Inventor · disambiguated record
Richard L. Antley
Also filed as: ANTLEY RICHARD L
20 granted patents·110 citations·filing 2002–2020
95Inventor score
Top patents by PatentIndex Score
20 records- 0194US8742415B2Test circuitry coupled to embedded circuit input/output unconnected to padsTEXAS INSTRUMENTS INC·Filed 2013·Granted Jun 3, 2014·8 cites·3 claims
- 0294US8466464B2Test and enable circuitry connected between embedded die circuitsWHETSEL LEE D·Filed 2012·Granted Jun 18, 2013·9 cites·3 claims
- 0393US8941109B2Test output buffer functional output input, test output, enable inputWHETSEL LEE D·Filed 2014·Granted Jan 27, 2015·7 cites·3 claims
- 0492US8168970B2Die having embedded circuitry with test and test enable circuitryWHETSEL LEE D·Filed 2011·Granted May 1, 2012·7 cites·4 claims
- 0592US7569853B2Test pads on leads unconnected with die padsTEXAS INSTRUMENTS INC·Filed 2008·Granted Aug 4, 2009·9 cites·7 claims
- 0690US9245812B2Die with separate functional input, test out, enable input buffersTEXAS INSTRUMENTS INC·Filed 2014·Granted Jan 26, 2016·4 cites·2 claims
- 0790US6590225B2Die testing using top surface test padsTEXAS INSTRUMENTS INC·Filed 2002·Granted Jul 8, 2003·26 cites·3 claims
- 0887US7956357B2Test pads coupled with leads unconnected with die padsTEXAS INSTRUMENTS INC·Filed 2009·Granted Jun 7, 2011·5 cites·7 claims
- 0986US8055962B2Testing IC functional and test circuitry having separate input/output padsTEXAS INSTRUMENTS INC·Filed 2010·Granted Nov 8, 2011·4 cites·1 claims
- 1086US7368304B2Fabricating die with separate test pads selectively coupled to coresTEXAS INSTRUMENTS INC·Filed 2006·Granted May 6, 2008·5 cites·5 claims
- 1183US10281522B2Test circuitry coupling test pad to functional core input padTEXAS INSTRUMENTS INC·Filed 2017·Granted May 7, 2019·1 cites·4 claims
- 1282US7124341B2Integrated circuit having electrically isolatable test circuitryTEXAS INSTRUMENTS INC·Filed 2003·Granted Oct 17, 2006·17 cites·6 claims
- 1380US10690717B2Enable input buffer coupling enable pad, functional circuitry, test circuitTEXAS INSTRUMENTS INC·Filed 2016·Granted Jun 23, 2020·1 cites·15 claims
- 1476US10809295B2Die testing using top surface test padsTEXAS INSTRUMENTS INC·Filed 2020·Granted Oct 20, 2020·0 cites·15 claims
- 1574US7056752B2Fabricating a die with test enable circuits between embedded coresTEXAS INSTRUMENTS INC·Filed 2003·Granted Jun 6, 2006·7 cites·7 claims
- 1664US9472478B2Die testing using top surface test padsTEXAS INSTRUMENTS INC·Filed 2015·Granted Oct 18, 2016·0 cites·7 claims
- 1749US7823038B2Connecting analog response to separate strobed comparator input on ICTEXAS INSTRUMENTS INC·Filed 2009·Granted Oct 26, 2010·0 cites·4 claims
- 1848US7587648B2Integrated circuit having electrically isolatable test circuitryTEXAS INSTRUMENTS INC·Filed 2008·Granted Sep 8, 2009·0 cites·4 claims
- 1947US8230284B2Integrated circuit having electrically isolatable test circuitryANTLEY RICHARD L·Filed 2011·Granted Jul 24, 2012·0 cites·1 claims
- 2046US7418643B2Integrated circuit having electrically isolatable test circuitryTEXAS INSTRUMENTS INC·Filed 2006·Granted Aug 26, 2008·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →