Inventor · disambiguated record
Christopher G. Talbot
Also filed as: TALBOT CHRISTOPHER · TALBOT CHRISTOPHER G · TALBOT CHRISTOPHER GRAHAM
23 granted patents·1 pending application·2,084 citations·filing 1982–2023
97Inventor score
Files withSCHLUMBERGER TECHNOLOGIES INC13APPLIED MATERIALS INC9APPLIED MATERIALS ISRAEL LTD1NAT RES DEV1
Top patents by PatentIndex Score
24 records- 0197US7253645B2Detection of defects in patterned substratesAPPLIED MATERIALS INC·Filed 2005·Granted Aug 7, 2007·76 cites·2 claims
- 0297US6509750B1Apparatus for detecting defects in patterned substratesAPPLIED MATERIALS INC·Filed 2001·Granted Jan 21, 2003·118 cites·21 claims
- 0397US6252412B1Method of detecting defects in patterned substratesSCHLUMBERGER TECHNOLOGIES INC·Filed 1999·Granted Jun 26, 2001·344 cites·19 claims
- 0496US6539106B1Feature-based defect detectionAPPLIED MATERIALS INC·Filed 1999·Granted Mar 25, 2003·434 cites·25 claims
- 0596US5530372AMethod of probing a net of an IC at an optimal probe-pointSCHLUMBERGER TECHNOLOGIES INC·Filed 1994·Granted Jun 25, 1996·140 cites·17 claims
- 0695US6091249AMethod and apparatus for detecting defects in wafersSCHLUMBERGER TECHNOLOGIES INC·Filed 1998·Granted Jul 18, 2000·236 cites·42 claims
- 0795US5675499AOptimal probe point placementSCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted Oct 7, 1997·130 cites·11 claims
- 0893US5616921ASelf-masking FIB millingSCHLUMBERGER TECHNOLOGIES INC·Filed 1994·Granted Apr 1, 1997·108 cites·27 claims
- 0991US6504393B1Methods and apparatus for testing semiconductor and integrated circuit structuresAPPLIED MATERIALS INC·Filed 1997·Granted Jan 7, 2003·130 cites·35 claims
- 1090US5401972ALayout overlay for FIB operationsSCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Mar 28, 1995·62 cites·21 claims
- 1187US5821549AThrough-the-substrate investigation of flip-chip IC'sSCHLUMBERGER TECHNOLOGIES INC·Filed 1997·Granted Oct 13, 1998·79 cites·17 claims
- 1283US9915621B2Extreme ultraviolet (EUV) substrate inspection system with simplified optics and method of manufacturing thereofAPPLIED MATERIALS INC·Filed 2014·Granted Mar 13, 2018·4 cites·12 claims
- 1381US5140164AIc modification with focused ion beam systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Aug 18, 1992·78 cites·5 claims
- 1480US6914441B2Detection of defects in patterned substratesAPPLIED MATERIALS INC·Filed 2002·Granted Jul 5, 2005·17 cites·18 claims
- 1580US5144225AMethods and apparatus for acquiring data from intermittently failing circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Sep 1, 1992·46 cites·11 claims
- 1674US6518571B2Through-the-substrate investigation of flip-chip IC'sSCHLUMBERGER TECHNOLOGIES INC·Filed 2001·Granted Feb 11, 2003·13 cites·48 claims
- 1769US6225626B1Through-the-substrate investigation of flip chip IC'sSCHLUMBERGER TECHNOLOGIES INC·Filed 1998·Granted May 1, 2001·29 cites·17 claims
- 1868US4510384AAutomatic focusing device with frequency weighted amplificationNAT RES DEV·Filed 1982·Granted Apr 9, 1985·11 cites·10 claims
- 1967US10421125B2Controlling an intensity profile of an energy beam in additive manufacturing based on travel direction or velocityAPPLIED MATERIALS INC·Filed 2017·Granted Sep 24, 2019·0 cites·20 claims
- 2066US10307822B2Controlling an intensity profile of an energy beam with a deformable mirror in additive manufacturingAPPLIED MATERIALS INC·Filed 2017·Granted Jun 4, 2019·0 cites·22 claims
- 2159US5357116AFocused ion beam processing with charge controlSCHLUMBERGER TECHNOLOGIES INC·Filed 1992·Granted Oct 18, 1994·19 cites·14 claims
- 2259US2024099617A1Diffuse optical imaging/tomography using meta-opticsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2347US7602197B2High current electron beam inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Oct 13, 2009·4 cites·21 claims
- 2437US5959458AMethod and apparatus for measuring electrical waveforms using atomic force microscopySCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted Sep 28, 1999·6 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →