Inventor · disambiguated record
Amir Wachs
Also filed as: WACHS AMIR
9 granted patents·1 pending application·163 citations·filing 1999–2018
88Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD5APPLIED MATERIALS INC2HUBER WALTER1ORAMIR SEMICONDUCTOR LTD1TOWER SEMICONDUCTOR LTD1
Top patents by PatentIndex Score
10 records- 0193US9286675B1Iterative defect filtering processAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Mar 15, 2016·23 cites·20 claims
- 0284US6799584B2Condensation-based enhancement of particle removal by suctionAPPLIED MATERIALS INC·Filed 2001·Granted Oct 5, 2004·53 cites·43 claims
- 0383US6949147B2In situ module for particle removal from solid-state surfacesORAMIR SEMICONDUCTOR LTD·Filed 2004·Granted Sep 27, 2005·29 cites·10 claims
- 0483US6827816B1In situ module for particle removal from solid-state surfacesAPPLIED MATERIALS INC·Filed 2000·Granted Dec 7, 2004·30 cites·20 claims
- 0582US9880550B2Updating of a recipe for evaluating a manufacturing stage of an electrical circuitAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jan 30, 2018·3 cites·15 claims
- 0674US10347462B2Imaging of crystalline defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 9, 2019·2 cites·20 claims
- 0757US6238939B1Method of quality control in semiconductor device fabricationTOWER SEMICONDUCTOR LTD·Filed 1999·Granted May 29, 2001·23 cites·12 claims
- 0852US10049441B2Iterative defect filtering processAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Aug 14, 2018·0 cites·19 claims
- 0943US9958501B1System for electrical measurements of objects in a vacuumed environmentAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted May 1, 2018·0 cites·16 claims
- 1037US2006060213A1Manufacture of ultra-clean surfaces by selectiveHUBER WALTER·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →