Inventor · disambiguated record
Satoru Asai
Also filed as: ASAI SATORU
34 granted patents·12 pending applications·640 citations·filing 1991–2024
97Inventor score
Top patents by PatentIndex Score
46 records- 0197US7971160B2Creating method of photomask pattern data, photomask created by using the photomask pattern data, and manufacturing method of semiconductor apparatus using the photomaskFUJITSU SEMICONDUCTOR LTD·Filed 2008·Granted Jun 28, 2011·164 cites·15 claims
- 0296US6499946B1Steam turbine rotor and manufacturing method thereofTOSHIBA KK·Filed 2000·Granted Dec 31, 2002·74 cites·20 claims
- 0394US6107708ABrushless motorASMO CO LTD·Filed 1999·Granted Aug 22, 2000·107 cites·19 claims
- 0491US5465220AOptical exposure methodFUJITSU LTD·Filed 1993·Granted Nov 7, 1995·55 cites·6 claims
- 0579US6420094B1Optical exposure methodFUJITSU LTD·Filed 2000·Granted Jul 16, 2002·13 cites·2 claims
- 0678US9217731B2Welding inspection method and apparatus thereofYAMAMOTO SETSU·Filed 2011·Granted Dec 22, 2015·4 cites·18 claims
- 0778US7601471B2Apparatus and method for correcting pattern dimension and photo mask and test photo maskFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 13, 2009·5 cites·18 claims
- 0878US7455570B2Large part polishing apparatus and polishing methodTOSHIBA KK·Filed 2005·Granted Nov 25, 2008·6 cites·2 claims
- 0978US6045976AOptical exposure methodFUJITSU LTD·Filed 1996·Granted Apr 4, 2000·29 cites·4 claims
- 1074US7144303B2Method of polishing a large part and abrasive for use in the methodTOSHIBA KK·Filed 2005·Granted Dec 5, 2006·7 cites·7 claims
- 1171US6412713B2Fuel injection apparatusDENSO CORP·Filed 2000·Granted Jul 2, 2002·14 cites·18 claims
- 1270US7371489B2Photomask, method for detecting pattern defect of the same, and method for making pattern using the sameFUJITSU LTD·Filed 2006·Granted May 13, 2008·2 cites·20 claims
- 1367US5607821AOptical exposure methodFUJITSU LTD·Filed 1995·Granted Mar 4, 1997·18 cites·15 claims
- 1466US6232758B1Load drive control apparatusDENSO CORP·Filed 1999·Granted May 15, 2001·21 cites·13 claims
- 1564US5818078ASemiconductor device having a regrowth crystal regionFUJITSU LTD·Filed 1995·Granted Oct 6, 1998·20 cites·17 claims
- 1663US7604912B2Local flare correctionFUJITSU MICROELECTRONICS LTD·Filed 2005·Granted Oct 20, 2009·1 cites·20 claims
- 1763US2024418631A1Welding inspection methodDAIHEN CORP·Filed 2024·Application pending·0 cites
- 1862US2023330784A1Weld inspection device, welding system, and weld inspection methodUNIV OSAKA·Filed 2022·Application pending·0 cites
- 1962US2025003927A1Welding inspection device and welding inspection methodDAIHEN CORP·Filed 2024·Application pending·0 cites
- 2059US5561010APhase shift optical mask and method of correcting defects in optical maskFUJITSU LTD·Filed 1995·Granted Oct 1, 1996·18 cites·14 claims
- 2158US7074524B2Photomask, method for detecting pattern defect of the same, and method for making pattern using the sameFUJITSU LTD·Filed 2003·Granted Jul 11, 2006·4 cites·11 claims
- 2257US8105023B2Steam turbineIKEDA KAZUTAKA·Filed 2008·Granted Jan 31, 2012·7 cites·9 claims
- 2357US7577556B2Method and equipment for simulationFUJITSU MICROELECTRONICS LTD·Filed 2004·Granted Aug 18, 2009·5 cites·5 claims
- 2457US5418093AProjection exposure method and an optical mask for use in projection exposureFUJITSU LTD·Filed 1994·Granted May 23, 1995·14 cites·15 claims
- 2554US7732107B2Mask pattern correction device, method of correcting mask pattern, light exposure correction device, and method of correcting light exposureFUJITSU SEMICONDUCTOR LTD·Filed 2004·Granted Jun 8, 2010·3 cites·1 claims
- 2654US5424153AOptical mask using phase shift and method of producing the sameFUJITSU LTD·Filed 1993·Granted Jun 13, 1995·12 cites·27 claims
- 2751US5368963APhotomask and method of fabricating the sameFUJITSU LTD·Filed 1992·Granted Nov 29, 1994·10 cites·11 claims
- 2850US8553198B2Mask pattern correction device, method of correcting mask pattern, light exposure correction device, and method of correcting light exposureYAO TERUYOSHI·Filed 2012·Granted Oct 8, 2013·0 cites·2 claims
- 2950US5876877APatterned mask having a transparent etching stopper layerFUJITSU LTD·Filed 1991·Granted Mar 2, 1999·10 cites·15 claims
- 3049US2009308847A1Erosion prevention method and member with erosion preventive sectionTOSHIBA KK·Filed 2007·Application pending·0 cites
- 3149US2007147990A1Sealing deviceTOSHIBA KK·Filed 2006·Application pending·0 cites
- 3246US2007013471A1Superconducting coil, method for manufacturing thereof and welding deviceTOSHIBA KK·Filed 2006·Application pending·0 cites
- 3345US8227153B2Mask pattern correction device, method of correcting mask pattern, light exposure correction device, and method of correcting light exposureYAO TERUYOSHI·Filed 2010·Granted Jul 24, 2012·0 cites·1 claims
- 3444US2007275331A1Pattern forming method and method for manufacturing semiconductor deviceFUJITSU LTD·Filed 2006·Application pending·0 cites
- 3543US5428478AOptical mask and exposure method using the optical maskFUJITSU LTD·Filed 1993·Granted Jun 27, 1995·6 cites·16 claims
- 3641US2015176926A1Heat exchanger and manufacturing method thereofTOSHIBA KK·Filed 2015·Application pending·0 cites
- 3740US8409786B2Pattern forming method and method for manufacturing semiconductor deviceYAMAMOTO TOMOHIKO·Filed 2007·Granted Apr 2, 2013·0 cites·15 claims
- 3840US2012094144A1Build-up welding method and structural materialKAMIMURA KENJI·Filed 2011·Application pending·0 cites
- 3939US2005095513A1PhotomaskFUJITSU LTD·Filed 2004·Application pending·0 cites
- 4038US10189105B2Shielding gas for mag welding, mag welding method, and welded structureKAMIJO YASUHITO·Filed 2011·Granted Jan 29, 2019·0 cites·9 claims
- 4138US9841279B2Apparatus and method for quantitative evaluation of braze bonding length with use of radiationTOSHIBA KK·Filed 2016·Granted Dec 12, 2017·0 cites·16 claims
- 4237US9309773B2Steam turbine and steam turbine bladeSAYANO AKIO·Filed 2010·Granted Apr 12, 2016·0 cites·15 claims
- 4337US5979779AAir conditioning system for vehicleDENSO CORP·Filed 1998·Granted Nov 9, 1999·8 cites·6 claims
- 4436US2011284508A1Welding system and welding methodMIURA TAKAHIRO·Filed 2011·Application pending·0 cites
- 4534US5994004ALevenson type phase shift photomask and manufacture method of semiconductor device using such photomaskFUJITSU LTD·Filed 1998·Granted Nov 30, 1999·3 cites·13 claims
- 4634US2015244225A1Method of manufacturing rotor coil and rotary electrical machineTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →