Inventor · disambiguated record
Mitsuyasu Ohta
Also filed as: OHTA MITSUYASU
19 granted patents·4 pending applications·289 citations·filing 1990–2007
95Inventor score
Top patents by PatentIndex Score
23 records- 0190US6119250ASemiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Sep 12, 2000·71 cites·11 claims
- 0289US6734549B2Semiconductor device having a device for testing the semiconductorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted May 11, 2004·39 cites·16 claims
- 0388US6625784B1Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 23, 2003·46 cites·14 claims
- 0475US7032196B2Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Apr 18, 2006·15 cites·6 claims
- 0566US7197725B2Semiconductor integrated circuit and testing method for the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Mar 27, 2007·13 cites·19 claims
- 0659US6615389B1Database for designing integrated circuit device, and method for designing integrated circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 2, 2003·6 cites·16 claims
- 0757US5305328AMethod of test sequence generationMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1990·Granted Apr 19, 1994·19 cites·9 claims
- 0855US7348595B2Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Mar 25, 2008·4 cites·6 claims
- 0955US7171600B2Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jan 30, 2007·4 cites·4 claims
- 1055US6499125B1Method for inserting test circuit and method for converting test dataMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Dec 24, 2002·18 cites·14 claims
- 1154US6651206B2Method of design for testability, test sequence generation method and semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Nov 18, 2003·5 cites·5 claims
- 1252US5978948ASemiconductor circuit system, method for testing semiconductor integrated circuits, and method for generating a test sequence for testing thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Nov 2, 1999·14 cites·14 claims
- 1351US2007106965A1Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 1446US7203913B2Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Apr 10, 2007·2 cites·6 claims
- 1544US7302658B2Methods for evaluating quality of test sequences for delay faults and related technologyMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Nov 27, 2007·2 cites·18 claims
- 1644US2004139376A1Functional block for integrated circuit, semiconductor integrated circuit, method for testing semiconductor integrated circuit, and method for designing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 1742US6271677B1Semiconductor integrated circuit and method for testing the semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Aug 7, 2001·2 cites·27 claims
- 1839US6708301B1Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method thereforMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Mar 16, 2004·12 cites·10 claims
- 1939US2007250284A1Semiconductor integrated circuit and testing method for the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Application pending·0 cites
- 2037US2007011543A1Test pattern generation methodYOSHIMURA SHINICHI·Filed 2006·Application pending·0 cites
- 2135US5483543ATest sequence generation methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1992·Granted Jan 9, 1996·5 cites·11 claims
- 2234US6253343B1Method of design for testability test sequence generation method and semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Jun 26, 2001·4 cites·16 claims
- 2334US5617427AMethod for generating test sequences for detecting faults in target scan logical blocksMATSUSHITA ELECTCRIC IND CO LT·Filed 1995·Granted Apr 1, 1997·8 cites·7 claims
Join the waitlist — get patent alerts
Get an alert when Mitsuyasu Ohta files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →