Inventor · disambiguated record
Stephen G. Beebe
Also filed as: BEEBE STEPHEN · BEEBE STEPHEN G
11 granted patents·1 pending application·106 citations·filing 2001–2011
90Inventor score
Top patents by PatentIndex Score
12 records- 0183US7609493B1ESD protection circuit and method for lowering capacitance of the ESD protection circuitGLOBALFOUNDRIES INC·Filed 2005·Granted Oct 27, 2009·11 cites·12 claims
- 0281US6589823B1Silicon-on-insulator (SOI)electrostatic discharge (ESD) protection device with backside contact plugADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 8, 2003·29 cites·18 claims
- 0378US8310011B2Field effect resistor for ESD protectionSALMAN AKRAM A·Filed 2011·Granted Nov 13, 2012·7 cites·7 claims
- 0475US8564917B2Integrated circuit having electrostatic discharge protectionCHEN WENSONG·Filed 2011·Granted Oct 22, 2013·5 cites·13 claims
- 0572US6462381B1Silicon-on-insulator (SOI) electrostatic discharge (ESD) protection device with backside contact openingADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 8, 2002·19 cites·5 claims
- 0671US7560777B1Protection element and method of manufactureADVANCED MICRO DEVICES INC·Filed 2005·Granted Jul 14, 2009·5 cites·13 claims
- 0768US8018002B2Field effect resistor for ESD protectionGLOBALFOUNDRIES INC·Filed 2009·Granted Sep 13, 2011·4 cites·13 claims
- 0868US7164185B1Semiconductor component and method of manufactureADVANCED MICRO DEVICES INC·Filed 2004·Granted Jan 16, 2007·14 cites·27 claims
- 0963US7791102B2Electrostatic discharge protection devices and methods for protecting semiconductor devices against electrostatic discharge eventsADVANCED MICRO DEVICES INC·Filed 2006·Granted Sep 7, 2010·3 cites·15 claims
- 1061US7205165B1Method for determining the reliability of dielectric layersADVANCED MICRO DEVICES INC·Filed 2003·Granted Apr 17, 2007·9 cites·26 claims
- 1141US2008247101A1Electronic device and methodADVANCED MICRO DEVICES INC·Filed 2007·Application pending·0 cites
- 1240US8013393B2Electrostatic discharge protection devicesADVANCED MICRO DEVICES INC·Filed 2007·Granted Sep 6, 2011·0 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →