Inventor · disambiguated record
Roger Alvis
Also filed as: ALVIS ROGER · ALVIS ROGER L · ALVIS ROGER LOUIS
16 granted patents·1 pending application·285 citations·filing 1995–2020
94Inventor score
Files withADVANCED MICRO DEVICES INC10FEI CO4ADVANED MICRO DEVICES INC1BUNTON JOSEPH HALE1VEECO INSTR INC1
Top patents by PatentIndex Score
17 records- 0192US11513079B2Method and system for wafer defect inspectionFEI CO·Filed 2020·Granted Nov 29, 2022·4 cites·19 claims
- 0287US5918149ADeposition of a conductor in a via hole or trenchADVANCED MICRO DEVICES INC·Filed 1996·Granted Jun 29, 1999·93 cites·18 claims
- 0384US10453646B2Tomography-assisted TEM prep with requested intervention automation workflowFEI CO·Filed 2018·Granted Oct 22, 2019·3 cites·15 claims
- 0471US5650343ASelf-aligned implant energy modulation for shallow source drain extension formationADVANCED MICRO DEVICES INC·Filed 1995·Granted Jul 22, 1997·41 cites·13 claims
- 0562US11004651B2Tomography-assisted TEM prep with requested intervention automation workflowFEI CO·Filed 2019·Granted May 11, 2021·0 cites·13 claims
- 0660US6427345B1Method and apparatus for a line based, two-dimensional characterization of a three-dimensional surfaceVEECO INSTR INC·Filed 1998·Granted Aug 6, 2002·25 cites·32 claims
- 0758US6455385B1Semiconductor fabrication with multiple low dose implantADVANCED MICRO DEVICES INC·Filed 1998·Granted Sep 24, 2002·22 cites·14 claims
- 0858US6293698B1Method for precise temperature sensing and control of semiconductor structuresADVANCED MICRO DEVICES INC·Filed 1995·Granted Sep 25, 2001·26 cites·7 claims
- 0953US5864199AElectron beam emitting tungsten filamentADVANCED MICRO DEVICES INC·Filed 1997·Granted Jan 26, 1999·9 cites·6 claims
- 1051US5727978AMethod of forming electron beam emitting tungsten filamentADVANCED MICRO DEVICES INC·Filed 1995·Granted Mar 17, 1998·8 cites·8 claims
- 1150US5713667ATemperature sensing probe for microthermometryADVANCED MICRO DEVICES INC·Filed 1995·Granted Feb 3, 1998·21 cites·12 claims
- 1249US5710052AScanning spreading resistance probeADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 20, 1998·15 cites·7 claims
- 1347US5935867AShallow drain extension formation by angled implantationADVANCED MICRO DEVICES INC·Filed 1995·Granted Aug 10, 1999·14 cites·31 claims
- 1443US2010282964A1Methods and apparatuses to align energy beam to atom probe specimenBUNTON JOSEPH HALE·Filed 2008·Application pending·0 cites
- 1540US9797923B2Fabrication of a malleable lamella for correlative atomic-resolution tomographic analysesFEI CO·Filed 2015·Granted Oct 24, 2017·0 cites·17 claims
- 1638US5536940AEnergy filtering for electron back-scattered diffraction patternsADVANCED MICRO DEVICES INC·Filed 1995·Granted Jul 16, 1996·4 cites·11 claims
- 1726US5707484AMethod of accurate compositional analysis of dielectric films on semiconductorsADVANED MICRO DEVICES INC·Filed 1995·Granted Jan 13, 1998·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →