Inventor · disambiguated record
Naoshin Haque
Also filed as: HAQUE NAOSHIN
3 granted patents·1 pending application·14 citations·filing 2015–2020
62Inventor score
Top patents by PatentIndex Score
4 records- 0191US9518934B2Wafer defect discoveryKLA TENCOR CORP·Filed 2015·Granted Dec 13, 2016·12 cites·20 claims
- 0277US10740888B2Computer assisted weak pattern detection and quantification systemKLA TENCOR CORP·Filed 2016·Granted Aug 11, 2020·2 cites·13 claims
- 0361US11688052B2Computer assisted weak pattern detection and quantification systemKLA CORP·Filed 2020·Granted Jun 27, 2023·0 cites·10 claims
- 0448US2017076911A1Wafer Defect DiscoveryKLA TENCOR CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →