Inventor · disambiguated record
John F. Valley
Also filed as: VALLEY JOHN F · VALLEY JOHN FRANCIS
11 granted patents·1 pending application·28 citations·filing 2004–2021
85Inventor score
Files withGLOBALWAFERS CO LTD6SUNEDISON SEMICONDUCTOR LTD UEN201334164H2KLA TENCOR TECH CORP1MEMC ELECTRONIC MATERIALS1SINHA JAYDEEP K1
Top patents by PatentIndex Score
12 records- 0188US10679908B2Cleave systems, mountable cleave monitoring systems, and methods for separating bonded wafer structuresGLOBALWAFERS CO LTD·Filed 2018·Granted Jun 9, 2020·7 cites·18 claims
- 0284US7324917B2Method, system, and software for evaluating characteristics of a surface with reference to its edgeKLA TENCOR TECH CORP·Filed 2005·Granted Jan 29, 2008·13 cites·54 claims
- 0379US9665931B2Air pocket detection methods and systemsSUNEDISON SEMICONDUCTOR LTD (UEN201334164H)·Filed 2012·Granted May 30, 2017·4 cites·24 claims
- 0474US10062158B2Wafer nanotopography metrology for lithography based on thickness mapsSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2016·Granted Aug 28, 2018·2 cites·18 claims
- 0571US12270768B2Method of processing a cleaved semiconductor waferGLOBALWAFERS CO LTD·Filed 2021·Granted Apr 8, 2025·0 cites·17 claims
- 0671US11921054B2Cleaved semiconductor wafer camera systemGLOBALWAFERS CO LTD·Filed 2021·Granted Mar 5, 2024·0 cites·19 claims
- 0769US12019031B2Cleaved semiconductor wafer imaging systemGLOBALWAFERS CO LTD·Filed 2021·Granted Jun 25, 2024·0 cites·20 claims
- 0863US9317912B2Symmetry based air pocket detection methods and systemsMEMC ELECTRONIC MATERIALS·Filed 2012·Granted Apr 19, 2016·1 cites·20 claims
- 0960US10030964B2Systems and methods for performing phase shift interferometry while a wafer is vibratingSUNEDISON SEMICONDUCTOR LTD·Filed 2015·Granted Jul 24, 2018·1 cites·20 claims
- 1056US10636136B2Wafer nanotopography metrology for lithography based on thickness mapsGLOBALWAFERS CO LTD·Filed 2018·Granted Apr 28, 2020·0 cites·29 claims
- 1153US10910280B2Methods for separating bonded wafer structuresGLOBALWAFERS CO LTD·Filed 2019·Granted Feb 2, 2021·0 cites·19 claims
- 1241US2006005413A1Work piece positioning apparatusSINHA JAYDEEP K·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →