Inventor · disambiguated record
Yoshihiko Naito
Also filed as: NAITO YOSHIHIKO
22 granted patents·4 pending applications·175 citations·filing 1995–2023
95Inventor score
Top patents by PatentIndex Score
26 records- 0197US8497476B2Inspection deviceHATAKEYAMA MASAHIRO·Filed 2012·Granted Jul 30, 2013·42 cites·10 claims
- 0287US9749725B2Wireless microphone with antenna thereinAUDIO TECHNICA KK·Filed 2015·Granted Aug 29, 2017·7 cites·6 claims
- 0387US8624182B2Electro-optical inspection apparatus and method with dust or particle collection functionWATANABE KENJI·Filed 2011·Granted Jan 7, 2014·7 cites·12 claims
- 0486US10157722B2Inspection deviceEBARA CORP·Filed 2016·Granted Dec 18, 2018·3 cites·15 claims
- 0586US9966227B2Specimen observation method and device using secondary emission electron and mirror electron detectionEBARA CORP·Filed 2014·Granted May 8, 2018·5 cites·16 claims
- 0681US8937283B2Specimen observation method and device using secondary emission electron and mirror electron detectionHATAKEYAMA MASAHIRO·Filed 2009·Granted Jan 20, 2015·6 cites·6 claims
- 0781US8497940B2High density wireless systemGREEN BOB·Filed 2011·Granted Jul 30, 2013·13 cites·20 claims
- 0878US8859984B2Method and apparatus for inspecting sample surfaceNOJI NOBUHARU·Filed 2013·Granted Oct 14, 2014·2 cites·12 claims
- 0978US8525127B2Method and apparatus for inspecting sample surfaceNOJI NOBUHARU·Filed 2012·Granted Sep 3, 2013·3 cites·10 claims
- 1073US7952071B2Apparatus and method for inspecting sample surfaceEBARA CORP·Filed 2007·Granted May 31, 2011·3 cites·4 claims
- 1173US7829853B2Sample surface observation methodEBARA CORP·Filed 2008·Granted Nov 9, 2010·3 cites·10 claims
- 1271US8274047B2Substrate surface inspection method and inspection apparatusNAITO YOSHIHIKO·Filed 2009·Granted Sep 25, 2012·4 cites·8 claims
- 1366US5743965ADisk coating systemORIGIN ELECTRIC·Filed 1996·Granted Apr 28, 1998·41 cites·17 claims
- 1463US6614037B2Electron beam irradiating apparatusEBARA CORP·Filed 2001·Granted Sep 2, 2003·8 cites·20 claims
- 1561US2023265550A1Thermal spraying apparatus, method of detecting molten adhered substance in thermal spraying apparatus, and electrode for thermal spraying apparatusEBARA CORP·Filed 2023·Application pending·0 cites
- 1660US9194826B2Electron beam apparatus and sample observation method using the sameKAGA TORU·Filed 2008·Granted Nov 24, 2015·1 cites·10 claims
- 1760US2014014848A1Inspection deviceEBARA CORP·Filed 2013·Application pending·0 cites
- 1858US2009050802A1Method and apparatus for inspecting sample surfaceEBARA CORP·Filed 2007·Application pending·0 cites
- 1957US6960270B2Optical disk producing device and producing methodORIGIN ELECTRIC·Filed 2002·Granted Nov 1, 2005·3 cites·19 claims
- 2056US9105444B2Electro-optical inspection apparatus and method with dust or particle collection functionEBARA CORP·Filed 2013·Granted Aug 11, 2015·0 cites·8 claims
- 2152US6329769B1Electron beam irradiation deviceEBARA CORP·Filed 1999·Granted Dec 11, 2001·18 cites·4 claims
- 2243US2009152595A1Semiconductor devices and method of testing sameEBARA CORP·Filed 2006·Application pending·0 cites
- 2342US10370880B2Locking device for opening and closing lidAUDIO TECHNICA KK·Filed 2015·Granted Aug 6, 2019·0 cites·2 claims
- 2439US5565680AHigh frequency mass spectrometerEBARA CORP·Filed 1995·Granted Oct 15, 1996·5 cites·10 claims
- 2537US9615157B2MicrophoneAUDIO TECHNICA KK·Filed 2015·Granted Apr 4, 2017·0 cites·5 claims
- 2629US5721428AMagnetic field type mass spectrometerEBARA CORP·Filed 1995·Granted Feb 24, 1998·1 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →