Individual holder
WHETSEL LEE D
US·106 granted patents·5 pending applications·505 citations·filing 2005–2014
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
111 records- 0198US8924802B2IC TAP with dual port router and additional capture inputWHETSEL LEE D·Filed 2012·Granted Dec 30, 2014·20 cites·3 claims
- 0298US8910003B2Controller circuitry with state machines, address store/compare, and shift registerWHETSEL LEE D·Filed 2014·Granted Dec 9, 2014·11 cites·4 claims
- 0398US8560905B2Programmable test compression architecture with serial input register and multiplexerWHETSEL LEE D·Filed 2012·Granted Oct 15, 2013·15 cites·1 claims
- 0498US8112685B2Serial compressed data I/O in a parallel test compression architectureWHETSEL LEE D·Filed 2010·Granted Feb 7, 2012·19 cites·1 claims
- 0597US8694844B2AT speed TAP with dual port router and command circuitWHETSEL LEE D·Filed 2011·Granted Apr 8, 2014·31 cites·3 claims
- 0697US8522095B2Tap with address, state monitor and gating circuitryWHETSEL LEE D·Filed 2012·Granted Aug 27, 2013·11 cites·3 claims
- 0797US8453024B2I/O and comparator circuitry with compare gate and mask circuitryWHETSEL LEE D·Filed 2012·Granted May 28, 2013·11 cites·3 claims
- 0897US8392773B2Bi-directional TMS lead carrying TMS and frame data in/out signalsWHETSEL LEE D·Filed 2012·Granted Mar 5, 2013·10 cites·2 claims
- 0997US8301946B2Inverted TCK access port selector with normal TCK data flip-flopWHETSEL LEE D·Filed 2011·Granted Oct 30, 2012·12 cites·5 claims
- 1097US8230280B2Source and destination data circuitry coupled to bi-directional TMS leadWHETSEL LEE D·Filed 2010·Granted Jul 24, 2012·14 cites·6 claims
- 1197US8166358B2Test access port with address and command capabilityWHETSEL LEE D·Filed 2010·Granted Apr 24, 2012·12 cites·4 claims
- 1296US8918687B2IC clock doubler output gated to multiplexer and output bufferWHETSEL LEE D·Filed 2012·Granted Dec 23, 2014·9 cites·3 claims
- 1396US8880968B2Interposer having functional leads, TAP, trigger unit, and monitor circuitryWHETSEL LEE D·Filed 2012·Granted Nov 4, 2014·11 cites·5 claims
- 1496US8412995B2TAP and AUX with IR control of TDI input multiplexerWHETSEL LEE D·Filed 2012·Granted Apr 2, 2013·9 cites·5 claims
- 1596US8299464B2Comparator receiving expected and mask data from circuit padsWHETSEL LEE D·Filed 2010·Granted Oct 30, 2012·11 cites·3 claims
- 1696US8219862B2Pass/fail scan memory with AND, OR and trinary gatesWHETSEL LEE D·Filed 2011·Granted Jul 10, 2012·11 cites·3 claims
- 1796US8176374B2Data register control of TDI/AX1 to the data registerWHETSEL LEE D·Filed 2011·Granted May 8, 2012·11 cites·5 claims
- 1896US8065578B2Inverted TCK access port selector selecting one of plural TAPsWHETSEL LEE D·Filed 2010·Granted Nov 22, 2011·10 cites·5 claims
- 1995US8615694B2Interposer TAP boundary register coupling stacked die functional input/output dataWHETSEL LEE D·Filed 2012·Granted Dec 24, 2013·12 cites·3 claims
- 2095US8464112B2Wrapper selection circuits with selection and enable inputsWHETSEL LEE D·Filed 2012·Granted Jun 11, 2013·8 cites·3 claims
- 2195US8276030B2Scan distributor and parallel scan paths with controlled output bufferWHETSEL LEE D·Filed 2011·Granted Sep 25, 2012·8 cites·4 claims
- 2295US8201036B2IC with test and shadow access ports and output circuitWHETSEL LEE D·Filed 2011·Granted Jun 12, 2012·9 cites·5 claims
- 2395US8195994B2Inverter and TMS clocked flip-flop pairs between TCK and resetWHETSEL LEE D·Filed 2011·Granted Jun 5, 2012·8 cites·2 claims
- 2495US8140926B2Die selectively connecting TAP leads to second dieWHETSEL LEE D·Filed 2011·Granted Mar 20, 2012·9 cites·2 claims
- 2595US8108742B2Tap control of TCA scan clock and scan enableWHETSEL LEE D·Filed 2010·Granted Jan 31, 2012·8 cites·5 claims
- 2694US9046575B2TAP test clock control circuitry connected to device address portWHETSEL LEE D·Filed 2012·Granted Jun 2, 2015·7 cites·4 claims
- 2794US8839060B2JTAG shadow protocol circuit with detection, command and address circuitsWHETSEL LEE D·Filed 2012·Granted Sep 16, 2014·6 cites·3 claims
- 2894US8522098B2Scan register and flip-flop alternately receiving SDI and mask dataWHETSEL LEE D·Filed 2012·Granted Aug 27, 2013·7 cites·4 claims
- 2994US8466464B2Test and enable circuitry connected between embedded die circuitsWHETSEL LEE D·Filed 2012·Granted Jun 18, 2013·9 cites·3 claims
- 3094US8412992B2IR output of mode-1 and ATC enable; ATC gating of shift-1WHETSEL LEE D·Filed 2012·Granted Apr 2, 2013·11 cites·4 claims
- 3194US8296614B2Moving data through test control register with state machine statesWHETSEL LEE D·Filed 2011·Granted Oct 23, 2012·7 cites·5 claims
- 3293US8941109B2Test output buffer functional output input, test output, enable inputWHETSEL LEE D·Filed 2014·Granted Jan 27, 2015·7 cites·3 claims
- 3393US8335953B2IR gating SC signals during TAP Clock-DR and Pause-DR statesWHETSEL LEE D·Filed 2011·Granted Dec 18, 2012·6 cites·3 claims
- 3493US8095839B2Position independent testing of circuitsWHETSEL LEE D·Filed 2011·Granted Jan 10, 2012·6 cites·3 claims
- 3592US8453025B2Generator/compactor scan circuit low power adaptor with state machineWHETSEL LEE D·Filed 2012·Granted May 28, 2013·5 cites·5 claims
- 3692US8168970B2Die having embedded circuitry with test and test enable circuitryWHETSEL LEE D·Filed 2011·Granted May 1, 2012·7 cites·4 claims
- 3792US8099642B2Formatter selectively outputting scan stimulus data from scan response dataWHETSEL LEE D·Filed 2009·Granted Jan 17, 2012·11 cites·4 claims
- 3892US8078927B2Wrapper leads gating TAP instruction and data registersWHETSEL LEE D·Filed 2010·Granted Dec 13, 2011·9 cites·4 claims
- 3991US8438440B2TAM with instruction register, instruction decode circuitry and gating circuitryWHETSEL LEE D·Filed 2012·Granted May 7, 2013·4 cites·3 claims
- 4091US8281196B2Device address port circuitry with local, group, and global outputsWHETSEL LEE D·Filed 2011·Granted Oct 2, 2012·5 cites·4 claims
- 4191US8271840B2Multiplexer with serial and scan data inputs for scan pathWHETSEL LEE D·Filed 2011·Granted Sep 18, 2012·5 cites·2 claims
- 4291US8112684B2Input linking circuitry connected to test mode select and enablesWHETSEL LEE D·Filed 2011·Granted Feb 7, 2012·6 cites·2 claims
- 4390US8572433B2JTAG IC with commandable circuit controlling data register control routerWHETSEL LEE D·Filed 2011·Granted Oct 29, 2013·5 cites·12 claims
- 4490US8335952B2Tap and scan test port with IR lock out outputWHETSEL LEE D·Filed 2011·Granted Dec 18, 2012·4 cites·4 claims
- 4590US8065577B2Dual controllers for scan paths, distributors, and collectorsWHETSEL LEE D·Filed 2010·Granted Nov 22, 2011·5 cites·4 claims
- 4689US8261144B2Operating scan paths sequentially and capturing simultaneouslyWHETSEL LEE D·Filed 2011·Granted Sep 4, 2012·4 cites·3 claims
- 4789US8250421B2Clock controller for JTAG interfaceWHETSEL LEE D·Filed 2011·Granted Aug 21, 2012·4 cites·7 claims
- 4889US8122310B2Input buffer, test switches and switch control with serial I/OWHETSEL LEE D·Filed 2011·Granted Feb 21, 2012·4 cites·4 claims
- 4988US8332700B2Multiplexer input linking circuitry to IC and core TAP domainsWHETSEL LEE D·Filed 2011·Granted Dec 11, 2012·4 cites·2 claims
- 5087US8464108B2Scan collector and parallel scan paths with controlled output bufferWHETSEL LEE D·Filed 2012·Granted Jun 11, 2013·3 cites·2 claims
Showing the top 50 of 111 patent records by PatentIndex Score.
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