Inventor · disambiguated record
Neil Richardson
Also filed as: RICHARDSON NEIL · RICHARDSON NEIL W · RICHARDSON NEIL WILLIAM
37 granted patents·2 pending applications·2,042 citations·filing 1985–2021
98Inventor score
Files withPURESTREAM SERVICES LLC7KLA TENCOR CORP5SCHLUMBERGER TECHNOLOGY CORP5KLA TENCOR4BATTY J CLAIR3
Top patents by PatentIndex Score
39 records- 0198US5467832AMethod for directionally drilling a boreholeSCHLUMBERGER TECHNOLOGY CORP·Filed 1993·Granted Nov 21, 1995·286 cites·2 claims
- 0298US5448227AMethod of and apparatus for making near-bit measurements while drillingSCHLUMBERGER TECHNOLOGY CORP·Filed 1993·Granted Sep 5, 1995·251 cites·24 claims
- 0396US6636064B1Dual probe test structures for semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Oct 21, 2003·127 cites·22 claims
- 0496US6633174B1Stepper type test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Oct 14, 2003·195 cites·14 claims
- 0595US6524873B1Continuous movement scans of test structures on semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Feb 25, 2003·102 cites·23 claims
- 0695US6509197B1Inspectable buried test structures and methods for inspecting the sameKLA TENCOR CORP·Filed 2000·Granted Jan 21, 2003·146 cites·24 claims
- 0795US6445199B1Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structuresKLA TENCOR CORP·Filed 2000·Granted Sep 3, 2002·106 cites·20 claims
- 0894US6576923B2Inspectable buried test structures and methods for inspecting the sameKLA TENCOR CORP·Filed 2002·Granted Jun 10, 2003·117 cites·13 claims
- 0993US8425668B2Wastewater pre-treatment and evaporation systemLAKATOS JANOS I·Filed 2010·Granted Apr 23, 2013·30 cites·16 claims
- 1092US6921672B2Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR TECH CORP·Filed 2003·Granted Jul 26, 2005·59 cites·12 claims
- 1192US6528818B1Test structures and methods for inspection of semiconductor integrated circuitsKLA TENCOR·Filed 2000·Granted Mar 4, 2003·60 cites·19 claims
- 1292US5869833AElectron beam dose control for scanning electron microscopy and critical dimension measurement instrumentsKLA TENCOR CORP·Filed 1997·Granted Feb 9, 1999·78 cites·18 claims
- 1390US9005404B2Controlled-gradient, accelerated-vapor-recompression apparatus and methodBATTY J CLAIR·Filed 2012·Granted Apr 14, 2015·10 cites·25 claims
- 1490US4706019AElectron beam test probe system for analyzing integrated circuitsFAIRCHILD CAMERA INSTR CO·Filed 1985·Granted Nov 10, 1987·74 cites·19 claims
- 1589US8986509B2Controlled-gradient, accelerated-vapor-recompression apparatus and methodBATTY J CLAIR·Filed 2012·Granted Mar 24, 2015·8 cites·33 claims
- 1685US6627884B2Simultaneous flooding and inspection for charge control in an electron beam inspection machineKLA TENCOR TECH CORP·Filed 2001·Granted Sep 30, 2003·29 cites·30 claims
- 1785US5270643APulsed laser photoemission electron-beam probeSCHLUMBERGER TECHNOLOGIES·Filed 1992·Granted Dec 14, 1993·68 cites·36 claims
- 1884US8333323B2Mobile device using short cycle power sourceRICHARDSON NEIL·Filed 2010·Granted Dec 18, 2012·10 cites·21 claims
- 1983US8845865B2Controlled-gradient, accelerated-vapor-recompression apparatus and methodPURESTREAM SERVICES LLC·Filed 2013·Granted Sep 30, 2014·4 cites·10 claims
- 2082US7569834B1High resolution charged particle projection lens array using magnetic elementsKLA TENCOR TECH CORP·Filed 2006·Granted Aug 4, 2009·7 cites·28 claims
- 2181US5140164AIc modification with focused ion beam systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Aug 18, 1992·78 cites·5 claims
- 2280US5144225AMethods and apparatus for acquiring data from intermittently failing circuitsSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted Sep 1, 1992·46 cites·11 claims
- 2379US9044693B2Controlled-gradient, accelerated-vapor-recompression apparatus and methodBATTY J CLAIR·Filed 2012·Granted Jun 2, 2015·3 cites·31 claims
- 2479US4864228AElectron beam test probe for integrated circuit testingFAIRCHILD CAMERA INSTR CO·Filed 1985·Granted Sep 5, 1989·39 cites·2 claims
- 2578US10974161B2Fluid treatment systemsPURESTREAM SERVICES LLC·Filed 2018·Granted Apr 13, 2021·2 cites·17 claims
- 2677US9205347B2Controlled-gradient, accelerated vapor-recompression apparatus and methodPURESTREAM SERVICES LLC·Filed 2014·Granted Dec 8, 2015·2 cites·8 claims
- 2776US9533238B2Controlled-gradient, accelerated vapor-recompression apparatus and methodPURESTREAM SERVICES LLC·Filed 2015·Granted Jan 3, 2017·1 cites·20 claims
- 2876US6211518B1Electron beam dose control for scanning electron microscopy and critical dimension measurement instrumentsKLA TENCOR CORP·Filed 1998·Granted Apr 3, 2001·25 cites·21 claims
- 2975US4912405AMagnetic lens and electron beam deflection systemSCHLUMBERGER TECHNOLOGY CORP·Filed 1988·Granted Mar 27, 1990·21 cites·10 claims
- 3074US9741071B2Computer-assisted shopping and product locationHAND HELD PROD INC·Filed 2013·Granted Aug 22, 2017·1 cites·21 claims
- 3166US11344820B2Fluid treatment systems and methodsPURESTREAM SERVICES LLC·Filed 2021·Granted May 31, 2022·0 cites·20 claims
- 3266US11338218B2Fluid treatment apparatus and methodsPURESTREAM SERVICES LLC·Filed 2021·Granted May 24, 2022·0 cites·20 claims
- 3366US4721909AApparatus for pulsing electron beamsSCHLUMBERGER TECHNOLOGY CORP·Filed 1986·Granted Jan 26, 1988·23 cites·6 claims
- 3462US2017136384A1Controlled-gradient, accelerated vapor-recompression apparatus and methodPURESTREAM SERVICES LLC·Filed 2016·Application pending·0 cites
- 3561US10402895B2Computer-assisted shopping and product locationHAND HELD PROD INC·Filed 2017·Granted Sep 3, 2019·0 cites·18 claims
- 3659US8392260B2Short-charge cordless scanner for retail terminalsRICHARDSON NEIL·Filed 2010·Granted Mar 5, 2013·1 cites·20 claims
- 3750US5210487ADouble-gated integrating scheme for electron beam testerSCHLUMBERGER TECHNOLOGIES INC·Filed 1991·Granted May 11, 1993·14 cites·16 claims
- 3849US4607693ASide-entry subSCHLUMBERGER TECHNOLOGY CORP·Filed 1985·Granted Aug 26, 1986·19 cites·14 claims
- 3945US2007145266A1Electron microscope apparatus using CRT-type opticsCOHEN AVI·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →