Inventor · disambiguated record
John Andberg
Also filed as: ANDBERG JOHN · ANDBERG JOHN W · ANDBERG JOHN WILLIAM
19 granted patents·4 pending applications·509 citations·filing 1998–2014
95Inventor score
Files withAEHR TEST SYSTEMS5VERIGY PTE LTD SINGAPORE5AGILENT TECHNOLOGIES INC2ANDBERG JOHN W2ADVANTEST CORP1
Top patents by PatentIndex Score
23 records- 0198US6340895B1Wafer-level burn-in and test cartridgeAEHR TEST SYSTEMS INC·Filed 1999·Granted Jan 22, 2002·211 cites·44 claims
- 0293US6580283B1Wafer level burn-in and test methodsAEHR TEST SYSTEMS·Filed 1999·Granted Jun 17, 2003·109 cites·35 claims
- 0391US10297339B2Integrated cooling system for electronics testing apparatusADVANTEST CORP·Filed 2014·Granted May 21, 2019·21 cites·12 claims
- 0489US7193854B2Using a leaf spring to attach clamp plates with a heat sink to both sides of a component mounted on a printed circuit assemblyVERIGY PTE LTD·Filed 2005·Granted Mar 20, 2007·19 cites·23 claims
- 0585US7147499B1Zero insertion force printed circuit assembly connector system and methodVERIGY IPCO·Filed 2005·Granted Dec 12, 2006·13 cites·19 claims
- 0684US7088117B2Wafer burn-in and test employing detachable cartridgeAEHR TEST SYSTEM·Filed 2003·Granted Aug 8, 2006·26 cites·26 claims
- 0775US7859277B2Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe arrayVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Dec 28, 2010·7 cites·6 claims
- 0872US6556032B2Wafer-burn-in and test employing detachable cartridgeAEHR TEST SYSTEMS·Filed 2001·Granted Apr 29, 2003·11 cites·25 claims
- 0972US6413113B2Kinematic couplingAEHR TEST SYSTEMS·Filed 1999·Granted Jul 2, 2002·33 cites·29 claims
- 1068US6140616AWafer level burn-in and test thermal chuck and methodAEHR TEST SYSTEMS·Filed 1998·Granted Oct 31, 2000·33 cites·39 claims
- 1167US7541822B2Wafer burn-in and text employing detachable cartridgeAEHR TEST SYSTEMS·Filed 2006·Granted Jun 2, 2009·3 cites·15 claims
- 1266US9335347B2Method and apparatus for massively parallel multi-wafer testANDBERG JOHN W·Filed 2012·Granted May 10, 2016·3 cites·13 claims
- 1365US7460371B2Wiffle tree components, cooling systems, and methods of attaching a printed circuit board to a heat sinkAGILENT TECHNOLOGIES INC·Filed 2006·Granted Dec 2, 2008·2 cites·26 claims
- 1461US6787718B2Device, method, and system for detecting the presence of liquid in proximity to electronic componentsAGILENT TECHNOLOGIES INC·Filed 2002·Granted Sep 7, 2004·13 cites·39 claims
- 1557US9128122B2Stiffener plate for a probecard and methodANDBERG JOHN·Filed 2011·Granted Sep 8, 2015·1 cites·20 claims
- 1657US7459921B2Method and apparatus for a paddle board probe cardVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Dec 2, 2008·2 cites·8 claims
- 1752US7501844B2Liquid cooled DUT card interface for wafer sort probingVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Mar 10, 2009·1 cites·16 claims
- 1849US2009255098A1Clamp with a non-linear biasing memberANDBERG JOHN WILLIAM·Filed 2008·Application pending·0 cites
- 1948US2013135002A1Test electronics to device under test interfaces, and methods and apparatus using sameGROVER SANJEEV·Filed 2013·Application pending·0 cites
- 2046US7541824B2Forced air cooling of components on a probecardVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Jun 2, 2009·1 cites·7 claims
- 2145US8354853B2Test electronics to device under test interfaces, and methods and apparatus using sameADVANTEST SINGAPORE PTE LTD·Filed 2009·Granted Jan 15, 2013·0 cites·9 claims
- 2242US2011089966A1Apparatus and systems for processing signals between a tester and a plurality of devices under testVERIGY PTE LTD SINGAPORE·Filed 2010·Application pending·0 cites
- 2337US2007089858A1Waterblock for cooling electrical and electronic circuitryANDBERG JOHN W·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →