Inventor · disambiguated record
James W. Adkisson
Also filed as: ADKISSON JAMES W · ADKISSON JAMES WILLIAM
164 granted patents·20 pending applications·2,757 citations·filing 1982–2018
99Inventor score
Top patents by PatentIndex Score
184 records- 0198US9054671B2Tunable filter structures and design structuresADKISSON JAMES W·Filed 2011·Granted Jun 9, 2015·47 cites·16 claims
- 0298US6590259B2Semiconductor device of an embedded DRAM on SOI substrateIBM·Filed 2001·Granted Jul 8, 2003·177 cites·16 claims
- 0398US6483156B1Double planar gated SOI MOSFET structureIBM·Filed 2000·Granted Nov 19, 2002·210 cites·7 claims
- 0498US6472258B1Double gate trench transistorIBM·Filed 2000·Granted Oct 29, 2002·162 cites·9 claims
- 0598US6350653B1Embedded DRAM on silicon-on-insulator substrateIBM·Filed 2000·Granted Feb 26, 2002·236 cites·9 claims
- 0697US8227844B2Low lag transfer gate deviceADKISSON JAMES W·Filed 2008·Granted Jul 24, 2012·45 cites·13 claims
- 0797US7781781B2CMOS imager array with recessed dielectricIBM·Filed 2006·Granted Aug 24, 2010·65 cites·11 claims
- 0897US7759755B2Anti-reflection structures for CMOS image sensorsIBM·Filed 2008·Granted Jul 20, 2010·45 cites·16 claims
- 0997US7622364B2Bond pad for wafer and package for CMOS imagerIBM·Filed 2006·Granted Nov 24, 2009·61 cites·5 claims
- 1097US7205627B2Image sensor cellsIBM·Filed 2005·Granted Apr 17, 2007·44 cites·9 claims
- 1196US8957405B2Graphene field effect transistorIBM·Filed 2013·Granted Feb 17, 2015·20 cites·9 claims
- 1296US7240322B2Method of adding fabrication monitors to integrated circuit chipsIBM·Filed 2005·Granted Jul 3, 2007·60 cites·18 claims
- 1396US6797553B2Method for making multiple threshold voltage FET using multiple work-function gate materialsIBM·Filed 2002·Granted Sep 28, 2004·119 cites·17 claims
- 1495US9252733B2Switchable filters and design structuresIBM·Filed 2014·Granted Feb 2, 2016·9 cites·18 claims
- 1595US7524694B2Funneled light pipe for pixel sensorsIBM·Filed 2005·Granted Apr 28, 2009·40 cites·3 claims
- 1695US7482675B2Probing pads in kerf area for wafer testingIBM·Filed 2005·Granted Jan 27, 2009·40 cites·8 claims
- 1795US7193289B2Damascene copper wiring image sensorIBM·Filed 2004·Granted Mar 20, 2007·89 cites·10 claims
- 1895US7129130B2Out of the box vertical transistor for eDRAM on SOIIBM·Filed 2005·Granted Oct 31, 2006·25 cites·10 claims
- 1994US8910355B2Method of manufacturing a film bulk acoustic resonator with a loading elementADKISSON JAMES W·Filed 2011·Granted Dec 16, 2014·19 cites·19 claims
- 2094US8440490B2CMOS imager photodiode with enhanced capacitanceADKISSON JAMES W·Filed 2011·Granted May 14, 2013·9 cites·12 claims
- 2194US7829945B2Lateral diffusion field effect transistor with asymmetric gate dielectric profileIBM·Filed 2007·Granted Nov 9, 2010·31 cites·12 claims
- 2294US7772028B2CMOS imager with Cu wiring and method of eliminating high reflectivity interfaces therefromIBM·Filed 2007·Granted Aug 10, 2010·27 cites·23 claims
- 2394US7675097B2Silicide strapping in imager transfer gate deviceIBM·Filed 2006·Granted Mar 9, 2010·27 cites·24 claims
- 2494US7361989B1Stacked imager packageIBM·Filed 2006·Granted Apr 22, 2008·26 cites·11 claims
- 2593US9935600B2Switchable filters and design structuresIBM·Filed 2015·Granted Apr 3, 2018·7 cites·12 claims
- 2693US9058455B2Backside integration of RF filters for RF front end modules and design structureADKISSON JAMES W·Filed 2012·Granted Jun 16, 2015·12 cites·18 claims
- 2793US8168474B1Self-dicing chips using through silicon viasADKISSON JAMES W·Filed 2011·Granted May 1, 2012·19 cites·18 claims
- 2893US7659564B2CMOS imager photodiode with enhanced capacitanceIBM·Filed 2006·Granted Feb 9, 2010·15 cites·4 claims
- 2992US8003425B2Methods for forming anti-reflection structures for CMOS image sensorsIBM·Filed 2008·Granted Aug 23, 2011·20 cites·12 claims
- 3092US7141836B1Pixel sensor having doped isolation structure sidewallIBM·Filed 2005·Granted Nov 28, 2006·14 cites·15 claims
- 3191US10217852B1Heterojunction bipolar transistors with a controlled undercut formed beneath the extrinsic baseGLOBALFOUNDRIES INC·Filed 2018·Granted Feb 26, 2019·6 cites·20 claims
- 3291US9048809B2Method of manufacturing switchable filtersADKISSON JAMES W·Filed 2012·Granted Jun 2, 2015·11 cites·18 claims
- 3391US8299554B2Image sensor, method and design structure including non-planar reflectorADKISSON JAMES WILLIAM·Filed 2009·Granted Oct 30, 2012·14 cites·11 claims
- 3491US8138534B2Anti-reflection structures for CMOS image sensorsADKISSON JAMES W·Filed 2010·Granted Mar 20, 2012·9 cites·24 claims
- 3589US10020789B2Switchable filters and design structuresIBM·Filed 2015·Granted Jul 10, 2018·4 cites·12 claims
- 3689US9240448B2Bipolar junction transistors with reduced base-collector junction capacitanceIBM·Filed 2015·Granted Jan 19, 2016·5 cites·9 claims
- 3789US9099982B2Method of manufacturing switching filters and design structuresADKISSON JAMES W·Filed 2012·Granted Aug 4, 2015·10 cites·18 claims
- 3889US8796149B1Collector-up bipolar junction transistors in BiCMOS technologyIBM·Filed 2013·Granted Aug 5, 2014·8 cites·10 claims
- 3989US8138531B2Structures, design structures and methods of fabricating global shutter pixel sensor cellsADKISSON JAMES WILLIAM·Filed 2009·Granted Mar 20, 2012·12 cites·28 claims
- 4089US7655495B2Damascene copper wiring optical image sensorINTERNAT BUSINESS MACHIENS COR·Filed 2007·Granted Feb 2, 2010·15 cites·12 claims
- 4189US7521798B2Stacked imager packageIBM·Filed 2007·Granted Apr 21, 2009·13 cites·10 claims
- 4289US7439561B2Pixel sensor cell for collecting electrons and holesIBM·Filed 2005·Granted Oct 21, 2008·8 cites·2 claims
- 4389US6660596B2Double planar gated SOI MOSFET structureIBM·Filed 2002·Granted Dec 9, 2003·46 cites·9 claims
- 4488US9608096B1Implementing stress in a bipolar junction transistorGLOBALFOUNDRIES INC·Filed 2015·Granted Mar 28, 2017·6 cites·19 claims
- 4588US9029229B2Semiconductor device and method of forming the device by forming monocrystalline semiconductor layers on a dielectric layer over isolation regionsIBM·Filed 2013·Granted May 12, 2015·10 cites·13 claims
- 4688US8298853B2CMOS pixel sensor cells with poly spacer transfer gates and methods of manufactureADKISSON JAMES W·Filed 2010·Granted Oct 30, 2012·6 cites·24 claims
- 4788US7800147B2CMOS image sensor with reduced dark currentIBM·Filed 2008·Granted Sep 21, 2010·9 cites·13 claims
- 4888US6030541AProcess for defining a pattern using an anti-reflective coating and structure thereforIBM·Filed 1998·Granted Feb 29, 2000·105 cites·18 claims
- 4987US8492272B2Passivated through wafer vias in low-doped semiconductor substratesADKISSON JAMES W·Filed 2011·Granted Jul 23, 2013·7 cites·25 claims
- 5087US6448590B1Multiple threshold voltage FET using multiple work-function gate materialsIBM·Filed 2000·Granted Sep 10, 2002·38 cites·11 claims
Showing the top 50 of 184 patent records by PatentIndex Score.
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