Assignee
HONDA TOSHIFUMI
JP·5 granted patents·2 pending applications·16 citations·filing 2007–2011
Top patents by PatentIndex Score
7 records- 0180US8547429B2Apparatus and method for monitoring semiconductor device manufacturing processHONDA TOSHIFUMI·Filed 2009·Granted Oct 1, 2013·7 cites·20 claims
- 0275US8405025B2Scanning electron microscope and method for detecting an image using the sameHONDA TOSHIFUMI·Filed 2008·Granted Mar 26, 2013·3 cites·11 claims
- 0374US8711347B2Defect inspection method and device thereforHONDA TOSHIFUMI·Filed 2011·Granted Apr 29, 2014·2 cites·16 claims
- 0473US9239283B2Defect inspection method and device thereforHONDA TOSHIFUMI·Filed 2011·Granted Jan 19, 2016·2 cites·15 claims
- 0573US9109194B2Device for harvesting bacterial colony and method thereforHONDA TOSHIFUMI·Filed 2010·Granted Aug 18, 2015·2 cites·4 claims
- 0643US2008058977A1Reviewing apparatus using a sem and method for reviewing defects or detecting defects using the reviewing apparatusHONDA TOSHIFUMI·Filed 2007·Application pending·0 cites
- 0743US2013293880A1Defect testing method and device for defect testingHONDA TOSHIFUMI·Filed 2011·Application pending·0 cites
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