Inventor · disambiguated record
Kaname Yamasaki
Also filed as: YAMASAKI KANAME
17 granted patents·3 pending applications·153 citations·filing 1998–2010
94Inventor score
Top patents by PatentIndex Score
20 records- 0185US6333645B1Clocked logic gate circuitHITACHI LTD·Filed 2000·Granted Dec 25, 2001·23 cites·8 claims
- 0280US7366965B2Semiconductor integrated circuitRENESAS TECH CORP·Filed 2004·Granted Apr 29, 2008·25 cites·9 claims
- 0375US6333881B1Semiconductor memoryHITACHI LTD·Filed 2000·Granted Dec 25, 2001·23 cites·13 claims
- 0473US7774667B2Semiconductor device and data processing systemRENESAS TECH CORP·Filed 2008·Granted Aug 10, 2010·10 cites·20 claims
- 0564US6337581B1Signal transmission circuit and semiconductor memory using the sameHITACHI LTD·Filed 2000·Granted Jan 8, 2002·9 cites·28 claims
- 0661US6229745B1Semiconductor memoryHITACHI LTD·Filed 2000·Granted May 8, 2001·12 cites·6 claims
- 0760US6075729AHigh-speed static random access memoryHITACHI LTD·Filed 1998·Granted Jun 13, 2000·20 cites·14 claims
- 0858US6316961B2Clocked logic gate circuitHITACHI LTD·Filed 2000·Granted Nov 13, 2001·6 cites·7 claims
- 0957US6677782B2Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuitHITACHI LTD·Filed 2001·Granted Jan 13, 2004·7 cites·2 claims
- 1051US6807115B2Method of testing a semiconductor integrated deviceRENESAS TECH CORP·Filed 2003·Granted Oct 19, 2004·4 cites·3 claims
- 1148US6438050B1Signal transmission circuit and semiconductor memory using the sameHITACHI LTD·Filed 2002·Granted Aug 20, 2002·3 cites·2 claims
- 1244US6617610B2Semiconductor integrated circuitHITACHI LTD·Filed 2001·Granted Sep 9, 2003·2 cites·14 claims
- 1344US6369617B1Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuitHITACHI LTD·Filed 1999·Granted Apr 9, 2002·6 cites·4 claims
- 1442US6998878B2Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuitHITACHI DEVICE ENG·Filed 2004·Granted Feb 14, 2006·2 cites·14 claims
- 1542US2006184848A1Semiconductor integrated circuit having test function and manufacturing methodRENESAS TECH CORP·Filed 2006·Application pending·0 cites
- 1640US2009063913A1Semiconductor integrated circuitRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 1739US6356493B1Signal transmission circuit and semiconductor memory using the sameHITACHI LTD·Filed 2000·Granted Mar 12, 2002·1 cites·1 claims
- 1836US6476644B2Clocked logic gate circuitHITACHI LTD·Filed 2000·Granted Nov 5, 2002·0 cites·3 claims
- 1934US2002196053A1Semiconductor integrated circuit and semiconductor logic circuit used in the integrated circuitFiled 2002·Application pending·0 cites
- 2025US8400853B2Semiconductor chip and method of repair design of the sameMATSUMOTO CHIZU·Filed 2010·Granted Mar 19, 2013·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →