Inventor · disambiguated record
Alexander Hoefler
Also filed as: HOEFLER ALEXANDER · HOEFLER ALEXANDER B · HOEFLER ALEXANDER BERNHARD
49 granted patents·2 pending applications·918 citations·filing 2001–2024
98Inventor score
Top patents by PatentIndex Score
51 records- 0198US6714436B1Write operation for capacitorless RAMMOTOROLA INC·Filed 2003·Granted Mar 30, 2004·211 cites·30 claims
- 0297US9947391B1SRAM based physically unclonable function and method for generating a PUF responseNXP USA INC·Filed 2017·Granted Apr 17, 2018·53 cites·20 claims
- 0396US11233663B1Physically unclonable function having source bias transistorsNXP USA INC·Filed 2020·Granted Jan 25, 2022·11 cites·20 claims
- 0496US8380768B2Random number generatorFREESCALE SEMICONDUCTOR INC·Filed 2009·Granted Feb 19, 2013·63 cites·16 claims
- 0595US7369452B2Programmable cellFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted May 6, 2008·50 cites·20 claims
- 0695US7285832B2Multiport single transistor bit cellHOEFLER ALEXANDER B·Filed 2005·Granted Oct 23, 2007·34 cites·16 claims
- 0794US10574469B1Physically unclonable function and method for generating a digital codeNXP USA INC·Filed 2019·Granted Feb 25, 2020·17 cites·13 claims
- 0892US6887758B2Non-volatile memory device and method for formingFREESCALE SEMICONDUCTOR INC·Filed 2002·Granted May 3, 2005·70 cites·29 claims
- 0992US6791883B2Program and erase in a thin film storage non-volatile memoryFREESCALE SEMICONDUCTOR INC·Filed 2002·Granted Sep 14, 2004·66 cites·38 claims
- 1090US7733711B2Circuit and method for optimizing memory sense amplifier timingFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Jun 8, 2010·22 cites·20 claims
- 1190US6939767B2Multi-bit non-volatile integrated circuit memory and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Sep 6, 2005·56 cites·21 claims
- 1289US6713812B1Non-volatile memory device having an anti-punch through (APT) regionMOTOROLA INC·Filed 2002·Granted Mar 30, 2004·48 cites·21 claims
- 1388US12181522B2Integrated circuit having test circuitry for memory sub-systemsNXP USA INC·Filed 2022·Granted Dec 31, 2024·1 cites·20 claims
- 1488US7206214B2One time programmable memory and method of operationFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Apr 17, 2007·20 cites·20 claims
- 1586US8379468B2Word line fault detectionFREESCALE SEMICONDUCTOR INC·Filed 2011·Granted Feb 19, 2013·10 cites·20 claims
- 1683US7824988B2Method of forming an integrated circuitFREESCALE SEMICONDUCTOR INC·Filed 2009·Granted Nov 2, 2010·8 cites·19 claims
- 1783US6911360B2Fuse and method for formingFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Jun 28, 2005·38 cites·37 claims
- 1881US7560965B2Scannable flip-flop with non-volatile storage element and methodFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Jul 14, 2009·11 cites·15 claims
- 1980US11056161B2Data processing system and method for generating a digital code with a physically unclonable functionNXP USA INC·Filed 2019·Granted Jul 6, 2021·3 cites·18 claims
- 2080US6828618B2Split-gate thin-film storage NVM cellFREESCALE SEMICONDUCTOR INC·Filed 2002·Granted Dec 7, 2004·26 cites·22 claims
- 2178US7312129B2Method for producing two gates controlling the same channelFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Dec 25, 2007·7 cites·20 claims
- 2275US7575958B2Programmable fuse with silicon germaniumFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Aug 18, 2009·6 cites·23 claims
- 2375US7115949B2Method of forming a semiconductor device in a semiconductor layer and structure thereofFREESCALE SEMICONDUCTOR INC·Filed 2002·Granted Oct 3, 2006·20 cites·12 claims
- 2474US7678620B2Antifuse one time programmable memory array and method of manufactureFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Mar 16, 2010·4 cites·20 claims
- 2572US9407263B2Method and apparatus for a tunable driver circuitFREESCALE SEMICONDUCTOR INC·Filed 2012·Granted Aug 2, 2016·3 cites·20 claims
- 2672US9263152B1Address fault detection circuitHOEFLER ALEXANDER B·Filed 2014·Granted Feb 16, 2016·4 cites·21 claims
- 2769US9425775B2Low swing flip-flop with reduced leakage slave latchJARRAR ANIS M·Filed 2014·Granted Aug 23, 2016·3 cites·20 claims
- 2869US7161822B2Compact non-volatile memory array with reduced disturbFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Jan 9, 2007·3 cites·19 claims
- 2967US9691451B1Write assist circuit and method thereforNXP USA INC·Filed 2016·Granted Jun 27, 2017·2 cites·20 claims
- 3067US7179712B2Multibit ROM cell and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Feb 20, 2007·15 cites·25 claims
- 3165US7113430B2Device for reducing sub-threshold leakage current within a high voltage driverFREESCALE SEMICONDUCTOR INC·Filed 2002·Granted Sep 26, 2006·15 cites·14 claims
- 3264US8659322B2Memory having a latching sense amplifier resistant to negative bias temperature instability and method thereforHOEFLER ALEXANDER B·Filed 2011·Granted Feb 25, 2014·3 cites·19 claims
- 3359US12462850B2System and method for improving safety of integrated circuitsNXP BV·Filed 2024·Granted Nov 4, 2025·0 cites·20 claims
- 3458US8254186B2Circuit for verifying the write enable of a one time programmable memoryHOEFLER ALEXANDER B·Filed 2010·Granted Aug 28, 2012·2 cites·20 claims
- 3555US9117534B2Fuse circuit with test modeHOEFLER ALEXANDER B·Filed 2014·Granted Aug 25, 2015·1 cites·20 claims
- 3653US10127998B2Memory having one time programmable (OTP) elements and a method of programming the memoryHOEFLER ALEXANDER B·Filed 2013·Granted Nov 13, 2018·1 cites·18 claims
- 3753US7518177B2Semiconductor storage deviceFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Apr 14, 2009·2 cites·11 claims
- 3853US7289352B2Semiconductor storage deviceFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Oct 30, 2007·2 cites·15 claims
- 3952US12322472B2Voltage generation circuit for SRAMNXP BV·Filed 2022·Granted Jun 3, 2025·0 cites·20 claims
- 4050US7787323B2Level detect circuitFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Aug 31, 2010·2 cites·17 claims
- 4148US9136845B2Level shifter with improved operationBADRUDDUZA SAYEED AHMED·Filed 2014·Granted Sep 15, 2015·1 cites·20 claims
- 4248US6724032B2Multi-bit non-volatile memory cell and method thereforMOTOROLA INC·Filed 2002·Granted Apr 20, 2004·3 cites·19 claims
- 4347US7804701B2Method of programming a memory having electrically programmable fusesFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Sep 28, 2010·1 cites·16 claims
- 4443US10446225B1Memory system having a source bias circuitNXP USA INC·Filed 2018·Granted Oct 15, 2019·0 cites·19 claims
- 4543US10417104B2Data processing system with built-in self-test and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Sep 17, 2019·0 cites·16 claims
- 4642US9264040B2Low leakage CMOS cell with low voltage swingFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Feb 16, 2016·0 cites·17 claims
- 4740US7432547B2Non-volatile memory device with improved data retention and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted Oct 7, 2008·0 cites·6 claims
- 4838US7583554B2Integrated circuit fuse arrayFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Sep 1, 2009·0 cites·20 claims
- 4937US2003113962A1Non-volatile memory device with improved data retention and method thereforFiled 2001·Application pending·0 cites
- 5035US2008212388A1Integrated circuit fuse arrayHOEFLER ALEXANDER B·Filed 2007·Application pending·0 cites
Showing the top 50 of 51 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →