Inventor · disambiguated record
Michikazu Matsumoto
Also filed as: MATSUMOTO MICHIKAZU
24 granted patents·6 pending applications·505 citations·filing 1993–2009
96Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD25PANASONIC CORP3MATSUSHITA ELECTRONICS CORP1MATSUSHITA ELECTTRIC IND CO LT1
Top patents by PatentIndex Score
30 records- 0193US6436747B1Method of fabricating semiconductor deviceMATSUSHITA ELECTTRIC IND CO LT·Filed 2000·Granted Aug 20, 2002·109 cites·17 claims
- 0290US6451690B1Method of forming electrode structure and method of fabricating semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Sep 17, 2002·61 cites·8 claims
- 0386US6664196B1Method of cleaning electronic device and method of fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Dec 16, 2003·36 cites·8 claims
- 0484US5726479ASemiconductor device having polysilicon electrode minimization resulting in a small resistance valueMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Mar 10, 1998·79 cites·18 claims
- 0582US6509254B1Method of forming electrode structure and method of fabricating semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Jan 21, 2003·35 cites·11 claims
- 0680US7202147B2Semiconductor device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Granted Apr 10, 2007·7 cites·6 claims
- 0780US6297517B1Semiconductor device and method of fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2000·Granted Oct 2, 2001·24 cites·4 claims
- 0878US6593219B2Method for fabricating electrode structure and method for fabricating semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Jul 15, 2003·26 cites·12 claims
- 0975US7126174B2Semiconductor device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Oct 24, 2006·13 cites·20 claims
- 1071US6281562B1Semiconductor device which reduces the minimum distance requirements between active areasMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Aug 28, 2001·28 cites·12 claims
- 1164US5677249ASemiconductor apparatus and production method for the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Oct 14, 1997·24 cites·6 claims
- 1261US7800181B2Semiconductor device and method for fabricating the samePANASONIC CORP·Filed 2006·Granted Sep 21, 2010·2 cites·9 claims
- 1358US7851891B2Semiconductor device and method for fabricating the samePANASONIC CORP·Filed 2009·Granted Dec 14, 2010·1 cites·22 claims
- 1457US7253436B2Resistance defect assessment device, resistance defect assessment method, and method for manufacturing resistance defect assessment deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Aug 7, 2007·9 cites·21 claims
- 1553US6967409B2Semiconductor device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Nov 22, 2005·3 cites·81 claims
- 1653US5382544AManufacturing method of a semiconductor device utilizing thin metal filmMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1993·Granted Jan 17, 1995·21 cites·1 claims
- 1752US6660601B2Semiconductor device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Dec 9, 2003·4 cites·7 claims
- 1850US6720241B2Method for manufacturing semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Apr 13, 2004·5 cites·23 claims
- 1949US6709950B2Semiconductor device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Mar 23, 2004·2 cites·22 claims
- 2049US2005156220A1Semiconductor device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 2147US2005263833A1Apparatus for evaluating amount of charge, method for fabricating the same, and method for evaluating amount of chargeMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 2247US2007158760A1Semiconductor device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Application pending·0 cites
- 2343US7585767B2Semiconductor device and method for fabricating the samePANASONIC CORP·Filed 2006·Granted Sep 8, 2009·0 cites·11 claims
- 2441US6946305B2Apparatus for evaluating amount of charge, method for fabricating the same, and method for evaluating amount of chargeMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Sep 20, 2005·0 cites·6 claims
- 2541US6214126B1Method for cleaning a silicon substrateMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Apr 10, 2001·9 cites·7 claims
- 2641US2006187719A1Semiconductor package, ID generating system thereof, ID recognizing system thereof, ID recognition method thereof, semiconductor integrated circuit chip, ID generating system thereof, ID recognizing system thereof, and ID recognition method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 2739US6100170AMethod of manufacturing semiconductor deviceMATSUSHITA ELECTRONICS CORP·Filed 1998·Granted Aug 8, 2000·7 cites·9 claims
- 2837US2004140508A1Semiconductor device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 2936US2004175909A1Semiconductor device and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 3033US6879043B2Electrode structure and method for fabricating the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Apr 12, 2005·0 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →