Inventor · disambiguated record
Dennis Yost
Also filed as: YOST DENNIS · YOST DENNIS J · YOST JR DENNIS
12 granted patents·10 pending applications·985 citations·filing 1993–2024
93Inventor score
Files withAPPLIED MATERIALS INC9TEXAS INSTRUMENTS INC3BROWN BRIAN2BASILARD BIOTECH INC1CAVENDISH KINETICS INC1
Top patents by PatentIndex Score
22 records- 0198US6340435B1Integrated low K dielectrics and etch stopsAPPLIED MATERIALS INC·Filed 1999·Granted Jan 22, 2002·536 cites·14 claims
- 0297US6858153B2Integrated low K dielectrics and etch stopsAPPLIED MATERIALS INC·Filed 2001·Granted Feb 22, 2005·256 cites·21 claims
- 0393US6669858B2Integrated low k dielectrics and etch stopsAPPLIED MATERIALS INC·Filed 2001·Granted Dec 30, 2003·47 cites·14 claims
- 0489US7227244B2Integrated low k dielectrics and etch stopsAPPLIED MATERIALS INC·Filed 2004·Granted Jun 5, 2007·27 cites·8 claims
- 0576US5444018AMetallization process for a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1993·Granted Aug 22, 1995·56 cites·5 claims
- 0674US7718009B2Cleaning submicron structures on a semiconductor wafer surfaceAPPLIED MATERIALS INC·Filed 2004·Granted May 18, 2010·18 cites·19 claims
- 0773US8124527B2CMP process flow for MEMSLACEY JOSEPH DAMIAN GORDON·Filed 2011·Granted Feb 28, 2012·3 cites·20 claims
- 0870US7332360B2Early detection of metal wiring reliability using a noise spectrumAPPLIED MATERIALS INC·Filed 2004·Granted Feb 19, 2008·12 cites·23 claims
- 0970US7313456B2Method and apparatus for capturing and using design intent in an integrated circuit fabrication processAPPLIED MATERIALS INC·Filed 2004·Granted Dec 25, 2007·2 cites·43 claims
- 1065US2025263750A1Deterministic mechanoporation devices, systems and methodsBASILARD BIOTECH INC·Filed 2024·Application pending·0 cites
- 1153US2008059261A1Method for capturing and using design intent in an integrated circuit fabrication processMADOK JOHN H·Filed 2007·Application pending·0 cites
- 1252US5508233AGlobal planarization process using patterned oxideTEXAS INSTRUMENTS INC·Filed 1994·Granted Apr 16, 1996·20 cites·13 claims
- 1352US2008041427A1Temperature control of a substrate during wet processesBROWN BRIAN·Filed 2007·Application pending·0 cites
- 1451US2013138632A1Aircraft trending systems and methodsYOST DENNIS·Filed 2011·Application pending·0 cites
- 1547US2006254616A1Temperature control of a substrate during wet processesBROWN BRIAN·Filed 2005·Application pending·0 cites
- 1644US2024313829A1Wireless Communications Using Non-Reciprocal Relays and Spatially-Fed RepeatersLATYS INTELLIGENCE INC·Filed 2022·Application pending·0 cites
- 1744US2014339688A1Techniques for the cancellation of chip scale packaging parasitic lossesCAVENDISH KINETICS INC·Filed 2014·Application pending·0 cites
- 1844US2008230092A1Method and apparatus for single-substrate cleaningKO ALEXANDER SOU-KANG·Filed 2007·Application pending·0 cites
- 1941US7521374B2Method and apparatus for cleaning semiconductor substratesAPPLIED MATERIALS INC·Filed 2004·Granted Apr 21, 2009·0 cites·30 claims
- 2041US2007082477A1Integrated circuit fabricating techniques employing sacrificial linersAPPLIED MATERIALS INC·Filed 2005·Application pending·0 cites
- 2139US2005084206A1Fiberoptic wavelength combinerFiled 2003·Application pending·0 cites
- 2237US5635428AGlobal planarization using a polyimide blockTEXAS INSTRUMENTS INC·Filed 1994·Granted Jun 3, 1997·8 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →