Inventor · disambiguated record
Eric Gerardus Theodoor Bosch
Also filed as: BOSCH ERIC · BOSCH ERIC GERARDUS · BOSCH ERIC GERARDUS THEODOOR
17 granted patents·3 pending applications·122 citations·filing 2004–2023
92Inventor score
Files withFEI CO15BOUGHORBEL FAYSAL2KONINKL PHILIPS ELECTRONICS NV1SLUIJTERMAN ALBERTUS AEMILLIUS SEYNO1ZAHNRADFABRIK FRIEDRICHSHAFEN1
Top patents by PatentIndex Score
20 records- 0195US8232523B2SEM imaging methodBOUGHORBEL FAYSAL·Filed 2011·Granted Jul 31, 2012·41 cites·20 claims
- 0294US8581189B2Charged particle microscopy imaging methodBOUGHORBEL FAYSAL·Filed 2012·Granted Nov 12, 2013·18 cites·20 claims
- 0393US10446366B1Imaging technique in scanning transmission charged particle microscopyFEI CO·Filed 2018·Granted Oct 15, 2019·13 cites·20 claims
- 0493US9312098B2Method of examining a sample in a charged-particle microscopeFEI CO·Filed 2015·Granted Apr 12, 2016·16 cites·20 claims
- 0589US8704176B2Charged particle microscope providing depth-resolved imageryFEI CO·Filed 2013·Granted Apr 22, 2014·12 cites·20 claims
- 0686US10607811B1Multi-beam scanning transmission charged particle microscopeFEI CO·Filed 2019·Granted Mar 31, 2020·4 cites·12 claims
- 0783US10403469B2Method of performing tomographic imaging in a charged-particle microscopeFEI CO·Filed 2016·Granted Sep 3, 2019·3 cites·19 claims
- 0878US11211223B1System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopyFEI CO·Filed 2020·Granted Dec 28, 2021·1 cites·20 claims
- 0976US10573488B2Method of performing tomographic imaging in a charged-particle microscopeFEI CO·Filed 2019·Granted Feb 25, 2020·1 cites·18 claims
- 1073US10699872B2Discriminative imaging technique in scanning transmission charged particle microscopyFEI CO·Filed 2019·Granted Jun 30, 2020·1 cites·12 claims
- 1172US10008363B2Method of imaging a specimen using ptychographyFEI CO·Filed 2017·Granted Jun 26, 2018·1 cites·20 claims
- 1269US9711325B2Charged-particle microscope providing depth-resolved imageryFEI CO·Filed 2014·Granted Jul 18, 2017·1 cites·22 claims
- 1366US8952328B2Charged particle detector system comprising a conversion electrodeSLUIJTERMAN ALBERTUS AEMILLIUS SEYNO·Filed 2012·Granted Feb 10, 2015·3 cites·23 claims
- 1463US9206504B2Low energy ion milling or depositionFEI CO·Filed 2014·Granted Dec 8, 2015·1 cites·14 claims
- 1562US9959639B2Method of ptychographic imagingFEI CO·Filed 2016·Granted May 1, 2018·1 cites·20 claims
- 1655US2023352269A1Method and Scanning Transmission Charged-Particle MicroscopeFEI CO·Filed 2023·Application pending·0 cites
- 1749US7518300B2Method and device for the generation of a plasma through electric discharge in a discharge spaceKONINKL PHILIPS ELECTRONICS NV·Filed 2004·Granted Apr 14, 2009·5 cites·19 claims
- 1848US9208993B2Charged-particle microscopy with enhanced electron detectionFEI CO·Filed 2014·Granted Dec 8, 2015·0 cites·20 claims
- 1943US2020118788A1Charged particle microscope, and method for adjusting a charged particle microscopeFEI CO·Filed 2019·Application pending·0 cites
- 2042US2008147283A1Method for Controlling a Controllable UnitZAHNRADFABRIK FRIEDRICHSHAFEN·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Eric Gerardus Theodoor Bosch files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →