Inventor · disambiguated record
Randy Schwindt
Also filed as: SCHWINDT RANDY · SCHWINDT RANDY J
29 granted patents·1 pending application·1,775 citations·filing 1992–2007
98Inventor score
Top patents by PatentIndex Score
30 records- 0198US5729150ALow-current probe card with reduced triboelectric current generating cablesCASCADE MICROTECH INC·Filed 1995·Granted Mar 17, 1998·187 cites·13 claims
- 0297US6335628B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Jan 1, 2002·102 cites·5 claims
- 0397US6137302ALow-current probe card with reduced triboelectric current generating cablesCASCADE MICROTECH INC·Filed 1997·Granted Oct 24, 2000·127 cites·8 claims
- 0497US5610529AProbe station having conductive coating added to thermal chuck insulatorCASCADE MICROTECH INC·Filed 1995·Granted Mar 11, 1997·182 cites·18 claims
- 0596US6492822B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Dec 10, 2002·64 cites·8 claims
- 0696US5457398AWafer probe station having full guardingCASCADE MICROTECH INC·Filed 1993·Granted Oct 10, 1995·149 cites·22 claims
- 0796US5345170AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1992·Granted Sep 6, 1994·166 cites·7 claims
- 0895US6720782B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2002·Granted Apr 13, 2004·53 cites·8 claims
- 0994US6384615B2Probe holder for low current measurementsCASCADE MICROTECH INC·Filed 2001·Granted May 7, 2002·46 cites·26 claims
- 1094US6232788B1Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1997·Granted May 15, 2001·98 cites·8 claims
- 1194US5663653AWafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1995·Granted Sep 2, 1997·91 cites·15 claims
- 1293US6496024B2Probe holder for testing of a test deviceCASCADE MICROTECH INC·Filed 2002·Granted Dec 17, 2002·40 cites·26 claims
- 1392US7589518B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Sep 15, 2009·10 cites·5 claims
- 1491US7492147B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2007·Granted Feb 17, 2009·8 cites·10 claims
- 1591US7330023B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Feb 12, 2008·9 cites·4 claims
- 1691US6850082B2Probe holder for testing of a test deviceCASECADE MICROTECH INC·Filed 2002·Granted Feb 1, 2005·41 cites·26 claims
- 1791US6031383AProbe station for low current, low voltage parametric measurements using multiple probesWENTWORTH LAB INC·Filed 1998·Granted Feb 29, 2000·154 cites·6 claims
- 1890US7504842B2Probe holder for testing of a test deviceCASCADE MICROTECH INC·Filed 2007·Granted Mar 17, 2009·12 cites·12 claims
- 1990US5434512AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1994·Granted Jul 18, 1995·73 cites·2 claims
- 2088US6232789B1Probe holder for low current measurementsCASCADE MICROTECH INC·Filed 1997·Granted May 15, 2001·94 cites·27 claims
- 2183US6075376ALow-current probe cardFiled 1999·Granted Jun 13, 2000·37 cites·35 claims
- 2273US6249133B1Low-current probe cardCASCADE MICROTECH INC·Filed 2000·Granted Jun 19, 2001·12 cites·8 claims
- 2361US6980012B2Wafer probe station for low-current measurementsCASCASE MICROTECH INC·Filed 2003·Granted Dec 27, 2005·4 cites·8 claims
- 2461US6781396B2Low-current probe cardCASCADE MICROTECH INC·Filed 2002·Granted Aug 24, 2004·6 cites·5 claims
- 2560US6507208B2Low-current probe cardCASCADE MICROTECH INC·Filed 2001·Granted Jan 14, 2003·6 cites·6 claims
- 2657US7221174B2Probe holder for testing of a test deviceCASCADE MICROTECH INC·Filed 2006·Granted May 22, 2007·1 cites·26 claims
- 2756US7071718B2Low-current probe cardCASCADE MICROTECH INC·Filed 2005·Granted Jul 4, 2006·1 cites·6 claims
- 2845US6995579B2Low-current probe cardCASCADE MICROTECH INC·Filed 2004·Granted Feb 7, 2006·1 cites·5 claims
- 2945US2006202708A1Low-current probe cardCASCADE MICROTECH INC·Filed 2006·Application pending·0 cites
- 3044US7057407B2Probe holder for testing of a test deviceCASCADE MICROTECH INC·Filed 2004·Granted Jun 6, 2006·1 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →