Inventor · disambiguated record
Shin Nemoto
Also filed as: NEMOTO SHIN · NEMOTO SHIN-ICHI
27 granted patents·4 pending applications·838 citations·filing 1981–2021
97Inventor score
Files withYAZAKI CORP9ADVANTEST CORP8DORYOKURO KAKUNENRYO3SUMITOMO METAL IND3SLEEP SYSTEM LABORATORY INC2
Top patents by PatentIndex Score
31 records- 0195US5865319AAutomatic test handler system for IC testerADVANTEST CORP·Filed 1996·Granted Feb 2, 1999·146 cites·23 claims
- 0293US6066822ASemiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatusADVANTEST CORP·Filed 1996·Granted May 23, 2000·94 cites·7 claims
- 0390US6384593B1Semiconductor device testing apparatusADVANTEST CORP·Filed 2000·Granted May 7, 2002·40 cites·10 claims
- 0489US4598998AScrew surface flaw inspection method and an apparatus thereforSUMITOMO METAL IND·Filed 1983·Granted Jul 8, 1986·85 cites·14 claims
- 0587US6104183ASemiconductor device testing apparatusADVANTEST CORP·Filed 1996·Granted Aug 15, 2000·62 cites·21 claims
- 0686US6339321B1Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatusADVANTEST CORP·Filed 1999·Granted Jan 15, 2002·85 cites·28 claims
- 0785US9601854B2Female terminalYAZAKI CORP·Filed 2013·Granted Mar 21, 2017·15 cites·13 claims
- 0882US6433294B1Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatusADVANTEST CORP·Filed 2000·Granted Aug 13, 2002·21 cites·7 claims
- 0982US4365307ATemperature pattern measuring deviceSUMITOMO METAL IND·Filed 1981·Granted Dec 21, 1982·40 cites·11 claims
- 1078US7699785B2Method for determining sleep stagesSLEEP SYSTEM LAB INC·Filed 2005·Granted Apr 20, 2010·27 cites·7 claims
- 1178US4857040AHigh-speed centrifugal extractor having improved weirsDORYOKURO KAKUNENRYO·Filed 1987·Granted Aug 15, 1989·40 cites·3 claims
- 1277US5254075AInternal circulation type centrifugal extractorDORYOKURO KAKUNENRYO·Filed 1991·Granted Oct 19, 1993·42 cites·4 claims
- 1374US4413324ATemperature pattern measuring method and a device thereforSUMITOMO METAL IND·Filed 1981·Granted Nov 1, 1983·30 cites·13 claims
- 1473US9472884B2ConnectorYAZAKI CORP·Filed 2013·Granted Oct 18, 2016·8 cites·5 claims
- 1573US9028277B2Terminal locking structure in connector housingYAZAKI CORP·Filed 2013·Granted May 12, 2015·7 cites·4 claims
- 1668US10840623B2Board-mounting connector including cylindrical portion having slit with end portions offset from one anotherYAZAKI CORP·Filed 2019·Granted Nov 17, 2020·2 cites·4 claims
- 1765US10158189B2Connector having a housing inseparably connecting two other housingsYAZAKI CORP·Filed 2018·Granted Dec 18, 2018·2 cites·3 claims
- 1861US4824430AHigh-speed centrifugal extractor having spiral liquid pathDORYOKURO KAKUNENRYO·Filed 1987·Granted Apr 25, 1989·25 cites·1 claims
- 1960US11417996B2Connector fitting deviceYAZAKI CORP·Filed 2020·Granted Aug 16, 2022·0 cites·8 claims
- 2054US7316171B2Biosignal intensity measuring method, bedding state judging method, and bedding state monitoring deviceCB SYSTEM CO·Filed 2003·Granted Jan 8, 2008·16 cites·20 claims
- 2154US2024024617A1Sleep improvement device and sleep improvement methodSLEEP SYSTEM LABORATORY INC·Filed 2021·Application pending·0 cites
- 2249US6271657B1Test head positioner for semiconductor device testing apparatusADVANTEST CORP·Filed 1998·Granted Aug 7, 2001·14 cites·12 claims
- 2348US9172171B2Connector housing with fixed ended lance and removal jig for the sameNEMOTO SHIN·Filed 2012·Granted Oct 27, 2015·2 cites·7 claims
- 2448US9106017B2Terminal pullout structure of connectorYAZAKI CORP·Filed 2014·Granted Aug 11, 2015·1 cites·3 claims
- 2548US5234150AMethod of manufacturing spotwise partial clad materialSUMITOMO SPEC METALS·Filed 1990·Granted Aug 10, 1993·17 cites·11 claims
- 2647US5295296AMethod and apparatus for working a clad materialCITIZEN WATCH CO LTD·Filed 1991·Granted Mar 22, 1994·13 cites·10 claims
- 2741US10727622B2Board-mounted connectorYAZAKI CORP·Filed 2019·Granted Jul 28, 2020·0 cites·2 claims
- 2840US2015013157A1Structure and method for assembling connectorYAZAKI CORP·Filed 2014·Application pending·0 cites
- 2938US2002036161A1Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatusADVANTEST CORP·Filed 2001·Application pending·0 cites
- 3038US2018146915A1Sleep stage determination apparatus and sleep stage determination methodSLEEP SYSTEM LABORATORY INC·Filed 2015·Application pending·0 cites
- 3132US5355017ALead frame having a die pad with metal foil layers attached to the surfacesSUMITOMO SPEC METALS·Filed 1992·Granted Oct 11, 1994·4 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →