7999320B2SOI radio frequency switch with enhanced signal fidelity and electrical isolationIBM·Filed 2008·Granted Aug 16, 2011·21 cites·10 claims
- 0991US10629710B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2018·Granted Apr 21, 2020·3 cites·18 claims
- 1090US9755015B1Air gaps formed by porous silicon removalGLOBALFOUNDRIES INC·Filed 2016·Granted Sep 5, 2017·6 cites·11 claims
- 1190US5065103AScanning capacitance - voltage microscopyIBM·Filed 1990·Granted Nov 12, 1991·93 cites·19 claims
- 1288US10600893B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2018·Granted Mar 24, 2020·2 cites·16 claims
- 1388US8299537B2Semiconductor-on-insulator substrate and structure including multiple order radio frequency harmonic supressing regionGRECO JOSEPH R·Filed 2009·Granted Oct 30, 2012·22 cites·10 claims
- 1487US8492868B2Method, apparatus, and design structure for silicon-on-insulator high-bandwidth circuitry with reduced charge layerBOTULA ALAN B·Filed 2010·Granted Jul 23, 2013·9 cites·16 claims
- 1587US8133774B2SOI radio frequency switch with enhanced electrical isolationBOTULA ALAN B·Filed 2009·Granted Mar 13, 2012·12 cites·25 claims
- 1687US6441396B1In-line electrical monitor for measuring mechanical stress at the device level on a semiconductor waferIBM·Filed 2000·Granted Aug 27, 2002·36 cites·18 claims
- 1787US6417515B1In-situ ion implant activation and measurement apparatusIBM·Filed 2000·Granted Jul 9, 2002·38 cites·11 claims
- 1886US9704978B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2016·Granted Jul 11, 2017·2 cites·17 claims
- 1986US9666701B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2016·Granted May 30, 2017·2 cites·18 claims
- 2086US9653477B2Single-chip field effect transistor (FET) switch with silicon germanium (SiGe) power amplifier and methods of formingIBM·Filed 2014·Granted May 16, 2017·6 cites·14 claims
- 2186US8020128B2Scaling of bipolar transistorsIBM·Filed 2009·Granted Sep 13, 2011·7 cites·12 claims
- 2284US9530711B2Silicon-on-insulator heat sinkIBM·Filed 2015·Granted Dec 27, 2016·4 cites·19 claims
- 2384US7585614B2Sub-lithographic imaging techniques and processesIBM·Filed 2004·Granted Sep 8, 2009·28 cites·20 claims
- 2482US8089126B2Method and structures for improving substrate loss and linearity in SOI substratesBOTULA ALAN BERNARD·Filed 2009·Granted Jan 3, 2012·9 cites·5 claims
- 2582US6198300B1Silicided silicon microtips for scanning probe microscopyIBM·Filed 1999·Granted Mar 6, 2001·87 cites·16 claims
- 2681US8951896B2High linearity SOI wafer for low-distortion circuit applicationsIBM·Filed 2013·Granted Feb 10, 2015·4 cites·20 claims
- 2781US8026131B2SOI radio frequency switch for reducing high frequency harmonicsIBM·Filed 2008·Granted Sep 27, 2011·9 cites·25 claims
- 2880US9059269B2Silicon-on-insulator heat sinkIBM·Filed 2013·Granted Jun 16, 2015·4 cites·18 claims
- 2980US8299547B2Lateral extended drain metal oxide semiconductor field effect transistor (LEDMOSFET) with tapered dielectric platesABOU-KHALIL MICHEL J·Filed 2011·Granted Oct 30, 2012·5 cites·24 claims
- 3079US8748285B2Noble gas implantation region in top silicon layer of semiconductor-on-insulator substrateBOTULA ALAN B·Filed 2011·Granted Jun 10, 2014·5 cites·12 claims
- 3178US6445050B1Symmetric device with contacts self aligned to gateIBM·Filed 2000·Granted Sep 3, 2002·24 cites·13 claims
- 3276US6887798B2STI stress modification by nitrogen plasma treatment for improving performance in small width devicesIBM·Filed 2003·Granted May 3, 2005·16 cites·12 claims
- 3374US8698244B2Silicon-on-insulator (SOI) structure configured for reduced harmonics, design structure and methodBOTULA ALAN B·Filed 2009·Granted Apr 15, 2014·4 cites·20 claims
- 3474US8471340B2Silicon-on-insulator (SOI) structure configured for reduced harmonics and method of forming the structureBOTULA ALAN B·Filed 2009·Granted Jun 25, 2013·4 cites·25 claims
- 3573US9214561B2Thin body switch transistorIBM·Filed 2013·Granted Dec 15, 2015·3 cites·17 claims
- 3673US6417070B1Method for forming a liner in a trenchIBM·Filed 2000·Granted Jul 9, 2002·15 cites·19 claims
- 3772US11152495B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2019·Granted Oct 19, 2021·0 cites·20 claims
- 3872US6139759AMethod of manufacturing silicided silicon microtips for scanning probe microscopyIBM·Filed 1999·Granted Oct 31, 2000·53 cites·17 claims
- 3971US11081572B2Integrated circuit heat dissipation using nanostructuresIBM·Filed 2019·Granted Aug 3, 2021·0 cites·19 claims
- 4071US8828746B2Compensation for a charge in a silicon substrateIBM·Filed 2012·Granted Sep 9, 2014·2 cites·18 claims
- 4170US7479688B2STI stress modification by nitrogen plasma treatment for improving performance in small width devicesIBM·Filed 2004·Granted Jan 20, 2009·11 cites·18 claims
- 4269US8866226B2SOI radio frequency switch with enhanced electrical isolationBOTULA ALAN B·Filed 2012·Granted Oct 21, 2014·2 cites·17 claims
- 4369US7704855B2Method for fabricating strained silicon-on-insulator structures and strained silicon-on-insulator structures formed therebyIBM·Filed 2007·Granted Apr 27, 2010·3 cites·21 claims
- 4469US6946376B2Symmetric device with contacts self aligned to gateIBM·Filed 2002·Granted Sep 20, 2005·15 cites·10 claims
- 4568US7772083B2Trench forming method and structureIBM·Filed 2008·Granted Aug 10, 2010·4 cites·20 claims
- 4667US9165819B2High linearity SOI wafer for low-distortion circuit applicationsIBM·Filed 2014·Granted Oct 20, 2015·1 cites·20 claims
- 4767US7442996B2Structure and method for enhanced triple well latchup robustnessIBM·Filed 2006·Granted Oct 28, 2008·3 cites·14 claims
- 4867US7089138B1Canary device for failure analysisIBM·Filed 2005·Granted Aug 8, 2006·5 cites·20 claims
- 4967US6486510B2Reduction of reverse short channel effects by implantation of neutral dopantsIBM·Filed 2001·Granted Nov 26, 2002·9 cites·13 claims
- 5066US7355680B2Method for adjusting lithographic mask flatness using thermally induced pellicle stressIBM·Filed 2005·Granted Apr 8, 2008·2 cites·14 claims
Showing the top 50 of 91 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →