Inventor · disambiguated record
Scott N. Gatzemeier
Also filed as: GATZEMEIER SCOTT · GATZEMEIER SCOTT N
17 granted patents·3 pending applications·155 citations·filing 2000–2013
94Inventor score
Technology areasG11C
Top patents by PatentIndex Score
20 records- 0190US8687435B2System and method for reducing pin-count of memory devices, and memory device testers for sameMICRON TECHNOLOGY INC·Filed 2013·Granted Apr 1, 2014·9 cites·20 claims
- 0290US7707467B2Input/output compression and pin reduction in an integrated circuitMICRON TECHNOLOGY INC·Filed 2007·Granted Apr 27, 2010·20 cites·29 claims
- 0390US7567472B2Memory block testingMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 28, 2009·23 cites·11 claims
- 0486US8094508B2Memory block testingGATZEMEIER SCOTT N·Filed 2009·Granted Jan 10, 2012·20 cites·21 claims
- 0582US8024629B2Input/output compression and pin reduction in an integrated circuitMICRON TECHNOLOGY INC·Filed 2010·Granted Sep 20, 2011·7 cites·18 claims
- 0682US7292487B1Independent polling for multi-page programmingMICRON TECHNOLOGY INC·Filed 2006·Granted Nov 6, 2007·12 cites·30 claims
- 0777US8400844B2System and method for reducing pin-count of memory devices, and memory device testers for sameGATZEMEIER SCOTT·Filed 2011·Granted Mar 19, 2013·5 cites·25 claims
- 0877US7554858B2System and method for reducing pin-count of memory devices, and memory device testers for sameMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 30, 2009·8 cites·10 claims
- 0971US8072820B2System and method for reducing pin-count of memory devices, and memory device testers for sameGATZEMEIER SCOTT·Filed 2009·Granted Dec 6, 2011·6 cites·27 claims
- 1068US6839292B2Apparatus and method for parallel programming of antifusesMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 4, 2005·16 cites·29 claims
- 1162US7411848B2Independent polling for multi-page programmingMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 12, 2008·4 cites·20 claims
- 1261US7512507B2Die based trimmingMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 31, 2009·5 cites·41 claims
- 1361US6854079B1Apparatus and method for reducing test resources in testing Rambus DRAMsMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 8, 2005·8 cites·25 claims
- 1457US7168018B2Apparatus and method for reducing test resources in testing DRAMsMICRON TECHNOLOGY INC·Filed 2004·Granted Jan 23, 2007·6 cites·48 claims
- 1554US6986084B2Apparatus and method for reducing test resources in testing DRAMSMICRON TECHNOLOGY INC·Filed 2004·Granted Jan 10, 2006·5 cites·18 claims
- 1639US2007168790A1Apparatus and method for reducing test resources in testing dramsCOOPER CHRIS·Filed 2006·Application pending·0 cites
- 1738US7620768B2Multiple erase block tagging in a flash memory deviceMICRON TECHNOLOGY INC·Filed 2006·Granted Nov 17, 2009·0 cites·20 claims
- 1838US2005262405A1Apparatus and method for reducing test resources in testing DRAMsCOOPER CHRIS·Filed 2005·Application pending·0 cites
- 1936US7116584B2Multiple erase block tagging in a flash memory deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 3, 2006·1 cites·24 claims
- 2033US2007019480A1Test circuitry and testing methodsMICRON TECHNOLOGY INC·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →