Inventor · disambiguated record
Norikazu Sugiyama
Also filed as: SUGIYAMA NORIKAZU
35 granted patents·3 pending applications·357 citations·filing 1990–2022
96Inventor score
Top patents by PatentIndex Score
38 records- 0197US6733620B1Process apparatusTOKYO ELECTRON LTD·Filed 2000·Granted May 11, 2004·134 cites·16 claims
- 0296US11391934B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2021·Granted Jul 19, 2022·2 cites·14 claims
- 0395US11630064B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2021·Granted Apr 18, 2023·2 cites·8 claims
- 0491US11131839B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2020·Granted Sep 28, 2021·2 cites·17 claims
- 0591US10714885B2Method of making a plurality of printed circuit boards from a single circuit board sheetCANON KK·Filed 2019·Granted Jul 14, 2020·4 cites·28 claims
- 0688US6562186B1Apparatus for plasma processingTOKYO ELECTRON LTD·Filed 1999·Granted May 13, 2003·85 cites·15 claims
- 0785US7634208B2Driving device, image forming apparatus including driving device, and control method thereforCANON KK·Filed 2006·Granted Dec 15, 2009·8 cites·9 claims
- 0884US9435734B2Method for observing stem cells, method for removal of cell region in state tending toward differentiation, and device for observing stem cellsHAMAMATSU PHOTONICS KK·Filed 2015·Granted Sep 6, 2016·4 cites·14 claims
- 0981US10809509B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2017·Granted Oct 20, 2020·2 cites·22 claims
- 1078US8873027B2Cell observation device and cell observation methodSUGIYAMA NORIKAZU·Filed 2011·Granted Oct 28, 2014·6 cites·16 claims
- 1177US11822066B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2022·Granted Nov 21, 2023·0 cites·14 claims
- 1276US9423343B2Membrane potential change detection device and membrane potential change detection methodSUGIYAMA NORIKAZU·Filed 2011·Granted Aug 23, 2016·1 cites·13 claims
- 1374US6821377B2Plasma processing apparatusTOKYO ELECTRON LTD·Filed 2003·Granted Nov 23, 2004·15 cites·20 claims
- 1473US12031911B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2022·Granted Jul 9, 2024·0 cites·8 claims
- 1571US9307634B2Circuit board and image forming apparatusCANON KK·Filed 2013·Granted Apr 5, 2016·3 cites·15 claims
- 1670US10671009B2Printed circuit board mounting piezoelectric transformerCANON KK·Filed 2018·Granted Jun 2, 2020·1 cites·13 claims
- 1770US8264508B2Image forming apparatus and method for controlling the sameSUGIYAMA NORIKAZU·Filed 2011·Granted Sep 11, 2012·1 cites·6 claims
- 1869US5047846AImage processing equipment with light source synchronized to blanking interval of video cameraHAMAMATSU PHOTONICS KK·Filed 1990·Granted Sep 10, 1991·38 cites·3 claims
- 1968US10352843B2Cell assessment method, cell assessment device, and cell assessment programUNIV KYOTO·Filed 2014·Granted Jul 16, 2019·1 cites·9 claims
- 2067US11307525B2Printed circuit board mounting piezoelectric transformerCANON KK·Filed 2020·Granted Apr 19, 2022·0 cites·14 claims
- 2165US9405958B2Cell analysis method, cell analysis device, and cell analysis programSUGIYAMA NORIKAZU·Filed 2012·Granted Aug 2, 2016·2 cites·25 claims
- 2263US11353402B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2018·Granted Jun 7, 2022·0 cites·17 claims
- 2363US11169092B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2018·Granted Nov 9, 2021·0 cites·6 claims
- 2461US5337081ATriple view imaging apparatusHAMAMATSU PHOTONICS KK·Filed 1992·Granted Aug 9, 1994·46 cites·18 claims
- 2559US9435786B2Method for determining differentiation level of pluripotent stem cellsHAMAMATSU PHOTONICS KK·Filed 2013·Granted Sep 6, 2016·0 cites·16 claims
- 2656US2016334384A1Method for determining differentiation level of pluripotent stem cellsHAMAMATSU PHOTONICS KK·Filed 2016·Application pending·0 cites
- 2753US9134296B2Method for observing stem cells, method for removal of cell region in state tending toward differentiation, and device for observing stem cellsHAMAMATSU PHOTONICS KK·Filed 2012·Granted Sep 15, 2015·0 cites·8 claims
- 2852US11585959B2Optical sensorCANON KK·Filed 2020·Granted Feb 21, 2023·0 cites·7 claims
- 2951US9841414B2Aggregated cell evaluation method and aggregated cell evaluation deviceHAMAMATSU PHOTONICS KK·Filed 2014·Granted Dec 12, 2017·0 cites·10 claims
- 3050US11340165B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2018·Granted May 24, 2022·0 cites·14 claims
- 3150US8804121B2Cell observation device and cell observation methodSUGIYAMA NORIKAZU·Filed 2011·Granted Aug 12, 2014·0 cites·15 claims
- 3250US8044986B2Image forming apparatus and method for controlling the sameCANON KK·Filed 2008·Granted Oct 25, 2011·0 cites·8 claims
- 3347US11874224B2Sample observation device and sample observation methodHAMAMATSU PHOTONICS KK·Filed 2018·Granted Jan 16, 2024·0 cites·22 claims
- 3446US7970308B2Image forming apparatus with loop correcting deviceCANON KK·Filed 2009·Granted Jun 28, 2011·0 cites·13 claims
- 3543US9316983B2Image forming apparatus including first detection sensor and second detection sensor for detecting density detection patternCANON KK·Filed 2015·Granted Apr 19, 2016·0 cites·9 claims
- 3640US8633957B2Image forming apparatus with different clock outputs for toner and non-toner forming regionsSUGIYAMA NORIKAZU·Filed 2011·Granted Jan 21, 2014·0 cites·21 claims
- 3736US2004200804A1Method of processing quartz member for plasma processing device, quartz member for plasma processing device, and plasma processing device having quartz member for plasma processing device mounted thereonFiled 2002·Application pending·0 cites
- 3830US2015219543A1Cell evaluation methodHAMAMATSU PHOTONICS KK·Filed 2015·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Norikazu Sugiyama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →