Assignee
WENTWORTH LAB INC
US·26 granted patents·1,678 citations·filing 1974–2008
Top patents by PatentIndex Score
26 records- 0195US5416429AProbe assembly for testing integrated circuitsWENTWORTH LAB INC·Filed 1994·Granted May 16, 1995·158 cites·15 claims
- 0294US5355079AProbe assembly for testing integrated circuit devicesWENTWORTH LAB INC·Filed 1993·Granted Oct 11, 1994·154 cites·17 claims
- 0394US3930809AAssembly fixture for fixed point probe cardWENTWORTH LAB INC·Filed 1974·Granted Jan 6, 1976·165 cites·6 claims
- 0492US5959461AProbe station adapter for backside emission inspectionWENTWORTH LAB INC·Filed 1997·Granted Sep 28, 1999·141 cites·11 claims
- 0591US6124723AProbe holder for low voltage, low current measurements in a water probe stationWENTWORTH LAB INC·Filed 1998·Granted Sep 26, 2000·108 cites·6 claims
- 0691US6031383AProbe station for low current, low voltage parametric measurements using multiple probesWENTWORTH LAB INC·Filed 1998·Granted Feb 29, 2000·154 cites·6 claims
- 0790US6160412AImpedance-matched interconnection device for connecting a vertical-pin integrated circuit probing device to integrated circuit test equipmentWENTWORTH LAB INC·Filed 1998·Granted Dec 12, 2000·114 cites·10 claims
- 0890US4719417AMulti-level test probe assembly for IC chipsWENTWORTH LAB INC·Filed 1986·Granted Jan 12, 1988·107 cites·6 claims
- 0989US6927586B2Temperature compensated vertical pin probing deviceWENTWORTH LAB INC·Filed 2003·Granted Aug 9, 2005·77 cites·2 claims
- 1089US4382228AProbes for fixed point probe cardsWENTWORTH LAB INC·Filed 1975·Granted May 3, 1983·65 cites·8 claims
- 1187US6566898B2Temperature compensated vertical pin probing deviceWENTWORTH LAB INC·Filed 2001·Granted May 20, 2003·50 cites·17 claims
- 1287US6297657B1Temperature compensated vertical pin probing deviceWENTWORTH LAB INC·Filed 1999·Granted Oct 2, 2001·88 cites·6 claims
- 1387US4599559ATest probe assembly for IC chipsWENTWORTH LAB INC·Filed 1985·Granted Jul 8, 1986·75 cites·7 claims
- 1484US7388392B2Die design with integrated assembly aidWENTWORTH LAB INC·Filed 2007·Granted Jun 17, 2008·8 cites·25 claims
- 1582US6661244B2Nickel alloy probe card frame laminateWENTWORTH LAB INC·Filed 2002·Granted Dec 9, 2003·35 cites·15 claims
- 1681US6756797B2Planarizing interposer for thermal compensation of a probe cardWENTWORTH LAB INC·Filed 2002·Granted Jun 29, 2004·37 cites·25 claims
- 1779US6906540B2Method for chemically etching photo-defined micro electrical contactsWENTWORTH LAB INC·Filed 2001·Granted Jun 14, 2005·31 cites·13 claims
- 1875US6255602B1Multiple layer electrical interfaceWENTWORTH LAB INC·Filed 1999·Granted Jul 3, 2001·45 cites·13 claims
- 1970US7554348B2Multi-offset die headWENTWORTH LAB INC·Filed 2007·Granted Jun 30, 2009·6 cites·17 claims
- 2067US7282936B2Die design with integrated assembly aidWENTWORTH LAB INC·Filed 2004·Granted Oct 16, 2007·9 cites·18 claims
- 2164US7282934B2Flexible microcircuit space transformer assemblyWENTWORTH LAB INC·Filed 2005·Granted Oct 16, 2007·5 cites·14 claims
- 2264US6163162ATemperature compensated vertical pin probing deviceWENTWORTH LAB INC·Filed 1999·Granted Dec 19, 2000·30 cites·7 claims
- 2358US7145353B2Double side probing of semiconductor devicesWENTWORTH LAB INC·Filed 2005·Granted Dec 5, 2006·3 cites·7 claims
- 2458US6977515B2Method for forming photo-defined micro electrical contactsWENTWORTH LAB INC·Filed 2003·Granted Dec 20, 2005·10 cites·7 claims
- 2555US7649372B2Die design with integrated assembly aidWENTWORTH LAB INC·Filed 2008·Granted Jan 19, 2010·3 cites·4 claims
- 2640US7392563B2Probe pin cleaning systemWENTWORTH LAB INC·Filed 2004·Granted Jul 1, 2008·0 cites·6 claims
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