Inventor · disambiguated record
Yuuji Takagi
Also filed as: TAKAGI YUUJI
13 granted patents·435 citations·filing 1985–2009
94Inventor score
Top patents by PatentIndex Score
13 records- 0197US4879704AOptical disk, optical disk recording and reproducing apparatus and copy preventive method for optical disksMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1987·Granted Nov 7, 1989·96 cites·6 claims
- 0296US4805046AInformation recording and reproducing apparatus using sectors divided into a plurality of frames and having means for proper storage of the frame dataMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1986·Granted Feb 14, 1989·89 cites·6 claims
- 0389US4695993AOptical information recording and reproducing apparatus and optical discMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1985·Granted Sep 22, 1987·46 cites·6 claims
- 0485US7598491B2Observing method and its apparatus using electron microscopeHITACHI HIGH TECH CORP·Filed 2006·Granted Oct 6, 2009·9 cites·15 claims
- 0585US6913861B2Method of observing exposure condition for exposing semiconductor device and its apparatus and method of manufacturing semiconductor deviceHITACHI HIGH TECH CORP·Filed 2003·Granted Jul 5, 2005·24 cites·18 claims
- 0682US4986668AInformation recording and reproducing apparatus with management of defective sectorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1989·Granted Jan 22, 1991·23 cites·3 claims
- 0781US5134575AMethod of producing numerical control data for inspecting assembled printed circuit boardHITACHI LTD·Filed 1990·Granted Jul 28, 1992·71 cites·2 claims
- 0881US4885735AInformation recording and reproducing apparatus with management of defective sectorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1986·Granted Dec 5, 1989·23 cites·2 claims
- 0980US8547429B2Apparatus and method for monitoring semiconductor device manufacturing processHONDA TOSHIFUMI·Filed 2009·Granted Oct 1, 2013·7 cites·20 claims
- 1080US6792366B2Method and apparatus for inspecting defects in a semiconductor waferHITACHI LTD·Filed 2001·Granted Sep 14, 2004·21 cites·10 claims
- 1177US6792367B2Method and apparatus for inspecting defects in a semiconductor waferHITACHI LTD·Filed 2002·Granted Sep 14, 2004·18 cites·2 claims
- 1240US4799208AOptical recording and reproducing apparatus having erasing function with controllable erasing beamMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1986·Granted Jan 17, 1989·4 cites·9 claims
- 1340US4789911AInformation recording and reproducing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1987·Granted Dec 6, 1988·4 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →