Inventor · disambiguated record
Himanshu Vajaria
Also filed as: VAJARIA HIMANSHU
8 granted patents·2 pending applications·20 citations·filing 2014–2025
79Inventor score
Top patents by PatentIndex Score
10 records- 0193US9734568B2Automated inline inspection and metrology using shadow-gram imagesKLA TENCOR CORP·Filed 2015·Granted Aug 15, 2017·15 cites·15 claims
- 0280US2025356307A1Distance-Based Product Event Detection365 RETAIL MARKETS LLC·Filed 2025·Application pending·0 cites
- 0377US10997710B2Adaptive care areas for die-die inspectionKLA TENCOR CORP·Filed 2018·Granted May 4, 2021·1 cites·20 claims
- 0470US10522376B2Multi-step image alignment method for large offset die-die inspectionKLA TENCOR CORP·Filed 2018·Granted Dec 31, 2019·1 cites·20 claims
- 0567US12406226B2Distance-based product event detection365 RETAIL MARKETS LLC·Filed 2022·Granted Sep 2, 2025·0 cites·20 claims
- 0664US10365639B2Feature selection and automated process window monitoring through outlier detectionKLA TENCOR CORP·Filed 2016·Granted Jul 30, 2019·1 cites·20 claims
- 0761US10949964B2Super-resolution defect review image generation through generative adversarial networksKLA TENCOR CORP·Filed 2018·Granted Mar 16, 2021·1 cites·12 claims
- 0861US10290088B2Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughputKLA TENCOR CORP·Filed 2014·Granted May 14, 2019·1 cites·19 claims
- 0957US2025378676A1Computer Vision Component For Product Identification365 RETAIL MARKETS LLC·Filed 2024·Application pending·0 cites
- 1043US9569834B2Automated image-based process monitoring and controlKLA TENCOR CORP·Filed 2015·Granted Feb 14, 2017·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →