Inventor · disambiguated record
Akihiko Harada
Also filed as: HARADA AKIHIKO
11 granted patents·3 pending applications·224 citations·filing 1998–2013
91Inventor score
Top patents by PatentIndex Score
14 records- 0194US6731140B2Complement reset multiplexer latchFUJITSU LTD·Filed 2003·Granted May 4, 2004·72 cites·25 claims
- 0281US6251774B1Method of manufacturing a semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jun 26, 2001·63 cites·14 claims
- 0372US7135742B1Insulated gate type semiconductor device and method for fabricating sameFUJITSU LTD·Filed 2000·Granted Nov 14, 2006·21 cites·4 claims
- 0463US7535790B2Semiconductor device using dynamic circuitFUJITSU LTD·Filed 2007·Granted May 19, 2009·3 cites·6 claims
- 0561US6744242B1Four-state switched decoupling capacitor system for active power stabilizerFUJITSU LTD·Filed 2003·Granted Jun 1, 2004·13 cites·7 claims
- 0660US6906579B2Optimal inductor managementFUJITSU LTD·Filed 2003·Granted Jun 14, 2005·15 cites·13 claims
- 0758US6445071B1Semiconductor device having an improved multi-layer interconnection structure and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 3, 2002·8 cites·6 claims
- 0855US6040627ASemiconductor device and method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 21, 2000·21 cites·8 claims
- 0954US7948228B2Technique for measuring power source noise generated inside integrated circuitFUJITSU LTD·Filed 2009·Granted May 24, 2011·2 cites·5 claims
- 1053US7635986B2Power source noise measuring device, integrated circuit, and semiconductor deviceFUJITSU LTD·Filed 2007·Granted Dec 22, 2009·2 cites·12 claims
- 1143US2014051222A1Method of manufacturing semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2013·Application pending·0 cites
- 1237US2003001270A1Semiconductor device having an improved multi-layer interconnection structure and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 1336US2008304338A1Semiconductor memory deviceFUJITSU LTD·Filed 2008·Application pending·0 cites
- 1435US6730976B2Multilayer gate electrode structure with tilted on implantationRENESAS TECH CORP·Filed 1998·Granted May 4, 2004·4 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →