Inventor · disambiguated record
Yoshiharu Kato
Also filed as: KATO YOSHIHARU
90 granted patents·15 pending applications·1,603 citations·filing 1977–2025
99Inventor score
Files withFUJITSU LTD57FUJI ELECTRIC CO LTD16MURATA MANUFACTURING CO6FUJITSU MICROELECTRONICS LTD3FUJITSU SEMICONDUCTOR LTD3
Top patents by PatentIndex Score
105 records- 0194US6061278ASemiconductor memory, data read method for semiconductor memory and data storage apparatusFUJITSU LTD·Filed 1998·Granted May 9, 2000·211 cites·52 claims
- 0292US6942157B2Data processing system and data processing methodIBM·Filed 2002·Granted Sep 13, 2005·72 cites·4 claims
- 0392US6762617B2Semiconductor device having test mode entry circuitFUJITSU LTD·Filed 2002·Granted Jul 13, 2004·47 cites·15 claims
- 0492US6667925B2Semiconductor device having temperature detecting function, testing method, and refresh control method of semiconductor storage device having temperature detecting functionFUJITSU LTD·Filed 2002·Granted Dec 23, 2003·67 cites·33 claims
- 0591US6492850B2Semiconductor integrated circuit and method for generating internal supply voltage in semiconductor integrated circuitFUJITSU LTD·Filed 2002·Granted Dec 10, 2002·49 cites·17 claims
- 0691US4537865AProcess for preparing a particulate ceramic materialMURATA MANUFACTURING CO·Filed 1984·Granted Aug 27, 1985·36 cites·4 claims
- 0788US10545866B1Method and system for efficient re-determination of a data valid windowCADENCE DESIGN SYSTEMS INC·Filed 2017·Granted Jan 28, 2020·10 cites·18 claims
- 0888US7251766B2Test method and test circuit for electronic deviceFUJITSU LTD·Filed 2005·Granted Jul 31, 2007·9 cites·19 claims
- 0988US6651196B1Semiconductor device having test mode entry circuitFUJITSU LTD·Filed 2000·Granted Nov 18, 2003·45 cites·40 claims
- 1087US6972487B2Multi chip package structure having a plurality of semiconductor chips mounted in the same packageFUJITSU LTD·Filed 2002·Granted Dec 6, 2005·36 cites·14 claims
- 1186US4478274ASystem for controlling a vehicle-mounted air conditionerNIPPON DENSO CO·Filed 1981·Granted Oct 23, 1984·47 cites·23 claims
- 1285US6288963B1Semiconductor memory deviceFUJITSU LTD·Filed 2000·Granted Sep 11, 2001·37 cites·22 claims
- 1385US5323355ASemiconductor memory deviceFUJITSU LTD·Filed 1992·Granted Jun 21, 1994·56 cites·2 claims
- 1484US11532737B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2018·Granted Dec 20, 2022·4 cites·14 claims
- 1583US6385119B2Internal supply voltage generating cicuit in a semiconductor memory device and method for controlling the sameFUJITSU LTD·Filed 2001·Granted May 7, 2002·32 cites·30 claims
- 1683US6333932B1Connectionless communications system, its test method, and intra-station control systemFUJITSU LTD·Filed 1995·Granted Dec 25, 2001·143 cites·13 claims
- 1782US10600897B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2018·Granted Mar 24, 2020·3 cites·19 claims
- 1882US6452854B1Circuit and method for supplying internal power to semiconductor memory deviceFUJITSU LTD·Filed 2001·Granted Sep 17, 2002·30 cites·15 claims
- 1981US7440038B2Liquid crystal television and liquid crystal display apparatusFUNAI ELECTRIC CO·Filed 2005·Granted Oct 21, 2008·18 cites·16 claims
- 2080US4482934ATemperature compensating titanate ceramic capacitor with nickel or copper electroless metal electrodesMURATA MANUFACTURING CO·Filed 1983·Granted Nov 13, 1984·31 cites·14 claims
- 2179US12015058B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2023·Granted Jun 18, 2024·0 cites·17 claims
- 2279US7245549B2Semiconductor memory device and method of controlling the semiconductor memory deviceFUJITSU LTD·Filed 2005·Granted Jul 17, 2007·10 cites·25 claims
- 2378US6525979B2Semiconductor memory device and method for reading information of therefromFUJITSU LTD·Filed 2001·Granted Feb 25, 2003·25 cites·25 claims
- 2478US2024332373A1Semiconductor device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 2576US7135882B2Semiconductor integrated circuit device and control method for the semiconductor integrated circuit deviceFUJITSU LTD·Filed 2005·Granted Nov 14, 2006·4 cites·21 claims
- 2676US6795328B2Semiconductor memory deviceFUJITSU LTD·Filed 2003·Granted Sep 21, 2004·22 cites·36 claims
- 2775US11195749B2Semiconductor device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2019·Granted Dec 7, 2021·1 cites·7 claims
- 2875US5155705ASemiconductor memory device having flash write functionFUJITSU LTD·Filed 1991·Granted Oct 13, 1992·36 cites·15 claims
- 2975US2024371642A1Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 3074US5499213ASemiconductor memory device having self-refresh functionFUJITSU LTD·Filed 1993·Granted Mar 12, 1996·35 cites·4 claims
- 3173US8711643B2Memory interface circuit, memory interface method, and electronic deviceKATO YOSHIHARU·Filed 2011·Granted Apr 29, 2014·5 cites·14 claims
- 3273US7206246B2Semiconductor memory device, refresh control method thereof, and test method thereofFUJITSU LTD·Filed 2005·Granted Apr 17, 2007·6 cites·3 claims
- 3372US2025248058A1Semiconductor device, manufacturing method of semiconductor device, and power conversion device comprising semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2025·Application pending·0 cites
- 3471US9206546B2Moisture-permeable waterproof fabric and process for producing sameKATO YOSHIHARU·Filed 2010·Granted Dec 8, 2015·1 cites·6 claims
- 3570US12051591B2Semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2021·Granted Jul 30, 2024·0 cites·20 claims
- 3670US11715771B2Semiconductor device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2020·Granted Aug 1, 2023·0 cites·16 claims
- 3770US8928397B2Semiconductor device and voltage dividerKODERA KAZUSHI·Filed 2012·Granted Jan 6, 2015·6 cites·18 claims
- 3870US7028235B1Test method and test circuit for electronic deviceFUJITSU LTD·Filed 2000·Granted Apr 11, 2006·15 cites·29 claims
- 3968US6839293B2Word-line deficiency detection method for semiconductor memory deviceFUJITSU LTD·Filed 2002·Granted Jan 4, 2005·14 cites·5 claims
- 4068US6504353B2Drive power supplying method for semiconductor memory device and semiconductor memory deviceFUJITSU LTD·Filed 2001·Granted Jan 7, 2003·16 cites·13 claims
- 4168US6297999B2Semiconductor memory device and method for setting stress voltageFUJITSU LTD·Filed 2001·Granted Oct 2, 2001·16 cites·19 claims
- 4267US7388791B2Signal interfaceFUJITSU LTD·Filed 2006·Granted Jun 17, 2008·3 cites·8 claims
- 4367US7382419B2Liquid crystal television and liquid crystal display apparatusFUNAI ELECTRIC CO·Filed 2005·Granted Jun 3, 2008·2 cites·8 claims
- 4466US9906849B2Sound-transmitting waterproof film and method for producing sameSEIREN CO LTD·Filed 2015·Granted Feb 27, 2018·1 cites·11 claims
- 4566US8023353B2Semiconductor memory device, refresh control method thereof, and test method thereofFUJITSU SEMICONDUCTOR LTD·Filed 2010·Granted Sep 20, 2011·2 cites·3 claims
- 4666US6472929B2Semiconductor deviceFUJITSU LTD·Filed 2001·Granted Oct 29, 2002·15 cites·9 claims
- 4765US7133996B2Memory device and internal control method thereforFUJITSU LTD·Filed 2002·Granted Nov 7, 2006·14 cites·80 claims
- 4865US4698192AApparatus for manufacturing a laminated unit of ceramic green sheetsMURATA MANUFACTURING CO·Filed 1985·Granted Oct 6, 1987·23 cites·19 claims
- 4965US2022084880A1Semiconductor device and manufacturing methodFUJI ELECTRIC CO LTD·Filed 2021·Application pending·0 cites
- 5064US12266719B2Semiconductor device, manufacturing method of semiconductor device, and power conversion device comprising semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2022·Granted Apr 1, 2025·0 cites·19 claims
Showing the top 50 of 105 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →