Inventor · disambiguated record
Chiang-Lin Shih
Also filed as: SHIH CHIANG-LIN
46 granted patents·14 pending applications·77 citations·filing 2004–2025
96Inventor score
Top patents by PatentIndex Score
60 records- 0198US11374009B2Integrated circuit device and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Jun 28, 2022·4 cites·6 claims
- 0297US11315928B2Semiconductor structure with buried power line and buried signal line and method for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2020·Granted Apr 26, 2022·4 cites·12 claims
- 0395US9530663B1Method for forming a patternNANYA TECHNOLOGY CORP·Filed 2015·Granted Dec 27, 2016·18 cites·11 claims
- 0494US11876077B2Semiconductor device and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2021·Granted Jan 16, 2024·3 cites·9 claims
- 0592US12457733B2Semiconductor device having bonding structure and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2022·Granted Oct 28, 2025·1 cites·15 claims
- 0691US11842979B2Semiconductor device and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2021·Granted Dec 12, 2023·2 cites·5 claims
- 0790US11264391B1Semiconductor structure and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Mar 1, 2022·2 cites·8 claims
- 0886US10170328B1Semiconductor pattern having semiconductor structures of different lengthsNANYA TECHNOLOGY CORP·Filed 2017·Granted Jan 1, 2019·3 cites·9 claims
- 0983US7892712B2Exposure methodNANYA TECHNOLOGY CORP·Filed 2008·Granted Feb 22, 2011·11 cites·14 claims
- 1083US7419882B2Alignment mark and alignment method for the fabrication of trench-capacitor dram devicesNANYA TECHNOLOGY CORP·Filed 2005·Granted Sep 2, 2008·13 cites·5 claims
- 1181US10262862B1Method of forming fine interconnection for semiconductor devicesNANYA TECHNOLOGY CORP·Filed 2018·Granted Apr 16, 2019·3 cites·18 claims
- 1280US10090154B1Method for preparing a semiconductor structure having second line patterns and third line patterns formed over first line patternsNANYA TECHNOLOGY CORP·Filed 2017·Granted Oct 2, 2018·2 cites·9 claims
- 1378US12295137B2Method of manufacturing tsemiconductor device having bonding structureNANYA TECHNOLOGY CORP·Filed 2023·Granted May 6, 2025·0 cites·13 claims
- 1478US2025234511A1Method of manufacturing semiconductor device having bonding structureNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 1577US10811382B1Method of manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2019·Granted Oct 20, 2020·2 cites·15 claims
- 1676US12278211B2Manufacturing method of semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2023·Granted Apr 15, 2025·0 cites·7 claims
- 1776US2025006551A1Method for fabricating semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 1876US2025096048A1Test structure for use in dynamic random access memory and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2024·Application pending·0 cites
- 1975US2024040776A1Manufacturing method of semiconductor structureNANYA TECHNOLOGY CORP·Filed 2023·Application pending·0 cites
- 2072US7723181B2Overlay alignment mark and alignment method for the fabrication of trench-capacitor dram devicesNANYA TECHNOLOGY CORP·Filed 2006·Granted May 25, 2010·6 cites·12 claims
- 2171US12501611B2Integrated circuit deviceNANYA TECHNOLOGY CORP·Filed 2022·Granted Dec 16, 2025·0 cites·20 claims
- 2271US11950408B2Semiconductor structure and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2022·Granted Apr 2, 2024·0 cites·9 claims
- 2370US12198991B2Test structure for use in dynamic random access memory and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2022·Granted Jan 14, 2025·0 cites·20 claims
- 2470US11647623B2Method for manufacturing semiconductor structure with buried power line and buried signal lineNANYA TECHNOLOGY CORP·Filed 2021·Granted May 9, 2023·0 cites·8 claims
- 2570US11189545B2Semiconductor device and method for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2019·Granted Nov 30, 2021·1 cites·14 claims
- 2670US10115594B1Method of forming fine island patterns of semiconductor devicesNANYA TECHNOLOGY CORP·Filed 2017·Granted Oct 30, 2018·1 cites·15 claims
- 2768US11699635B2Method for manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2021·Granted Jul 11, 2023·0 cites·6 claims
- 2868US11574911B2Method for fabricating semiconductor device with protruding contactNANYA TECHNOLOGY CORP·Filed 2021·Granted Feb 7, 2023·0 cites·18 claims
- 2968US11217560B2Die assembly and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2019·Granted Jan 4, 2022·1 cites·14 claims
- 3067US12266564B2Semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2022·Granted Apr 1, 2025·0 cites·10 claims
- 3167US11776924B2Method of manufacturing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2021·Granted Oct 3, 2023·0 cites·6 claims
- 3266US11658070B2Method of forming semiconductor structureNANYA TECHNOLOGY CORP·Filed 2021·Granted May 23, 2023·0 cites·16 claims
- 3365US11469231B2Semiconductor device with protruding contact and method for fabricating the sameNANYA TECHNOLOGY CORP·Filed 2020·Granted Oct 11, 2022·0 cites·16 claims
- 3462US11205607B2Semiconductor structure and method of manufacturing thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Dec 21, 2021·0 cites·5 claims
- 3562US2024315012A1Semiconductor device having trench capacitors formed on channel structures and methods for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2023·Application pending·0 cites
- 3662US2022059435A1Semiconductor structure and method of manufacturing thereofNANYA TECHNOLOGY CORP·Filed 2021·Application pending·0 cites
- 3760US2022084884A1Semiconductor structure and method of forming the sameNANYA TECHNOLOGY CORP·Filed 2020·Application pending·0 cites
- 3859US11322216B1Fuse array structureNANYA TECHNOLOGY CORP·Filed 2021·Granted May 3, 2022·0 cites·13 claims
- 3958US10332749B2Method for preparing a semiconductor pattern having semiconductor structure of different lengthsNANYA TECHNOLOGY CORP·Filed 2018·Granted Jun 25, 2019·0 cites·11 claims
- 4057US12453084B2Method for manufacturing a semiconductor memoryNANYA TECHNOLOGY CORP·Filed 2022·Granted Oct 21, 2025·0 cites·19 claims
- 4157US11270962B2Semiconductor device and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2019·Granted Mar 8, 2022·0 cites·6 claims
- 4256US12507402B2Memory with a contact between a data storage device and a data processing deviceNANYA TECHNOLOGY CORP·Filed 2022·Granted Dec 23, 2025·0 cites·17 claims
- 4355US11569228B2Semiconductor structure and method of manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2021·Granted Jan 31, 2023·0 cites·19 claims
- 4455US11289492B1Semiconductor structure and method of manufacturing thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Mar 29, 2022·0 cites·7 claims
- 4554US10854545B1Anti-fuse structureNANYA TECHNOLOGY CORP·Filed 2019·Granted Dec 1, 2020·0 cites·16 claims
- 4651US2019027364A1Semiconductor structure and method for preparing the sameNANYA TECHNOLOGY CORP·Filed 2017·Application pending·0 cites
- 4748US7998660B2Exposure methodNANYA TECHNOLOGY CORP·Filed 2008·Granted Aug 16, 2011·0 cites·19 claims
- 4847US2010097596A1Scanning exposure methodNANYA TECHNOLOGY CORP·Filed 2009·Application pending·0 cites
- 4946US10204783B1Method of forming fine island patterns of semiconductor devicesNANYA TECHNOLOGY CORP·Filed 2017·Granted Feb 12, 2019·0 cites·16 claims
- 5046US2009290134A1Exposure methodSHIH CHIANG-LIN·Filed 2008·Application pending·0 cites
Showing the top 50 of 60 patent records by PatentIndex Score.
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