Inventor · disambiguated record
Joon-Su Ji
Also filed as: JI JOON-SU
9 granted patents·1 pending application·97 citations·filing 2001–2019
87Inventor score
Files withSAMSUNG ELECTRONICS CO LTD10
Top patents by PatentIndex Score
10 records- 0189US6909297B2Probe cardSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 21, 2005·62 cites·13 claims
- 0283US9696402B2Probe card inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jul 4, 2017·5 cites·19 claims
- 0374US11067658B2Probe card inspection wafer, probe card inspection system, and method of inspecting probe cardSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jul 20, 2021·2 cites·20 claims
- 0471US7423443B2Method of performing parallel test on semiconductor devices by dividing voltage supply unitSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 9, 2008·3 cites·15 claims
- 0566US7622940B2Semiconductor device having contact failure detectorSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 24, 2009·6 cites·18 claims
- 0662US7626413B2Parallel testing of semiconductor devices using a dividing voltage supply unitSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Dec 1, 2009·1 cites·7 claims
- 0759US6813804B2Apparatus and method for cleaning probe card contactsSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Nov 9, 2004·7 cites·11 claims
- 0859US6571448B2Apparatus for attaching sand papers on dummy wafersSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jun 3, 2003·7 cites·15 claims
- 0950US6906341B2Probe needle test apparatus and methodSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 14, 2005·4 cites·7 claims
- 1039US2005034743A1Apparatus and method for cleaning probe card contactsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →