Inventor · disambiguated record
Douglas K. Masnaghetti
Also filed as: MASNAGHETTI DOUGLAS · MASNAGHETTI DOUGLAS K · MASNAGHETTI DOUGLAS KEITH
20 granted patents·661 citations·filing 1991–2015
96Inventor score
Top patents by PatentIndex Score
20 records- 0194US9165742B1Inspection site preparationKLA TENCOR CORP·Filed 2015·Granted Oct 20, 2015·21 cites·33 claims
- 0294US7684609B1Defect review using image segmentationKLA TENCOR TECH CORP·Filed 2006·Granted Mar 23, 2010·21 cites·11 claims
- 0393US7792351B1Defect review using image segmentationKLA TENCOR TECH CORP·Filed 2010·Granted Sep 7, 2010·14 cites·10 claims
- 0493US7164139B1Wien filter with reduced chromatic aberrationKLA TENCOR TECH CORP·Filed 2005·Granted Jan 16, 2007·26 cites·12 claims
- 0593US6066849AScanning electron beam microscopeKLA TENCOR·Filed 1998·Granted May 23, 2000·103 cites·27 claims
- 0693US5616921ASelf-masking FIB millingSCHLUMBERGER TECHNOLOGIES INC·Filed 1994·Granted Apr 1, 1997·108 cites·27 claims
- 0792US7141791B2Apparatus and method for E-beam dark field imagingKLA TENCOR TECH CORP·Filed 2004·Granted Nov 28, 2006·53 cites·25 claims
- 0892US6710354B1Scanning electron microscope architecture and related material handling systemKLA TENCOR CORP·Filed 2002·Granted Mar 23, 2004·49 cites·16 claims
- 0990US5401972ALayout overlay for FIB operationsSCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Mar 28, 1995·62 cites·21 claims
- 1084US6815675B1Method and system for e-beam scanningKLA TENCOR TECH CORP·Filed 2003·Granted Nov 9, 2004·19 cites·25 claims
- 1181US5140164AIc modification with focused ion beam systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Aug 18, 1992·78 cites·5 claims
- 1275US7550743B1Chamberless substrate handlingKLA TENCOR CORP·Filed 2007·Granted Jun 23, 2009·3 cites·20 claims
- 1373US7247849B1Automated focusing of electron imageKLA TENCOR TECH CORP·Filed 2006·Granted Jul 24, 2007·6 cites·7 claims
- 1472US7276690B1Method and system for e-beam scanningKLA TENCOR TECH CORP·Filed 2004·Granted Oct 2, 2007·8 cites·7 claims
- 1571US5700526AInsulator deposition using focused ion beamSCHLUMBERGER TECHNOLOGIES INC·Filed 1995·Granted Dec 23, 1997·41 cites·14 claims
- 1668US6570154B1Scanning electron beam microscopeKLA TENCOR TECH CORP·Filed 1999·Granted May 27, 2003·22 cites·20 claims
- 1767US7288774B1Transverse magnetic field voltage isolatorKLA TENCOR TECH CORP·Filed 2004·Granted Oct 30, 2007·6 cites·9 claims
- 1862US6784425B1Energy filter multiplexingKLA TENCOR TECH CORP·Filed 2001·Granted Aug 31, 2004·7 cites·21 claims
- 1952US7550744B1Chamberless substrate handlingKLA TENCOR CORP·Filed 2007·Granted Jun 23, 2009·0 cites·20 claims
- 2050US5210487ADouble-gated integrating scheme for electron beam testerSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted May 11, 1993·14 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →