Inventor · disambiguated record
Albertus Aemillius Seyno Sluijterman
Also filed as: SLUIJTERMAN ALBERTUS AEMILLIUS SEYNO
4 granted patents·2 pending applications·11 citations·filing 2009–2019
67Inventor score
Technology areasH01J
Top patents by PatentIndex Score
6 records- 0184US9778377B2Method of performing spectroscopy in a transmission charged-particle microscopeFEI CO·Filed 2016·Granted Oct 3, 2017·5 cites·20 claims
- 0271US8288724B2Dark field detector for use in an electron microscopeKOOIJMAN CORNELIS SANDER·Filed 2009·Granted Oct 16, 2012·3 cites·13 claims
- 0366US8952328B2Charged particle detector system comprising a conversion electrodeSLUIJTERMAN ALBERTUS AEMILLIUS SEYNO·Filed 2012·Granted Feb 10, 2015·3 cites·23 claims
- 0448US9208993B2Charged-particle microscopy with enhanced electron detectionFEI CO·Filed 2014·Granted Dec 8, 2015·0 cites·20 claims
- 0543US2020118788A1Charged particle microscope, and method for adjusting a charged particle microscopeFEI CO·Filed 2019·Application pending·0 cites
- 0632US2015279615A1Imaging a Sample with Multiple Beams and Multiple DetectorsFEI CO·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →