Inventor · disambiguated record
Jenn-Kuen Leong
Also filed as: LEONG JENN-KUEN
9 granted patents·1 pending application·329 citations·filing 2002–2024
88Inventor score
Top patents by PatentIndex Score
10 records- 0198US7525649B1Surface inspection system using laser line illumination with two dimensional imagingKLA TENCOR TECH CORP·Filed 2007·Granted Apr 28, 2009·164 cites·19 claims
- 0297US8891079B2Wafer inspectionZHAO GUOHENG·Filed 2011·Granted Nov 18, 2014·57 cites·43 claims
- 0395US10942135B2Radial polarizer for particle detectionKLA CORP·Filed 2019·Granted Mar 9, 2021·9 cites·27 claims
- 0494US9291575B2Wafer inspectionKLA TENCOR CORP·Filed 2014·Granted Mar 22, 2016·16 cites·37 claims
- 0594US6724473B2Method and system using exposure control to inspect a surfaceKLA TENCOR TECH CORP·Filed 2002·Granted Apr 20, 2004·76 cites·53 claims
- 0693US10948423B2Sensitive particle detection with spatially-varying polarization rotator and polarizerKLA CORP·Filed 2019·Granted Mar 16, 2021·7 cites·31 claims
- 0768US2025383294A1Speckle noise reduction using pupil masksKLA CORP·Filed 2024·Application pending·0 cites
- 0862US11243175B2Sensitive particle detection with spatially-varying polarization rotator and polarizerKLA CORP·Filed 2021·Granted Feb 8, 2022·0 cites·45 claims
- 0961US11879853B2Continuous degenerate elliptical retarder for sensitive particle detectionKLA CORP·Filed 2022·Granted Jan 23, 2024·0 cites·52 claims
- 1052US11733172B2Apparatus and method for rotating an optical objectiveKLA CORP·Filed 2021·Granted Aug 22, 2023·0 cites·38 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →