Inventor · disambiguated record
Mako Okamoto
Also filed as: OKAMOTO MAKO
10 granted patents·2 pending applications·142 citations·filing 2001–2008
89Inventor score
Top patents by PatentIndex Score
12 records- 0186US7030681B2Semiconductor device with multiple power sourcesRENESAS TECH CORP·Filed 2002·Granted Apr 18, 2006·45 cites·5 claims
- 0281US7479820B2Semiconductor device including detector circuit capable of performing high-speed operationRENESAS TECH CORP·Filed 2005·Granted Jan 20, 2009·12 cites·8 claims
- 0372US6373763B1Semiconductor memory provided with data-line equalizing circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 16, 2002·20 cites·16 claims
- 0471US6781431B2Clock generating circuitRENESAS TECH CORP·Filed 2003·Granted Aug 24, 2004·21 cites·8 claims
- 0569US6614270B2Potential detecting circuit having wide operating margin and semiconductor device including the sameMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 2, 2003·18 cites·18 claims
- 0669US6501326B2Semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 31, 2002·17 cites·16 claims
- 0746US6777707B2Semiconductor integrated circuit with voltage down converter adaptable for burn-in testingRENESAS TECH CORP·Filed 2002·Granted Aug 17, 2004·5 cites·10 claims
- 0841US6424579B1Semiconductor memory device with internal power supply potential generation circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 23, 2002·3 cites·11 claims
- 0941US2009102544A1Semiconductor device including detector circuit capable of performing high-speed operationRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 1037US6665217B2Semiconductor memory device including internal power circuit having tuning functionMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 16, 2003·1 cites·17 claims
- 1135US2002033725A1Clock generating circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Application pending·0 cites
- 1234US6593642B2Semiconductor device provided with potential transmission lineMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 15, 2003·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →