Inventor · disambiguated record
Andrew V. Le
Also filed as: LE ANDREW · LE ANDREW V · LE ANDREW VIET
10 granted patents·5 pending applications·59 citations·filing 2002–2022
85Inventor score
Top patents by PatentIndex Score
15 records- 0183US10330612B2Multi-function x-ray metrology tool for production inspection/monitoring of thin films and multidimensional structuresAPPLIED MATERIALS INC·Filed 2014·Granted Jun 25, 2019·6 cites·20 claims
- 0283US6764265B2Erosion resistant slit valveAPPLIED MATERIALS INC·Filed 2002·Granted Jul 20, 2004·30 cites·12 claims
- 0376US7789810B2Training tool for martial artsLE ANDREW VIET·Filed 2008·Granted Sep 7, 2010·19 cites·17 claims
- 0474US10655223B2Advanced coating method and materials to prevent HDP-CVD chamber arcingAPPLIED MATERIALS INC·Filed 2019·Granted May 19, 2020·0 cites·20 claims
- 0570US10208380B2Advanced coating method and materials to prevent HDP-CVD chamber arcingAPPLIED MATERIALS INC·Filed 2016·Granted Feb 19, 2019·1 cites·20 claims
- 0669US10580626B2Arcing detection apparatus for plasma processingAPPLIED MATERIALS INC·Filed 2016·Granted Mar 3, 2020·1 cites·14 claims
- 0767US10002745B2Plasma treatment process for in-situ chamber cleaning efficiency enhancement in plasma processing chamberAPPLIED MATERIALS INC·Filed 2016·Granted Jun 19, 2018·1 cites·17 claims
- 0854US7983776B2System and method for matching silicon oxide thickness between similar process toolsMICREL INC·Filed 2007·Granted Jul 19, 2011·1 cites·8 claims
- 0953US10883932B2Advanced in-situ particle detection system for semiconductor substrate processing systemsAPPLIED MATERIALS INC·Filed 2019·Granted Jan 5, 2021·0 cites·21 claims
- 1052US10365216B2Advanced in-situ particle detection system for semiconductor substrate processing systemsAPPLIED MATERIALS INC·Filed 2017·Granted Jul 30, 2019·0 cites·19 claims
- 1149US2022305496A1Methods and compositions for detecting target nucleic acids and resolving sample matricesDETECT INC·Filed 2022·Application pending·0 cites
- 1243US2019218492A1Self regulating bioreactor apparatus and methodsUNIV YALE·Filed 2017·Application pending·0 cites
- 1343US2009204126A1Cutting InstrumentLE ANDREW·Filed 2006·Application pending·0 cites
- 1439US2010007363A1System and method for determining in-line interfacial oxide contact resistanceMICREL INC·Filed 2007·Application pending·0 cites
- 1533US2017114462A1High productivity pecvd tool for wafer processing of semiconductor manufacturingAPPLIED MATERIALS INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →