Inventor · disambiguated record
Shinji Omori
Also filed as: OMORI SHINJI
24 granted patents·9 pending applications·259 citations·filing 1984–2022
95Inventor score
Top patents by PatentIndex Score
33 records- 0194US7556895B2Mask, method of producing mask, and method of producing semiconductor deviceSONY CORP·Filed 2006·Granted Jul 7, 2009·16 cites·6 claims
- 0294US4644582AImage registration methodHITACHI LTD·Filed 1984·Granted Feb 17, 1987·161 cites·4 claims
- 0392US9915599B2Microparticle analysis apparatus and microparticle analysis systemSONY CORP·Filed 2013·Granted Mar 13, 2018·12 cites·17 claims
- 0491US8735163B2Blood coagulation system analyzing method and blood coagulation system analyzing deviceHAYASHI YOSHITO·Filed 2012·Granted May 27, 2014·12 cites·13 claims
- 0578US11952177B2Synthetic resin container closureAPTARGROUP INC·Filed 2021·Granted Apr 9, 2024·1 cites·16 claims
- 0676US6787785B2Mask and production method therefor and production method for semiconductor deviceSONY CORP·Filed 2002·Granted Sep 7, 2004·13 cites·7 claims
- 0770US6955993B2Mask and method for making the same, and method for making semiconductor deviceSONY CORP·Filed 2002·Granted Oct 18, 2005·11 cites·16 claims
- 0867US8368410B2Transmission line for dielectric measurement and dielectric measuring device having the transmission lineSONY CORP·Filed 2008·Granted Feb 5, 2013·2 cites·9 claims
- 0965US7060996B2Mask, method of producing mask, and method of producing semiconductor deviceSONY CORP·Filed 2004·Granted Jun 13, 2006·6 cites·13 claims
- 1062US8999243B2Blood coagulation system analyzing method and blood coagulation system analyzing deviceSONY CORP·Filed 2014·Granted Apr 7, 2015·0 cites·14 claims
- 1160US7109500B2Mask pattern correction method, semiconductor device manufacturing method, mask manufacturing method and maskSONY CORP·Filed 2003·Granted Sep 19, 2006·4 cites·26 claims
- 1259US7175952B2Method of generating mask distortion data, exposure method and method of producing semiconductor deviceSONY CORP·Filed 2004·Granted Feb 13, 2007·5 cites·10 claims
- 1358US10794896B2Blood coagulation system examination module, blood coagulation system examination system, blood coagulation system examination method, and determination method of parameter for blood coagulation system examination moduleSONY CORP·Filed 2016·Granted Oct 6, 2020·0 cites·10 claims
- 1456US7057300B2Mask, method of producing mask, and method of producing semiconductor deviceSONY CORP·Filed 2004·Granted Jun 6, 2006·3 cites·9 claims
- 1554US2007111465A1Mask, mask blank, and methods of producing theseYOSHIZAWA MASAKI·Filed 2007·Application pending·0 cites
- 1654US2007105025A1Mask, mask blank, and methods of producing theseYOSHIZAWA MASAKI·Filed 2007·Application pending·0 cites
- 1754US2007105026A1Mask, mask blank, and methods of producing theseYOSHIZAWA MASAKI·Filed 2007·Application pending·0 cites
- 1854US2007105276A1Mask, mask blank, and methods of producing theseYOSHIZAWA MASAKI·Filed 2007·Application pending·0 cites
- 1952US7144178B2Mask, method of producing mask, and method of producing semiconductor deviceSONY CORP·Filed 2003·Granted Dec 5, 2006·2 cites·4 claims
- 2049US10962495B2Blood coagulation system analysis system, blood coagulation system analysis method, and blood coagulation system analysis programSONY CORP·Filed 2017·Granted Mar 30, 2021·0 cites·12 claims
- 2149US9250296B2Transmission line for dielectric measurement and dielectric measuring device having the transmission lineSONY CORP·Filed 2013·Granted Feb 2, 2016·0 cites·13 claims
- 2248US2005142462A1Mask, method of production of same, and method of production of semiconductor deviceSONY CORP·Filed 2005·Application pending·0 cites
- 2347US12202650B2Synthetic resin capYAKULT HONSHA KK·Filed 2022·Granted Jan 21, 2025·0 cites·11 claims
- 2445US7456031B2Exposure device, exposure method, and semiconductor device manufacturing methodSONY CORP·Filed 2003·Granted Nov 25, 2008·2 cites·14 claims
- 2544US2004224243A1Mask, mask blank, and methods of producing theseSONY CORP·Filed 2004·Application pending·0 cites
- 2642US5675363AMethod and equipment for controlling display of image data according to random-scan systemHITACHI ELECTRONICS·Filed 1994·Granted Oct 7, 1997·9 cites·18 claims
- 2742US2019072540A1Electrical characteristics measurement apparatus, electrical characteristics measurement system, electrical characteristics measurement method, and programSONY CORP·Filed 2016·Application pending·0 cites
- 2841US2019041379A1Sample for measurement of electric characteristics, electric characteristic measuring apparatus, and electric characteristic measuring methodSONY CORP·Filed 2016·Application pending·0 cites
- 2940US7247410B2Complementary division mask, method of producing mask, and programSONY CORP·Filed 2004·Granted Jul 24, 2007·0 cites·11 claims
- 3039US10222314B2Flow channel device, complex permittivity measuring apparatus, and dielectric cytometry systemKATSUMOTO YOICHI·Filed 2010·Granted Mar 5, 2019·0 cites·21 claims
- 3139US8828212B2Dielectric cytometric apparatus and dielectric-cytometric cell sorting methodOMORI SHINJI·Filed 2011·Granted Sep 9, 2014·0 cites·6 claims
- 3238US8197655B2System and method for detecting interaction between substances by superimposingly applying sinusoidal voltageOMORI SHINJI·Filed 2006·Granted Jun 12, 2012·0 cites·4 claims
- 3335US2006008707A1Mask and inspection method therefor and production method for semiconductor deviceWATANABE YOKO·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →