Inventor · disambiguated record
Jamie M. Sullivan
Also filed as: SULLIVAN JAMIE · SULLIVAN JAMIE M · SULLIVAN JAMIE MICHAEL
25 granted patents·276 citations·filing 2002–2024
96Inventor score
Top patents by PatentIndex Score
25 records- 0198US11747323B2Methods and systems for analyte detection and analysisULTIMA GENOMICS INC·Filed 2022·Granted Sep 5, 2023·7 cites·20 claims
- 0298US11499962B2Methods and systems for analyte detection and analysisULTIMA GENOMICS INC·Filed 2020·Granted Nov 15, 2022·11 cites·29 claims
- 0398US10267790B1Systems for biological sample processing and analysisULTIMA GENOMICS INC·Filed 2018·Granted Apr 23, 2019·20 cites·50 claims
- 0496US12188924B2Methods and systems for analyte detection and analysisULTIMA GENOMICS INC·Filed 2023·Granted Jan 7, 2025·3 cites·20 claims
- 0596US10344328B2Methods for biological sample processing and analysisULTIMA GENOMICS INC·Filed 2018·Granted Jul 9, 2019·28 cites·56 claims
- 0696US10273528B1Methods and systems for analyte detection and analysisULTIMA GENOMICS INC·Filed 2018·Granted Apr 30, 2019·22 cites·48 claims
- 0789US9395340B2Interleaved acousto-optical device scanning for suppression of optical crosstalkKLA TENCOR CORP·Filed 2013·Granted Jul 19, 2016·8 cites·26 claims
- 0888US6833913B1Apparatus and methods for optically inspecting a sample for anomaliesKLA TENCOR TECH CORP·Filed 2002·Granted Dec 21, 2004·44 cites·50 claims
- 0987US9546962B2Multi-spot scanning collection opticsKLA TENCOR CORP·Filed 2015·Granted Jan 17, 2017·4 cites·20 claims
- 1087US8995746B2Image synchronization of scanning wafer inspection systemKLA TENCOR CORP·Filed 2013·Granted Mar 31, 2015·7 cites·21 claims
- 1186US9645093B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2015·Granted May 9, 2017·3 cites·46 claims
- 1286US6922236B2Systems and methods for simultaneous or sequential multi-perspective specimen defect inspectionKLA TENCOR TECH CORP·Filed 2002·Granted Jul 26, 2005·36 cites·26 claims
- 1385US12480938B2Methods and systems for analyte detection and analysisULTIMA GENOMICS INC·Filed 2024·Granted Nov 25, 2025·0 cites·20 claims
- 1485US7535563B1Systems configured to inspect a specimenKLA TENCOR TECH CORP·Filed 2006·Granted May 19, 2009·11 cites·19 claims
- 1584US9176069B2System and method for apodization in a semiconductor device inspection systemKLA TENCOR CORP·Filed 2013·Granted Nov 3, 2015·5 cites·44 claims
- 1680US6686995B2Two-dimensional UV compatible programmable spatial filterKLA TENCOR TECH CORP·Filed 2002·Granted Feb 3, 2004·26 cites·30 claims
- 1775US7012683B2Apparatus and methods for optically inspecting a sample for anomaliesKLA TENCOR TECH CORP·Filed 2004·Granted Mar 14, 2006·13 cites·19 claims
- 1873US9891175B2System and method for oblique incidence scanning with 2D array of spotsKLA TENCOR CORP·Filed 2015·Granted Feb 13, 2018·2 cites·28 claims
- 1973US6775051B2Systems and methods for scanning a beam of light across a specimenKLA TENCOR TECHNOLOGIES·Filed 2002·Granted Aug 10, 2004·16 cites·42 claims
- 2072US9208553B2Image synchronization of scanning wafer inspection systemKLA TENCOR CORP·Filed 2015·Granted Dec 8, 2015·1 cites·23 claims
- 2166US9970883B2Multi-spot scanning collection opticsKLA TENCOR CORP·Filed 2017·Granted May 15, 2018·1 cites·22 claims
- 2260US6686994B2UV compatible programmable spatial filterKLA TENCOR TECH CORP·Filed 2002·Granted Feb 3, 2004·8 cites·31 claims
- 2359US10060884B2Interleaved acousto-optical device scanning for suppression of optical crosstalkKLA TENCOR CORP·Filed 2016·Granted Aug 28, 2018·0 cites·26 claims
- 2446US9389166B2Enhanced high-speed logarithmic photo-detector for spot scanning systemKLA TENCOR CORP·Filed 2012·Granted Jul 12, 2016·0 cites·22 claims
- 2542US9864173B2Systems and methods for run-time alignment of a spot scanning wafer inspection systemKLA TENCOR CORP·Filed 2016·Granted Jan 9, 2018·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →