Inventor · disambiguated record
Hiromitsu Mashita
Also filed as: MASHITA HIROMITSU
29 granted patents·14 pending applications·70 citations·filing 2005–2022
95Inventor score
Top patents by PatentIndex Score
43 records- 0186US8307310B2Pattern generating method, method of manufacturing semiconductor device, computer program product, and pattern-shape-determination-parameter generating methodKOTANI TOSHIYA·Filed 2010·Granted Nov 6, 2012·11 cites·21 claims
- 0286US7700997B2Semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Apr 20, 2010·15 cites·9 claims
- 0380US7682757B2Pattern layout for forming integrated circuitTOSHIBA KK·Filed 2006·Granted Mar 23, 2010·6 cites·20 claims
- 0478US8336005B2Pattern dimension calculation method and computer program productTAGUCHI TAKAFUMI·Filed 2011·Granted Dec 18, 2012·5 cites·20 claims
- 0575US7716617B2Semiconductor device, method for making pattern layout, method for making mask pattern, method for making layout, method for manufacturing photo mask, photo mask, and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2005·Granted May 11, 2010·7 cites·9 claims
- 0673US8108824B2Pattern verification method, method of manufacturing semiconductor device, and recording mediaKOTANI TOSHIYA·Filed 2009·Granted Jan 31, 2012·3 cites·20 claims
- 0773US7713833B2Method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2009·Granted May 11, 2010·4 cites·12 claims
- 0871US8143171B2Method for manufacturing semiconductor device and computer readable medium for storing pattern size setting programMASHITA HIROMITSU·Filed 2009·Granted Mar 27, 2012·3 cites·6 claims
- 0968US9177854B2Method of manufacturing semiconductor device using sidewall films for pitch multiplication in forming interconnectsTOSHIBA KK·Filed 2013·Granted Nov 3, 2015·1 cites·17 claims
- 1068US8183148B2Method of fabricating semiconductor device and semiconductor deviceABURADA RYOTA·Filed 2009·Granted May 22, 2012·3 cites·11 claims
- 1167US8146022B2Mask pattern data generation method, mask manufacturing method, semiconductor device manufacturing method, and pattern data generation programMASHITA HIROMITSU·Filed 2009·Granted Mar 27, 2012·2 cites·14 claims
- 1263US8617773B2Method of correcting mask pattern, computer program product, and method of manufacturing semiconductor deviceUNO TAIGA·Filed 2011·Granted Dec 31, 2013·1 cites·14 claims
- 1362US8347241B2Pattern generation method, computer-readable recording medium, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2009·Granted Jan 1, 2013·1 cites·17 claims
- 1460US8283791B2Semiconductor device and method for manufacturing sameTOBA TAKAYUKI·Filed 2011·Granted Oct 9, 2012·1 cites·20 claims
- 1560US7941782B2Pattern layout of integrated circuitTOSHIBA KK·Filed 2007·Granted May 10, 2011·2 cites·11 claims
- 1659US9576100B2Pattern data generation method, pattern verification method, and optical image calculation methodTOSHIBA KK·Filed 2014·Granted Feb 21, 2017·0 cites·13 claims
- 1759US9257367B2Integrated circuit device, method for producing mask layout, and program for producing mask layoutTOSHIBA KK·Filed 2013·Granted Feb 9, 2016·1 cites·9 claims
- 1858US8443310B2Pattern correcting method, mask forming method, and method of manufacturing semiconductor deviceKAJIWARA MASANARI·Filed 2011·Granted May 14, 2013·1 cites·20 claims
- 1958US8243491B2Semiconductor integrated circuit including semiconductor memoryHISADA TOSHIKI·Filed 2010·Granted Aug 14, 2012·3 cites·9 claims
- 2057US9917049B2Semiconductor device having contacts in drawing area and the contacts connected to word lines extending from element formation areaTOSHIBA MEMORY CORP·Filed 2016·Granted Mar 13, 2018·0 cites·10 claims
- 2155USRE46100EMethod of fabricating semiconductor device and semiconductor deviceTOSHIBA KK·Filed 2014·Granted Aug 9, 2016·0 cites·15 claims
- 2253US8984454B2Pattern data generation method, pattern verification method, and optical image calculation methodTOSHIBA KK·Filed 2013·Granted Mar 17, 2015·0 cites·16 claims
- 2353US2016013097A1Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2015·Application pending·0 cites
- 2452US2012241834A1Semiconductor device and method of manufacturing the sameNAKAJIMA FUMIHARU·Filed 2011·Application pending·0 cites
- 2551US2022285350A1Memory device and method of manufacturing memory deviceKIOXIA CORP·Filed 2022·Application pending·0 cites
- 2650US8617999B2Method of manufacturing semiconductor device and computer readable medium for storing pattern size setting programMASHITA HIROMITSU·Filed 2012·Granted Dec 31, 2013·0 cites·3 claims
- 2748US10852648B2Mask pattern correction system, and semiconductor device manufacturing method utilizing said correction systemTOSHIBA MEMORY CORP·Filed 2019·Granted Dec 1, 2020·0 cites·18 claims
- 2848US2010003819A1Design layout data creating method, computer program product, and method of manufacturing semiconductor deviceTAGUCHI TAKAFUMI·Filed 2009·Application pending·0 cites
- 2948US2010035168A1Pattern predicting method, recording media and method of fabricating semiconductor deviceNAKAJIMA FUMIHARU·Filed 2009·Application pending·0 cites
- 3046US7831953B2Lithography simulation method, program and semiconductor device manufacturing methodTOSHIBA KK·Filed 2007·Granted Nov 9, 2010·0 cites·11 claims
- 3146US2010193960A1Semiconductor device, method for making pattern layout, method for making mask pattern, method for making layout, method for manufacturing photo mask, photo mask, and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2010·Application pending·0 cites
- 3244US2015162281A1Integrated circuit device and method for manufacturing the sameTOSHIBA KK·Filed 2014·Application pending·0 cites
- 3343US9268208B2Pattern generating method, pattern forming method, and pattern generating programABURADA RYOTA·Filed 2012·Granted Feb 23, 2016·0 cites·6 claims
- 3443US9159726B2Semiconductor memory device and method for manufacturing sameTOSHIBA KK·Filed 2014·Granted Oct 13, 2015·0 cites·8 claims
- 3543US8196071B2Creating mask data of integrated circuit patterns using calculated etching conversion differenceMASHITA HIROMITSU·Filed 2010·Granted Jun 5, 2012·0 cites·20 claims
- 3643US2010168895A1Mask verification method, method of manufacturing semiconductor device, and computer readable mediumMASHITA HIROMITSU·Filed 2009·Application pending·0 cites
- 3743US2015262932A1Nonvolatile semiconductor memory device and method for manufacturing sameTOSHIBA KK·Filed 2014·Application pending·0 cites
- 3840US2012020158A1Semiconductor memory device and manufacturing method thereofOZAKI TOHRU·Filed 2011·Application pending·0 cites
- 3936US8266552B2Pattern generating method, method of manufacturing semiconductor device, and recording mediumTAGUCHI TAKAFUMI·Filed 2010·Granted Sep 11, 2012·0 cites·18 claims
- 4036US2010266960A1Method of manufacturing semiconductor device and exposure deviceMASHITA HIROMITSU·Filed 2010·Application pending·0 cites
- 4134US2011065030A1Mask pattern determining method, mask manufacturing method, and device manufacturing methodKOTANI TOSHIYA·Filed 2010·Application pending·0 cites
- 4234US2011047518A1Pattern determining methodAIBA ISSUI·Filed 2010·Application pending·0 cites
- 4331US2010216064A1Semiconductor-device manufacturing method, computer program product, and exposure-parameter creating methodTAKIMOTO MICHIYA·Filed 2010·Application pending·0 cites
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