Inventor · disambiguated record
Igor Petrov
Also filed as: PETROV IGOR · PETROV IGOR LEONIDOVICH
20 granted patents·3 pending applications·223 citations·filing 2000–2021
95Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD13APPLIED MATERIALS INC3PETROV IGOR LEONIDOVICH2EMELYANOV PAVEL1FROLOV ANTHONY1
Top patents by PatentIndex Score
23 records- 0188US7233008B1Multiple electrode lens arrangement and a method for inspecting an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Jun 19, 2007·12 cites·22 claims
- 0287US7067807B2Charged particle beam column and method of its operationAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Jun 27, 2006·28 cites·33 claims
- 0386US6674075B2Charged particle beam apparatus and method for inspecting samplesAPPLIED MATERIALS INC·Filed 2002·Granted Jan 6, 2004·28 cites·43 claims
- 0484US8389584B2Nanodiamond material, method and device for purifying and modifying a nanodiamondPETROV IGOR LEONIDOVICH·Filed 2009·Granted Mar 5, 2013·14 cites·26 claims
- 0583US6380546B1Focusing assembly and method for a charged particle beam columnAPPLIED MATERIALS INC·Filed 2000·Granted Apr 30, 2002·33 cites·30 claims
- 0682US10007537B2Method for targeted resource virtualization in containersPARALLELS·Filed 2016·Granted Jun 26, 2018·4 cites·20 claims
- 0782US9348622B2Method for targeted resource virtualization in containersEMELYANOV PAVEL·Filed 2014·Granted May 24, 2016·6 cites·17 claims
- 0882US6897442B2Objective lens arrangement for use in a charged particle beam columnAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted May 24, 2005·17 cites·21 claims
- 0981US7223974B2Charged particle beam column and method for directing a charged particle beamAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted May 29, 2007·18 cites·34 claims
- 1081US7170068B2Method and system for discharging a sampleAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Jan 30, 2007·7 cites·19 claims
- 1181US7034297B2Method and system for use in the monitoring of samples with a charged particle beamAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Apr 25, 2006·22 cites·32 claims
- 1276US6825475B2Deflection method and system for use in a charged particle beam columnAPPLIED MATERIALS ISRAEL LTD·Filed 2002·Granted Nov 30, 2004·13 cites·31 claims
- 1369US7112803B2Beam directing system and method for use in a charged particle beam columnAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Sep 26, 2006·8 cites·28 claims
- 1468US7525091B2Charged particle beam system and a method for inspecting a sampleAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Apr 28, 2009·2 cites·23 claims
- 1567US7317606B2Particle trap for electrostatic chuckAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Jan 8, 2008·4 cites·8 claims
- 1665US10074513B2Multi mode systems with retractable detectorsAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Sep 11, 2018·1 cites·16 claims
- 1762US11626267B2Back-scatter electrons (BSE) imaging with a SEM in tilted mode using cap bias voltageAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Apr 11, 2023·0 cites·20 claims
- 1862US7800062B2Method and system for the examination of specimenAPPLIED MATERIALS INC·Filed 2004·Granted Sep 21, 2010·6 cites·17 claims
- 1952US2013214155A1Charged particle beam device with dynamic focus and method of operating thereofWINKLER DIETER·Filed 2012·Application pending·0 cites
- 2046US9431210B2Charged particle beam device with dynamic focus and method of operating thereofICT INTERGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK GMBH·Filed 2015·Granted Aug 30, 2016·0 cites·11 claims
- 2145US11264198B2Objective lens arrangementAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 1, 2022·0 cites·19 claims
- 2232US2013121909A1Nanodiamond material, method and device for purifying and modifying a nanodiamondPETROV IGOR LEONIDOVICH·Filed 2012·Application pending·0 cites
- 2330US2018075694A1System and method for providing location-based gaming experienceFROLOV ANTHONY·Filed 2016·Application pending·0 cites
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