Inventor · disambiguated record
Hirotami Koike
Also filed as: KOIKE HIROTAMI
15 granted patents·4 pending applications·255 citations·filing 1975–2009
94Inventor score
Top patents by PatentIndex Score
19 records- 0193US7329867B2Electron beam system and electron beam measuring and observing methodsTOPCON CORP·Filed 2006·Granted Feb 12, 2008·20 cites·10 claims
- 0293US6852974B2Electron beam device and method for stereoscopic measurementsTOPCON CORP·Filed 2002·Granted Feb 8, 2005·40 cites·19 claims
- 0386US7151258B2Electron beam system and electron beam measuring and observing methodsTOPCON CORP·Filed 2004·Granted Dec 19, 2006·22 cites·18 claims
- 0483US6642520B2Scanning electron microscopeTOPCON CORP·Filed 2002·Granted Nov 4, 2003·21 cites·6 claims
- 0583US5893999AUltrafine inorganic phosphor, specifically binding material labeled with this phosphor, and detection method using this specific binding materialTOSHIBA KK·Filed 1994·Granted Apr 13, 1999·45 cites·3 claims
- 0683US4426577AElectron microscope of scanning typeINT PRECISION INC·Filed 1981·Granted Jan 17, 1984·26 cites·5 claims
- 0777US7592604B2Charged particle beam apparatusTOPCON CORP·Filed 2006·Granted Sep 22, 2009·4 cites·17 claims
- 0875US7902504B2Charged particle beam reflector device and electron microscopeTOPCON CORP·Filed 2008·Granted Mar 8, 2011·3 cites·12 claims
- 0973US6201241B1Organic substance analyzerTOPCON CORP·Filed 1999·Granted Mar 13, 2001·26 cites·4 claims
- 1069US6717144B2Scanning electron microscope systemTOPCON CORP·Filed 2002·Granted Apr 6, 2004·8 cites·5 claims
- 1167US5393976AApparatus for displaying a sample imageTOPCON CORP·Filed 1993·Granted Feb 28, 1995·19 cites·6 claims
- 1256US2009294665A1Scanning electron microscope and similar apparatusKOIKE HIROTAMI·Filed 2009·Application pending·0 cites
- 1351US2008121799A1Sample analyzing apparatusKANNO CHOHEI·Filed 2007·Application pending·0 cites
- 1450US4458151AElectron microscope of a scanning typeKOIKE HIROTAMI·Filed 1982·Granted Jul 3, 1984·8 cites·3 claims
- 1549US6894277B2Scanning electron microscopeTOPCON CORP·Filed 2003·Granted May 17, 2005·1 cites·17 claims
- 1647US3978338AIllumination system in a scanning electron microscopeJEOL LTD·Filed 1975·Granted Aug 31, 1976·6 cites·2 claims
- 1747US2005279937A1Scanning electron microscope and similar apparatusKOIKE HIROTAMI·Filed 2005·Application pending·0 cites
- 1846US2005040332A1Electron beam device and method for stereoscopic measurementsTOPCON CORP·Filed 2004·Application pending·0 cites
- 1943US5382796AApparatus for morphological observation of a sampleTOPCON CORP·Filed 1993·Granted Jan 17, 1995·6 cites·3 claims
Join the waitlist — get patent alerts
Get an alert when Hirotami Koike files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →