Inventor · disambiguated record
Frank Hooshdaran
Also filed as: HOOSHDARAN FRANK · HOOSHDARAN FRANK F
3 granted patents·10 pending applications·26 citations·filing 2001–2019
65Inventor score
Top patents by PatentIndex Score
13 records- 0188US9089007B2Method and apparatus for substrate support with multi-zone heatingYANG YAO-HUNG·Filed 2013·Granted Jul 21, 2015·10 cites·20 claims
- 0270US6685799B2Variable efficiency faraday shieldAPPLIED MATERIALS INC·Filed 2001·Granted Feb 3, 2004·16 cites·8 claims
- 0352US2006175015A1Etch chamber with dual frequency biasing sources and a single frequency plasma generating sourceAPPLIED MATERIALS INC·Filed 2006·Application pending·0 cites
- 0451US2007020937A1Etch chamber with dual frequency biasing sources and a single frequency plasma generating sourceCHEN JIN-YUAN·Filed 2006·Application pending·0 cites
- 0548US2010119420A1Abatement system having enhanced effluent scrub and moisture controlAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites
- 0646US2010008838A1Methods and apparatus for abating electronic device manufacturing process effluentAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites
- 0743US2021035767A1Methods for repairing a recess of a chamber componentAPPLIED MATERIALS INC·Filed 2019·Application pending·0 cites
- 0842US8911151B2Substrate support bushingAPPLIED MATERIALS INC·Filed 2012·Granted Dec 16, 2014·0 cites·6 claims
- 0940US2004025791A1Etch chamber with dual frequency biasing sources and a single frequency plasma generating sourceAPPLIED MATERIALS INC·Filed 2003·Application pending·0 cites
- 1039US2013287529A1Method and apparatus for independent wafer handlingYANG YAO-HUNG·Filed 2013·Application pending·0 cites
- 1137US2010192773A1Abatement apparatus with scrubber conduitAPPLIED MATERIALS INC·Filed 2010·Application pending·0 cites
- 1234US2010258510A1Methods and apparatus for treating effluentAPPLIED MATERIALS INC·Filed 2010·Application pending·0 cites
- 1327US2004027209A1Fixed matching network with increased match range capabilitiesAPPLIED MATERIALS INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →