Inventor · disambiguated record
Kazutoshi Izumi
Also filed as: IZUMI KAZUTOSHI
12 granted patents·9 pending applications·378 citations·filing 1997–2010
89Inventor score
Files withFUJITSU LTD10FUJITSU SEMICONDUCTOR LTD5FUJITSU MICROELECTRONICS LTD3IZUMI KAZUTOSHI2DOTE AKI1
Top patents by PatentIndex Score
21 records- 0193US5976973AMethod of making a semiconductor device having planarized insulating layerFUJITSU LTD·Filed 1997·Granted Nov 2, 1999·319 cites·22 claims
- 0288US7518173B2Semiconductor device having ferroelectric capacitor and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Apr 14, 2009·19 cites·6 claims
- 0384US8183109B2Semiconductor device and method of manufacturing the sameIZUMI KAZUTOSHI·Filed 2010·Granted May 22, 2012·18 cites·14 claims
- 0472US7781812B2Semiconductor device for non-volatile memory and method of manufacturing the sameFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Aug 24, 2010·6 cites·11 claims
- 0571US7803640B2Semiconductor device and semiconductor productFUJITSU SEMICONDUCTOR LTD·Filed 2007·Granted Sep 28, 2010·5 cites·15 claims
- 0669US8324671B2Semiconductor device and method of manufacturing the sameDOTE AKI·Filed 2008·Granted Dec 4, 2012·6 cites·15 claims
- 0769US7364964B2Method of fabricating an interconnection layer above a ferroelectric capacitorFUJITSU LTD·Filed 2005·Granted Apr 29, 2008·3 cites·12 claims
- 0864US7777262B2Semiconductor device having interlayer insulating film covered with hydrogen diffusion barrier film and its manufacture methodFUJITSU SEMICONDUCTOR LTD·Filed 2005·Granted Aug 17, 2010·2 cites·7 claims
- 0956US7960227B2Manufacturing method of semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted Jun 14, 2011·0 cites·10 claims
- 1054US2009160023A1Semiconductor device and manufacturing method thereofFUJITSU MICROELECTRONICS LTD·Filed 2009·Application pending·0 cites
- 1149US2007232016A1Semiconductor device and manufacturing method of the sameFUJITSU LTD·Filed 2006·Application pending·0 cites
- 1248US8507965B2Semiconductor device and manufacturing method thereofIZUMI KAZUTOSHI·Filed 2010·Granted Aug 13, 2013·0 cites·5 claims
- 1347US2005212020A1Semiconductor device and manufacturing method thereofFUJITSU LTD·Filed 2005·Application pending·0 cites
- 1445US7795048B2Method of measuring film thickness and method of manufacturing semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2006·Granted Sep 14, 2010·0 cites·7 claims
- 1545US2008169571A1Semiconductor device and method for manufacturing the sameFUJITSU LTD·Filed 2008·Application pending·0 cites
- 1644US2006261387A1Semiconductor device and manufacturing method thereofFUJITSU LTD·Filed 2006·Application pending·0 cites
- 1743US7728370B2Semiconductor device and manufacturing method of the sameFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Jun 1, 2010·0 cites·4 claims
- 1842US2010261296A1Semiconductor device and manufacturing method thereofFUJITSU LTD·Filed 2010·Application pending·0 cites
- 1941US2007173011A1Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2006·Application pending·0 cites
- 2039US2007224706A1Method of producing semiconductor device and semiconductor deviceFUJITSU LTD·Filed 2006·Application pending·0 cites
- 2139US2007042541A1Semiconductor device and its manufacture methodFUJITSU LTD·Filed 2006·Application pending·0 cites
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