Inventor · disambiguated record
Dror Shemesh
Also filed as: SHEMESH DROR
30 granted patents·9 pending applications·237 citations·filing 2001–2024
96Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD30APPLIED MATERIALS INC3SHEMESH DROR3INTEGRATED CIRCUIT TESTING2KIDRON EITAN1
Top patents by PatentIndex Score
39 records- 0193US7297965B2Method and apparatus for sample formation and microanalysis in a vacuum chamberAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Nov 20, 2007·35 cites·14 claims
- 0292US9805909B1Method for detecting voids in interconnects and an inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Oct 31, 2017·7 cites·15 claims
- 0392US7683317B2Method and system for detecting hidden defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Mar 23, 2010·17 cites·19 claims
- 0492US6670610B2System and method for directing a millerAPPLIED MATERIALS INC·Filed 2001·Granted Dec 30, 2003·58 cites·83 claims
- 0591US8709269B2Method and system for imaging a cross section of a specimenSHEMESH DROR·Filed 2008·Granted Apr 29, 2014·27 cites·21 claims
- 0688US11022565B2Process monitoringAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jun 1, 2021·4 cites·13 claims
- 0788US9899185B1Resolving ambiguities in an energy spectrumAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Feb 20, 2018·9 cites·20 claims
- 0888US7233008B1Multiple electrode lens arrangement and a method for inspecting an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Jun 19, 2007·12 cites·22 claims
- 0987US11543368B2X-ray based evaluation of a status of a structure of a substrateAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Jan 3, 2023·1 cites·20 claims
- 1084US11423529B2Determination of defect location for examination of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Aug 23, 2022·2 cites·20 claims
- 1183US10928336B1X-ray based evaluation of a status of a structure of a substrateAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Feb 23, 2021·1 cites·14 claims
- 1283US7659506B2Method and system for generating and reviewing a thin sampleAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Feb 9, 2010·9 cites·31 claims
- 1382US12480898B2Z-profiling of wafers based on X-ray measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Nov 25, 2025·1 cites·20 claims
- 1480US10922809B2Method for detecting voids and an inspection systemAPPLIED MATERIALS INC·Filed 2018·Granted Feb 16, 2021·2 cites·15 claims
- 1576US7365320B2Methods and systems for process monitoring using x-ray emissionAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Apr 29, 2008·13 cites·52 claims
- 1674US10347462B2Imaging of crystalline defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 9, 2019·2 cites·20 claims
- 1768US8723144B2Apparatus for sample formation and microanalysis in a vacuum chamberKIDRON EITAN·Filed 2005·Granted May 13, 2014·4 cites·11 claims
- 1868US7271396B2Method and device for aligning a charged particle beam columnAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Sep 18, 2007·5 cites·59 claims
- 1966US7912657B2Method and system for providing a compensated auger spectrumAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Mar 22, 2011·3 cites·19 claims
- 2066US7842930B2Charged particle detector assembly, charged particle beam apparatus and method for generating an imageINTEGRATED CIRCUIT TESTING·Filed 2007·Granted Nov 30, 2010·1 cites·22 claims
- 2165US7838830B2Charged particle beam apparatus and method for operating a charged particle beam apparatusINTEGRATED CIRCUIT TESTING·Filed 2007·Granted Nov 23, 2010·1 cites·24 claims
- 2262US9490101B2System and method for scanning an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Nov 8, 2016·1 cites·11 claims
- 2362US2025216347A1Nondestructive estimation of structural properties of a specimen via x-ray modelling based on simulations and ground truth measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 2462US2025231132A1Nondestructive estimation of structural properties of a specimen via x-ray modelling based on ground truth measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 2561US2025130185A1Non-destructive three-dimensional probing and characterization of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 2660US7161158B2System and method for fast focal length alterationsAPPLIED MATERIALS INC·Filed 2002·Granted Jan 9, 2007·4 cites·20 claims
- 2759US7312446B2Methods and systems for process monitoring using x-ray emissionAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Dec 25, 2007·2 cites·60 claims
- 2858US7473911B2Specimen current mapperAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Jan 6, 2009·8 cites·27 claims
- 2958US2024255449A1Non-destructive classification of specimens based on energy signature measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 3056US2024096591A1Non-destructive sem-based depth-profiling of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 3154US7847267B2Scanning electron microscope having multiple detectors and a method for multiple detector based imagingAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Dec 7, 2010·4 cites·16 claims
- 3254US2024085351A1Depth-profiling of samples based on x-ray measurementsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 3354US2024094150A1Non-destructive sem-based depth-profiling of samplesAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Application pending·0 cites
- 3452US2007090288A1Method and system for enhancing resolution of a scanning electron microscopeSHEMESH DROR·Filed 2006·Application pending·0 cites
- 3550US6894294B2System and method for reducing charged particle contaminationAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted May 17, 2005·2 cites·38 claims
- 3650US2012241605A1Method and system for enhancing resolution of a scanning electron microscopeSHEMESH DROR·Filed 2012·Application pending·0 cites
- 3748US11961221B2Defect examination on a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Apr 16, 2024·0 cites·20 claims
- 3841US6900065B2Apparatus and method for enhanced voltage contrast analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted May 31, 2005·2 cites·45 claims
- 3932US8361814B2Method for monitoring chamber cleanlinessAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Jan 29, 2013·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →