Inventor · disambiguated record
Kee-Teok Park
Also filed as: PARK KEE T · PARK KEE-TEOK
45 granted patents·7 pending applications·347 citations·filing 2000–2022
98Inventor score
Files withHYNIX SEMICONDUCTOR INC35SK HYNIX INC8JEONG CHUN-SEOK2BYEON SANG J1HYUNDAI ELECTRONICS CO LTD1
Top patents by PatentIndex Score
52 records- 0199US11386950B2Stacked DRAM memory device for improving integration density and reducing bit line capacitanceSK HYNIX INC·Filed 2021·Granted Jul 12, 2022·8 cites·20 claims
- 0288US8526251B2Semiconductor apparatus, method for delaying signal thereof, stacked semiconductor memory apparatus, and method for generating signal thereofPARK HEAT BIT·Filed 2010·Granted Sep 3, 2013·11 cites·26 claims
- 0388US7965571B2On die thermal sensorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jun 21, 2011·19 cites·25 claims
- 0488US7773440B2ZQ calibration controller and method for ZQ calibrationHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Aug 10, 2010·19 cites·18 claims
- 0585US8140293B2On die thermal sensorJEONG CHUN-SEOK·Filed 2007·Granted Mar 20, 2012·16 cites·52 claims
- 0685US7839200B2Semiconductor device and data outputting method of the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Nov 23, 2010·15 cites·19 claims
- 0785US6850453B2Deep power down control circuitHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Feb 1, 2005·38 cites·12 claims
- 0883US6885605B2Power-up signal generator for semiconductor memory devicesHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Apr 26, 2005·29 cites·11 claims
- 0980US6683445B2Internal power voltage generatorHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Jan 27, 2004·28 cites·9 claims
- 1079US9251912B2Semiconductor memory device and method of wafer burn-in test for the sameSK HYNIX INC·Filed 2014·Granted Feb 2, 2016·6 cites·7 claims
- 1178US7362167B2Voltage generatorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Apr 22, 2008·10 cites·36 claims
- 1276US7706199B2Circuit and method for parallel test of memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 27, 2010·9 cites·14 claims
- 1373US9947404B1Resistive memory apparatus, selective write circuit therefor, and operation method thereofSK HYNIX INC·Filed 2017·Granted Apr 17, 2018·3 cites·19 claims
- 1473US7598785B2Apparatus and method for adjusting slew rate in semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Oct 6, 2009·7 cites·3 claims
- 1571US7786753B2Output driver circuit, semiconductor memory device including the output driver circuit, and method for operating the semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Aug 31, 2010·7 cites·11 claims
- 1668US7804323B2Impedance matching circuit and semiconductor memory device with the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Sep 28, 2010·5 cites·8 claims
- 1767US11699481B2Semiconductor memory device including word line and bit lineSK HYNIX INC·Filed 2022·Granted Jul 11, 2023·0 cites·18 claims
- 1867US7876636B2Semiconductor memory device and method for driving the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jan 25, 2011·5 cites·5 claims
- 1967US7417475B2Circuit and method for generating power up signalHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Aug 26, 2008·6 cites·13 claims
- 2067US7382677B2Memory device having internal voltage supply providing improved power efficiency during active mode of memory operationHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jun 3, 2008·6 cites·13 claims
- 2165US7619937B2Semiconductor memory device with reset during a test modeHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Nov 17, 2009·5 cites·15 claims
- 2265US6967880B2Semiconductor memory test deviceHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Nov 22, 2005·9 cites·9 claims
- 2365US6928006B2Semiconductor memory device capable of reducing noise during operation thereofHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Aug 9, 2005·13 cites·5 claims
- 2464US7447089B2Bitline precharge voltage generatorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 4, 2008·5 cites·20 claims
- 2562US7193906B2Voltage regulating circuit and method of regulating voltageHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Mar 20, 2007·11 cites·10 claims
- 2661US9564888B2Voltage generation apparatusSK HYNIX INC·Filed 2015·Granted Feb 7, 2017·1 cites·16 claims
- 2761US8072822B2Data alignment circuit and method of semiconductor memory apparatusJEONG CHUN SEOK·Filed 2009·Granted Dec 6, 2011·4 cites·20 claims
- 2861US7489578B2Boosted voltage level detector in semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Feb 10, 2009·4 cites·9 claims
- 2960US7610165B2Semiconductor memory device having on die thermal sensorHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Oct 27, 2009·4 cites·16 claims
- 3060US6240025B1Voltage generatorHYUNDAI ELECTRONICS CO LTD·Filed 2000·Granted May 29, 2001·11 cites·7 claims
- 3159US7818526B2Semiconductor memory device having test mode for data access timeHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Oct 19, 2010·10 cites·16 claims
- 3258US7434120B2Test mode control circuitHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Oct 7, 2008·3 cites·8 claims
- 3356US9036435B2Semiconductor apparatus, method for delaying signal thereof, stacked semiconductor memory apparatus, and method for generating signal thereofSK HYNIX INC·Filed 2013·Granted May 19, 2015·1 cites·6 claims
- 3454US7142022B2Clock enable buffer for entry of self-refresh modeHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Nov 28, 2006·6 cites·3 claims
- 3553US8867282B2Semiconductor apparatus with open bit line structureYUN TAE SIK·Filed 2011·Granted Oct 21, 2014·1 cites·9 claims
- 3652US7995416B2Semiconductor memory device and operation method thereofHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Aug 9, 2011·2 cites·22 claims
- 3752US7193920B2Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Mar 20, 2007·2 cites·20 claims
- 3849US7082068B2Semiconductor memory device and method for adjusting internal voltage thereofHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Jul 25, 2006·5 cites·25 claims
- 3947US7440343B2Output driving deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Oct 21, 2008·1 cites·23 claims
- 4042US7719907B2Test circuit for semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 18, 2010·0 cites·14 claims
- 4142US7650544B2Test mode control circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jan 19, 2010·0 cites·8 claims
- 4242US7345516B2Apparatus and method for adjusting slew rate in semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Mar 18, 2008·2 cites·20 claims
- 4342US2014062523A1Semiconductor apparatus and test method thereofSK HYNIX INC·Filed 2012·Application pending·0 cites
- 4441US10176856B2Semiconductor memory apparatusSK HYNIX INC·Filed 2017·Granted Jan 8, 2019·0 cites·18 claims
- 4538US2005135174A1Power-up signal generator for semiconductor memory devicesHYNIX SEMICONDUCTOR INC·Filed 2005·Application pending·0 cites
- 4637US8331190B2Semiconductor memory device and operation method thereofYON SUN-HYUCK·Filed 2011·Granted Dec 11, 2012·0 cites·6 claims
- 4736US2006103452A1Internal voltage generator for semiconductor deviceBYEON SANG J·Filed 2005·Application pending·0 cites
- 4835US2007002637A1Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Application pending·0 cites
- 4934US7075833B2Circuit for detecting negative word line voltageHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Jul 11, 2006·0 cites·14 claims
- 5034US2011210769A1Integrated circuitPARK KEE-TEOK·Filed 2010·Application pending·0 cites
Showing the top 50 of 52 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →