Inventor · disambiguated record
Shuichi Baba
Also filed as: BABA SHUICHI
15 granted patents·4 pending applications·74 citations·filing 2004–2024
91Inventor score
Top patents by PatentIndex Score
19 records- 0190US8353060B2Scanning probe microscope and a measuring method using the sameHITACHI LTD·Filed 2010·Granted Jan 8, 2013·10 cites·17 claims
- 0286US8011230B2Scanning probe microscopeHITACHI LTD·Filed 2008·Granted Sep 6, 2011·10 cites·11 claims
- 0385US7631548B2Scanning probe microscopeHITACHI LTD·Filed 2007·Granted Dec 15, 2009·10 cites·20 claims
- 0482US7966867B2Scanning probe microscopeHITACHI LTD·Filed 2008·Granted Jun 28, 2011·8 cites·13 claims
- 0578US7716970B2Scanning probe microscope and sample observation method using the sameHITACHI LTD·Filed 2006·Granted May 18, 2010·6 cites·16 claims
- 0675US8844061B2Scanning probe microscopeBABA SHUICHI·Filed 2012·Granted Sep 23, 2014·3 cites·9 claims
- 0775US8629985B2Displacement measurement method and apparatus thereof, stage apparatus, and probe microscopeNAKATA TOSHIHIKO·Filed 2012·Granted Jan 14, 2014·3 cites·18 claims
- 0874US7612889B2Method and apparatus for measuring displacement of a sampleHITACHI LTD·Filed 2005·Granted Nov 3, 2009·6 cites·9 claims
- 0973US8342008B2Scanning probe microscopeHITACHI LTD·Filed 2008·Granted Jan 1, 2013·3 cites·7 claims
- 1064US9417262B2Scanning probe microscope and sample observation method using sameHITACHI LTD·Filed 2013·Granted Aug 16, 2016·1 cites·12 claims
- 1164US7562564B2Scanning probe microscope and sample observing method using this and semiconductor device production methodHITACHI LTD·Filed 2004·Granted Jul 21, 2009·11 cites·7 claims
- 1262US12436097B2Spectroscopic measurement deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 7, 2025·0 cites·11 claims
- 1362US8284406B2Displacement measurement method and apparatus thereof, stage apparatus, and probe microscopeNAKATA TOSHIHIKO·Filed 2006·Granted Oct 9, 2012·3 cites·18 claims
- 1459US2024399404A1Painting work management device, painting work management program, and railway vehicle painted using painting work management deviceHITACHI LTD·Filed 2024·Application pending·0 cites
- 1556US8659761B2Method and apparatus for measuring displacement of a sample using a wire grid polarizer to generate interference lightNAKATA TOSHIHIKO·Filed 2011·Granted Feb 25, 2014·0 cites·9 claims
- 1654US2014298548A1Scanning probe microscopeHITACHI LTD·Filed 2014·Application pending·0 cites
- 1748US8064066B2Method and apparatus for measuring displacement of a sample to be inspected using an interference lightNAKATA TOSHIHIKO·Filed 2009·Granted Nov 22, 2011·0 cites·14 claims
- 1841US2008047334A1Scanning Microscope With Shape Correction MeansBABA SHUICHI·Filed 2007·Application pending·0 cites
- 1940US2008245139A1Scanning probe microscope and measurement method of sameMORIMOTO TAKAFUMI·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →