Assignee
FUJITSU MICROELECTRONICS LTD
JP·458 granted patents·77 pending applications·3,326 citations·filing 2001–2010
Top patents by PatentIndex Score
535 records- 0198US7667227B2Semiconductor device and fabrication method thereofFUJITSU MICROELECTRONICS LTD·Filed 2009·Granted Feb 23, 2010·77 cites·4 claims
- 0298US7605041B2Semiconductor device and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Oct 20, 2009·122 cites·6 claims
- 0397US7645665B2Semiconductor device having shallow b-doped region and its manufactureFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jan 12, 2010·125 cites·7 claims
- 0497US7500211B2Unit cell of semiconductor integrated circuit and wiring method and wiring program using unit cellFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Mar 3, 2009·132 cites·12 claims
- 0596US7583851B2Apparatus and method for processing an imageFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Sep 1, 2009·59 cites·14 claims
- 0696US7507666B2Manufacture method for semiconductor device having concave portions filled with conductor containing Cu as its main compositionFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Mar 24, 2009·49 cites·7 claims
- 0795US7671417B2Memory cell array, method of producing the same, and semiconductor memory device using the sameFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Mar 2, 2010·45 cites·14 claims
- 0895US7649232B2P-channel MOS transistor, semiconductor integrated circuit device and fabrication process thereofFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Jan 19, 2010·37 cites·13 claims
- 0995US7609039B2Controller and control method for DC-DC converterFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Oct 27, 2009·55 cites·17 claims
- 1095US7592241B2Semiconductor device having well with peak impurity concentrations and method for fabricating the sameFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Sep 22, 2009·112 cites·16 claims
- 1194US7598005B2Photomask and manufacturing method of the same, and pattern forming methodFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 6, 2009·20 cites·9 claims
- 1294US7583553B2Semiconductor memory and refresh cycle control methodFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Sep 1, 2009·41 cites·17 claims
- 1393US7660184B2Semiconductor memory for disconnecting a bit line from a sense amplifier in a standby period and memory system including the semiconductor memoryFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Feb 9, 2010·26 cites·29 claims
- 1493US7598541B2Semiconductor device comprising transistor pair isolated by trench isolationFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Oct 6, 2009·114 cites·12 claims
- 1592US7601576B2Method for fabricating semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 13, 2009·24 cites·18 claims
- 1692US7550844B2Semiconductor device and manufacturing method thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jun 23, 2009·18 cites·9 claims
- 1791US7579617B2Semiconductor device and production method thereofFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Aug 25, 2009·18 cites·11 claims
- 1891US7533192B2Task scheduling method in case of simultaneous transfer of compressed data and non-compressed dataFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted May 12, 2009·17 cites·13 claims
- 1991US7507659B2Fabrication process of a semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Mar 24, 2009·23 cites·12 claims
- 2090US7611984B2Manufacture method for semiconductor device having improved copper diffusion preventive function of plugs and wirings made of copper or copper alloyFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Nov 3, 2009·17 cites·9 claims
- 2190US7564111B2Imaging apparatusFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Jul 21, 2009·15 cites·15 claims
- 2290US7514355B2Multilayer interconnection structure and method for forming the sameFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Apr 7, 2009·47 cites·3 claims
- 2389US7692315B2Semiconductor device and method for manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Apr 6, 2010·15 cites·21 claims
- 2489US7633107B2Semiconductor device and manufacturing method thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 15, 2009·16 cites·6 claims
- 2589US7626616B2Automatic gain control circuit with exposure control circuitFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 1, 2009·14 cites·14 claims
- 2689US7626234B2Semiconductor device with shallow trench isolation and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 1, 2009·13 cites·9 claims
- 2789US7598557B2Semiconductor device and method for fabricating a semicondutor device including first and second hydrogen diffusion preventing filmsFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 6, 2009·13 cites·24 claims
- 2889US7554305B2Linear regulator with discharging gate driverFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Jun 30, 2009·46 cites·6 claims
- 2989US7511331B2Semiconductor device having side wall spacersFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 31, 2009·12 cites·7 claims
- 3088US7688661B2Semiconductor memory device, and method of controlling the sameFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 30, 2010·8 cites·25 claims
- 3188US7642551B2Wafer-level package having test terminalFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Jan 5, 2010·11 cites·1 claims
- 3288US7592873B2Low noise amplifierFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Sep 22, 2009·16 cites·19 claims
- 3388US7518173B2Semiconductor device having ferroelectric capacitor and its manufacture methodFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Apr 14, 2009·19 cites·6 claims
- 3487US7734973B2Testing apparatus and testing method for an integrated circuit, and integrated circuitFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jun 8, 2010·17 cites·4 claims
- 3587US7683362B2Semiconductor device and production method thereofFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Mar 23, 2010·13 cites·19 claims
- 3687US7580963B2Semiconductor device having an arithmetic unit of a reconfigurable circuit configuration in accordance with stored configuration data and a memory storing fixed value data to be supplied to the arithmetic unit, requiring no data area for storing fixed value data to be set in a configuration memoryFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Aug 25, 2009·20 cites·10 claims
- 3787US7580303B2Semiconductor memory having a precharge voltage generation circuit for reducing power consumptionFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Aug 25, 2009·21 cites·20 claims
- 3887US7557846B2Solid-state image sensor including common transistors between pixelsFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Jul 7, 2009·32 cites·56 claims
- 3986US7679411B2Reset signal generation circuitFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 16, 2010·18 cites·12 claims
- 4086US7626215B2Semiconductor device and method of manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 1, 2009·9 cites·12 claims
- 4186US7616250B2Image capturing deviceFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Nov 10, 2009·44 cites·11 claims
- 4286US7592657B2Semiconductor device and method of manufacturing the sameFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Sep 22, 2009·8 cites·10 claims
- 4386US7572172B2Polishing machine, workpiece supporting table pad, polishing method and manufacturing method of semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Aug 11, 2009·18 cites·4 claims
- 4485US7719097B2Semiconductor device having transparent memberFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted May 18, 2010·11 cites·14 claims
- 4585US7631200B2Host apparatus, device, and method for controlling communication systemFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Dec 8, 2009·16 cites·6 claims
- 4685US7598007B2Pattern transfer mask, focus variation measuring method and apparatus, and semiconductor device manufacturing methodFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Oct 6, 2009·7 cites·6 claims
- 4785US7598162B2Method of manufacturing semiconductor deviceFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Oct 6, 2009·11 cites·22 claims
- 4885US7592655B2MOS image sensorFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Sep 22, 2009·17 cites·15 claims
- 4985US7592214B2Method of manufacturing a semiconductor device including epitaxially growing semiconductor epitaxial layers on a surface of semiconductor substrateFUJITSU MICROELECTRONICS LTD·Filed 2007·Granted Sep 22, 2009·10 cites·9 claims
- 5085US7586185B2Semiconductor device having a functional surfaceFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Sep 8, 2009·12 cites·11 claims
Showing the top 50 of 535 patent records by PatentIndex Score.
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